{"id":"https://openalex.org/W1549405663","doi":"https://doi.org/10.1109/socc.2004.1362426","title":"Simultaneous bidmectional PAM4 link with built-in self-test","display_name":"Simultaneous bidmectional PAM4 link with built-in self-test","publication_year":2004,"publication_date":"2004-12-23","ids":{"openalex":"https://openalex.org/W1549405663","doi":"https://doi.org/10.1109/socc.2004.1362426","mag":"1549405663"},"language":"en","primary_location":{"id":"doi:10.1109/socc.2004.1362426","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2004.1362426","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International SOC Conference, 2004. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008545963","display_name":"Ming-ta Hsieh","orcid":null},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ming-ta Hsieh","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA","[Dept. of Electr. & Comput. Eng., Minnesota Univ., minneapolis, MN, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA","institution_ids":["https://openalex.org/I130238516"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Minnesota Univ., minneapolis, MN, USA]","institution_ids":["https://openalex.org/I130238516"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041064476","display_name":"Gerald E. Sobelman","orcid":"https://orcid.org/0000-0002-4415-7320"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G.E. Sobelman","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA","[Dept. of Electr. & Comput. Eng., Minnesota Univ., minneapolis, MN, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA","institution_ids":["https://openalex.org/I130238516"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Minnesota Univ., minneapolis, MN, USA]","institution_ids":["https://openalex.org/I130238516"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.07535418,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"255","last_page":"258"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cadence","display_name":"Cadence","score":0.7197621464729309},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6662940979003906},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.6351428627967834},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5640332698822021},{"id":"https://openalex.org/keywords/emphasis","display_name":"Emphasis (telecommunications)","score":0.5338128209114075},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5223094820976257},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.4966810345649719},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4877181947231293},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.48692572116851807},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.4612921476364136},{"id":"https://openalex.org/keywords/signal-generator","display_name":"Signal generator","score":0.4400932490825653},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.4286138415336609},{"id":"https://openalex.org/keywords/verilog","display_name":"Verilog","score":0.4163103699684143},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.25623029470443726},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22717836499214172},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.18253648281097412},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17984318733215332},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14045777916908264},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.13147732615470886},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11009782552719116},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.08490455150604248}],"concepts":[{"id":"https://openalex.org/C2777125575","wikidata":"https://www.wikidata.org/wiki/Q14088448","display_name":"Cadence","level":2,"score":0.7197621464729309},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6662940979003906},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.6351428627967834},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5640332698822021},{"id":"https://openalex.org/C177454536","wikidata":"https://www.wikidata.org/wiki/Q578290","display_name":"Emphasis (telecommunications)","level":2,"score":0.5338128209114075},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5223094820976257},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.4966810345649719},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4877181947231293},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.48692572116851807},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.4612921476364136},{"id":"https://openalex.org/C207912722","wikidata":"https://www.wikidata.org/wiki/Q1259123","display_name":"Signal generator","level":3,"score":0.4400932490825653},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.4286138415336609},{"id":"https://openalex.org/C2779030575","wikidata":"https://www.wikidata.org/wiki/Q827773","display_name":"Verilog","level":3,"score":0.4163103699684143},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.25623029470443726},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22717836499214172},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.18253648281097412},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17984318733215332},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14045777916908264},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.13147732615470886},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11009782552719116},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.08490455150604248},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/socc.2004.1362426","is_oa":false,"landing_page_url":"https://doi.org/10.1109/socc.2004.1362426","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International SOC Conference, 2004. Proceedings.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1498773281","https://openalex.org/W1508392662","https://openalex.org/W1689658876","https://openalex.org/W1896389504","https://openalex.org/W2112360852","https://openalex.org/W2114821963","https://openalex.org/W2164893802","https://openalex.org/W2178227197","https://openalex.org/W2739932069","https://openalex.org/W6677359222"],"related_works":["https://openalex.org/W4289538008","https://openalex.org/W3186427148","https://openalex.org/W2138282914","https://openalex.org/W2065850627","https://openalex.org/W2017012638","https://openalex.org/W2071885361","https://openalex.org/W1966793535","https://openalex.org/W1964447062","https://openalex.org/W2366828188","https://openalex.org/W2563824095"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,7,33,38,42,54,67,72],"new":[4],"design":[5,91],"of":[6,23,32],"simultaneous":[8,68],"bidirectional":[9,69],"PAM-4":[10],"wired":[11],"transmission":[12],"system":[13],"that":[14,25,50],"uses":[15],"built-in":[16],"self-test":[17],"(BIST)":[18],"to":[19,75],"adjust":[20],"the":[21,58,79,83,96,103,116],"level":[22],"pre-emphasis":[24,60],"is":[26,51],"applied.":[27],"The":[28,62,90],"BIST":[29],"circuitry":[30],"consists":[31],"pattern":[34],"generator":[35],"and":[36,41,99,102],"detector,":[37],"signal":[39,56],"comparator":[40],"high-pass":[43],"filter.":[44],"It":[45],"outputs":[46],"an":[47,86,110],"error":[48],"indicator":[49],"used":[52],"as":[53],"control":[55],"in":[57,66],"adaptive":[59],"block.":[61],"feedback":[63],"loop":[64],"inherent":[65],"link":[70],"provides":[71],"natural":[73],"opportunity":[74],"carry":[76],"information":[77],"about":[78],"channel":[80,104],"characteristics":[81,106],"without":[82],"need":[84],"for":[85],"extra":[87],"dedicated":[88],"wire.":[89],"has":[92],"been":[93],"verified":[94],"using":[95],"Cadence":[97,117],"SpectreRF":[98],"Verilog-A":[100],"simulators":[101],"loss":[105],"are":[107],"based":[108],"on":[109],"FR-4":[111],"material":[112],"model":[113],"extracted":[114],"from":[115],"Transmission":[118],"Line":[119],"Model":[120],"Generator.":[121]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}