{"id":"https://openalex.org/W1543263929","doi":"https://doi.org/10.1109/socc.2005.1554471","title":"Accurate Simulation Environment for Signal Isolation in Mixed-Signal Design","display_name":"Accurate Simulation Environment for Signal Isolation in Mixed-Signal Design","publication_year":2005,"publication_date":"2005-12-13","ids":{"openalex":"https://openalex.org/W1543263929","doi":"https://doi.org/10.1109/socc.2005.1554471","mag":"1543263929"},"language":"en","primary_location":{"id":"doi:10.1109/socc.2005.1554471","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2005.1554471","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052051759","display_name":"Sanmitra Banerjee","orcid":"https://orcid.org/0000-0002-1136-9220"},"institutions":[{"id":"https://openalex.org/I100625452","display_name":"ON Semiconductor (United States)","ror":"https://ror.org/03nw6pt28","country_code":"US","type":"company","lineage":["https://openalex.org/I100625452"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.K. Banerjee","raw_affiliation_strings":["MMSTL, Freescale Semiconductor, Inc., USA","Freescale Semicond. Inc, Tempe, AZ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MMSTL, Freescale Semiconductor, Inc., USA","institution_ids":[]},{"raw_affiliation_string":"Freescale Semicond. Inc, Tempe, AZ","institution_ids":["https://openalex.org/I100625452"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108634711","display_name":"R.M. Secareanu","orcid":null},"institutions":[{"id":"https://openalex.org/I100625452","display_name":"ON Semiconductor (United States)","ror":"https://ror.org/03nw6pt28","country_code":"US","type":"company","lineage":["https://openalex.org/I100625452"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R.M. Secareanu","raw_affiliation_strings":["MMSTL, Freescale Semiconductor, Inc., USA","Freescale Semicond. Inc, Tempe, AZ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MMSTL, Freescale Semiconductor, Inc., USA","institution_ids":[]},{"raw_affiliation_string":"Freescale Semicond. Inc, Tempe, AZ","institution_ids":["https://openalex.org/I100625452"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036480177","display_name":"E. Nabity","orcid":null},"institutions":[{"id":"https://openalex.org/I100625452","display_name":"ON Semiconductor (United States)","ror":"https://ror.org/03nw6pt28","country_code":"US","type":"company","lineage":["https://openalex.org/I100625452"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E. Nabity","raw_affiliation_strings":["MMSTL, Freescale Semiconductor, Inc., USA","Freescale Semicond. Inc, Tempe, AZ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MMSTL, Freescale Semiconductor, Inc., USA","institution_ids":[]},{"raw_affiliation_string":"Freescale Semicond. Inc, Tempe, AZ","institution_ids":["https://openalex.org/I100625452"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007772757","display_name":"A. Duvallet","orcid":null},"institutions":[{"id":"https://openalex.org/I100625452","display_name":"ON Semiconductor (United States)","ror":"https://ror.org/03nw6pt28","country_code":"US","type":"company","lineage":["https://openalex.org/I100625452"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Duvallet","raw_affiliation_strings":["MMSTL, Freescale Semiconductor, Inc., USA","Freescale Semicond. Inc, Tempe, AZ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MMSTL, Freescale Semiconductor, Inc., USA","institution_ids":[]},{"raw_affiliation_string":"Freescale Semicond. Inc, Tempe, AZ","institution_ids":["https://openalex.org/I100625452"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089852164","display_name":"O. Hartin","orcid":"https://orcid.org/0000-0002-4339-2513"},"institutions":[{"id":"https://openalex.org/I100625452","display_name":"ON Semiconductor (United States)","ror":"https://ror.org/03nw6pt28","country_code":"US","type":"company","lineage":["https://openalex.org/I100625452"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"O. Hartin","raw_affiliation_strings":["MMSTL, Freescale Semiconductor, Inc., USA","Freescale Semicond. Inc, Tempe, AZ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MMSTL, Freescale Semiconductor, Inc., USA","institution_ids":[]},{"raw_affiliation_string":"Freescale Semicond. Inc, Tempe, AZ","institution_ids":["https://openalex.org/I100625452"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I100625452"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.04746093,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"105","last_page":"108"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/isolation","display_name":"Isolation (microbiology)","score":0.7206979990005493},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.7112546563148499},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.641147255897522},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.5524114370346069},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.43632015585899353},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.4359632134437561},{"id":"https://openalex.org/keywords/development-environment","display_name":"Development environment","score":0.42416322231292725},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3485015630722046},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21823349595069885},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.16286522150039673},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.12610143423080444},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.09686967730522156},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07547631859779358},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.06622019410133362}],"concepts":[{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.7206979990005493},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.7112546563148499},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.641147255897522},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.5524114370346069},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.43632015585899353},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.4359632134437561},{"id":"https://openalex.org/C139968098","wikidata":"https://www.wikidata.org/wiki/Q3055454","display_name":"Development environment","level":2,"score":0.42416322231292725},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3485015630722046},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21823349595069885},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.16286522150039673},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.12610143423080444},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.09686967730522156},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07547631859779358},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.06622019410133362},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C89423630","wikidata":"https://www.wikidata.org/wiki/Q7193","display_name":"Microbiology","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/socc.2005.1554471","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2005.1554471","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1480902266","https://openalex.org/W1964218736","https://openalex.org/W1994727380","https://openalex.org/W2117127294","https://openalex.org/W2136547340","https://openalex.org/W2565113977","https://openalex.org/W4230484616","https://openalex.org/W6641382298"],"related_works":["https://openalex.org/W2394779770","https://openalex.org/W2415102733","https://openalex.org/W4386784740","https://openalex.org/W2056273954","https://openalex.org/W2072346427","https://openalex.org/W2487222174","https://openalex.org/W2068583297","https://openalex.org/W2123050621","https://openalex.org/W4293288044","https://openalex.org/W2063220110"],"abstract_inverted_index":{"The":[0,26],"steps":[1],"in":[2,12],"developing":[3],"an":[4],"accurate":[5],"simulation":[6],"environment":[7,18],"for":[8,23],"signal":[9],"isolation,":[10],"applicable":[11],"mixed-signal":[13],"design,":[14],"is":[15,19],"described.":[16],"Substrate":[17],"the":[20],"primary":[21],"focus":[22],"this":[24],"environment.":[25],"development":[27],"and":[28,37],"validation":[29],"of":[30],"associated":[31],"technology":[32],"files,":[33],"fundamental":[34],"analyses":[35],"examples,":[36],"challenges,":[38],"are":[39],"outlined.":[40]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}