{"id":"https://openalex.org/W1977382914","doi":"https://doi.org/10.1109/socc.2010.5784732","title":"Variation-tolerant design of D-flipflops","display_name":"Variation-tolerant design of D-flipflops","publication_year":2010,"publication_date":"2010-09-01","ids":{"openalex":"https://openalex.org/W1977382914","doi":"https://doi.org/10.1109/socc.2010.5784732","mag":"1977382914"},"language":"en","primary_location":{"id":"doi:10.1109/socc.2010.5784732","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2010.5784732","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"23rd IEEE International SOC Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034526529","display_name":"Hiroki Sunagawa","orcid":null},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroki Sunagawa","raw_affiliation_strings":["Dept. Communications and Computer Engineering, Kyoto University, 606-8501, JAPAN","Department Communications and Computer Engineering, Kyoto University, Kyoto, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. Communications and Computer Engineering, Kyoto University, 606-8501, JAPAN","institution_ids":["https://openalex.org/I22299242"]},{"raw_affiliation_string":"Department Communications and Computer Engineering, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026865951","display_name":"Hidetoshi Onodera","orcid":"https://orcid.org/0000-0001-5198-0668"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]},{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I1319490839","https://openalex.org/I4210086780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hidetoshi Onodera","raw_affiliation_strings":["Dept. Communications and Computer Engineering, Kyoto University, 606-8501, JAPAN","CREST, Japan Science and Technology Agency, Japan","Department Communications and Computer Engineering, Kyoto University, Kyoto, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. Communications and Computer Engineering, Kyoto University, 606-8501, JAPAN","institution_ids":["https://openalex.org/I22299242"]},{"raw_affiliation_string":"CREST, Japan Science and Technology Agency, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Department Communications and Computer Engineering, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.6703,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.89442198,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"147","last_page":"151"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.7983196377754211},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.7064274549484253},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6103125810623169},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5267557501792908},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.4832897484302521},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4483095109462738},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.39024481177330017},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.12856155633926392},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09112250804901123},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08480343222618103}],"concepts":[{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.7983196377754211},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.7064274549484253},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6103125810623169},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5267557501792908},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.4832897484302521},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4483095109462738},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.39024481177330017},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.12856155633926392},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09112250804901123},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08480343222618103},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/socc.2010.5784732","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2010.5784732","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"23rd IEEE International SOC Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1525409241","https://openalex.org/W2000144649","https://openalex.org/W2041626447","https://openalex.org/W2066897999","https://openalex.org/W2096755585","https://openalex.org/W2140823559","https://openalex.org/W2161648718","https://openalex.org/W6631407737"],"related_works":["https://openalex.org/W2386430105","https://openalex.org/W2356521405","https://openalex.org/W2038534795","https://openalex.org/W2384358604","https://openalex.org/W1567829292","https://openalex.org/W3001063351","https://openalex.org/W3196905815","https://openalex.org/W2137012493","https://openalex.org/W2959030164","https://openalex.org/W1564147575"],"abstract_inverted_index":{"This":[0],"paper":[1],"discusses":[2],"vulnerability":[3],"of":[4,14,31,38,82],"a":[5,32,57,61],"D-flipflop":[6],"(D-FF)":[7],"under":[8],"within-die":[9],"(WID)":[10],"variation.":[11],"The":[12],"effect":[13],"WID":[15],"variability":[16,70],"on":[17],"D-FF":[18,33,62],"timing":[19],"characteristics":[20],"is":[21,25],"examined":[22],"and":[23,54,75],"it":[24],"revealed":[26],"that":[27,37],"the":[28,39],"setup":[29],"time":[30],"becomes":[34],"larger":[35],"than":[36],"worst":[40],"corner":[41],"condition.":[42],"In":[43],"order":[44],"to":[45],"suppress":[46],"this":[47],"\u201cworse-than-the-worst-corner\u201d":[48],"behavior,":[49],"variation-tolerant":[50],"D-FFs":[51],"are":[52],"proposed":[53],"verified":[55],"in":[56],"65nm":[58],"process,":[59],"including":[60],"with":[63,79],"over-sized":[64],"clock":[65],"drivers":[66],"which":[67],"reduces":[68],"performance":[69],"by":[71],"29%":[72],"at":[73,77],"1.2V":[74],"55%":[76],"0.7V":[78],"power":[80],"overhead":[81],"14%.":[83]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}