{"id":"https://openalex.org/W1549949180","doi":"https://doi.org/10.1109/socc.2004.1362457","title":"Mutual inductance modeling for multiple RLC interconnects with application to shield insertion","display_name":"Mutual inductance modeling for multiple RLC interconnects with application to shield insertion","publication_year":2004,"publication_date":"2004-12-23","ids":{"openalex":"https://openalex.org/W1549949180","doi":"https://doi.org/10.1109/socc.2004.1362457","mag":"1549949180"},"language":"en","primary_location":{"id":"doi:10.1109/socc.2004.1362457","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2004.1362457","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International SOC Conference, 2004. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059441826","display_name":"Junmou Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Junmou Zhang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, USA","[Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, USA","institution_ids":["https://openalex.org/I5388228"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA]","institution_ids":["https://openalex.org/I5388228"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053517349","display_name":"Eby G. Friedman","orcid":"https://orcid.org/0000-0002-5549-7160"},"institutions":[{"id":"https://openalex.org/I5388228","display_name":"University of Rochester","ror":"https://ror.org/022kthw22","country_code":"US","type":"education","lineage":["https://openalex.org/I5388228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E.G. Friedman","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, USA","[Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, USA","institution_ids":["https://openalex.org/I5388228"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA]","institution_ids":["https://openalex.org/I5388228"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5059441826"],"corresponding_institution_ids":["https://openalex.org/I5388228"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.0501114,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10787","display_name":"Lightning and Electromagnetic Phenomena","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/rlc-circuit","display_name":"RLC circuit","score":0.9062118530273438},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.8910449743270874},{"id":"https://openalex.org/keywords/crosstalk","display_name":"Crosstalk","score":0.5802958011627197},{"id":"https://openalex.org/keywords/inductive-coupling","display_name":"Inductive coupling","score":0.5559572577476501},{"id":"https://openalex.org/keywords/electromagnetic-shielding","display_name":"Electromagnetic shielding","score":0.5509634017944336},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5474470853805542},{"id":"https://openalex.org/keywords/equivalent-series-inductance","display_name":"Equivalent series inductance","score":0.4884413778781891},{"id":"https://openalex.org/keywords/shields","display_name":"Shields","score":0.4663381278514862},{"id":"https://openalex.org/keywords/capacitive-coupling","display_name":"Capacitive coupling","score":0.44356653094291687},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.4331921935081482},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41372209787368774},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36729976534843445},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3213607668876648},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.21716105937957764},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.1755906641483307}],"concepts":[{"id":"https://openalex.org/C89880566","wikidata":"https://www.wikidata.org/wiki/Q323477","display_name":"RLC circuit","level":4,"score":0.9062118530273438},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.8910449743270874},{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.5802958011627197},{"id":"https://openalex.org/C177872590","wikidata":"https://www.wikidata.org/wiki/Q1498289","display_name":"Inductive coupling","level":2,"score":0.5559572577476501},{"id":"https://openalex.org/C2265751","wikidata":"https://www.wikidata.org/wiki/Q332007","display_name":"Electromagnetic shielding","level":2,"score":0.5509634017944336},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5474470853805542},{"id":"https://openalex.org/C141490761","wikidata":"https://www.wikidata.org/wiki/Q5384728","display_name":"Equivalent series inductance","level":4,"score":0.4884413778781891},{"id":"https://openalex.org/C109589588","wikidata":"https://www.wikidata.org/wiki/Q2253638","display_name":"Shields","level":3,"score":0.4663381278514862},{"id":"https://openalex.org/C68278764","wikidata":"https://www.wikidata.org/wiki/Q444167","display_name":"Capacitive coupling","level":3,"score":0.44356653094291687},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.4331921935081482},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41372209787368774},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36729976534843445},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3213607668876648},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.21716105937957764},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.1755906641483307}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/socc.2004.1362457","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2004.1362457","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International SOC Conference, 2004. Proceedings.","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.77.2417","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.77.2417","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ece.rochester.edu/users/friedman/papers/SoC_04_Mutual_Inductance.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1490883245","https://openalex.org/W2026188268","https://openalex.org/W2075891646","https://openalex.org/W2114207543","https://openalex.org/W2128732569","https://openalex.org/W2154326380","https://openalex.org/W2157763958","https://openalex.org/W2162744857"],"related_works":["https://openalex.org/W2070830009","https://openalex.org/W2768092448","https://openalex.org/W1907380980","https://openalex.org/W2506114406","https://openalex.org/W2005873887","https://openalex.org/W2105669620","https://openalex.org/W2105517597","https://openalex.org/W4387197052","https://openalex.org/W2124074878","https://openalex.org/W4205349537"],"abstract_inverted_index":{"An":[0,19],"effective":[1,50],"mutual":[2,51],"inductance":[3,52],"is":[4,31,53],"proposed":[5],"in":[6,69],"this":[7],"paper":[8],"to":[9,56,65],"efficiently":[10],"describe":[11],"the":[12,23,35,70],"inductive":[13,76],"interactions":[14],"among":[15,26],"coupled":[16,28,38,43],"signal":[17],"lines.":[18],"efficient":[20],"estimate":[21],"of":[22,37,48,72],"crosstalk":[24,67],"noise":[25,68],"multiple":[27],"RLC":[29,44],"interconnects":[30],"achieved":[32],"by":[33],"simplifying":[34],"system":[36],"lines":[39],"into":[40],"only":[41],"two":[42],"interconnects.":[45],"The":[46],"concept":[47],"an":[49],"further":[54],"applied":[55],"a":[57],"shielding":[58],"technique,":[59],"providing":[60],"guidelines":[61],"for":[62],"inserting":[63],"shields":[64],"reduce":[66],"presence":[71],"both":[73],"capacitive":[74],"and":[75],"coupling.":[77]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}