{"id":"https://openalex.org/W2888308826","doi":"https://doi.org/10.1109/snpd.2018.8441132","title":"Defective Fiducial Mark Detection Using Machine Learning","display_name":"Defective Fiducial Mark Detection Using Machine Learning","publication_year":2018,"publication_date":"2018-06-01","ids":{"openalex":"https://openalex.org/W2888308826","doi":"https://doi.org/10.1109/snpd.2018.8441132","mag":"2888308826"},"language":"en","primary_location":{"id":"doi:10.1109/snpd.2018.8441132","is_oa":false,"landing_page_url":"https://doi.org/10.1109/snpd.2018.8441132","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 19th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091623141","display_name":"Do Gyu An","orcid":null},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Do Gyu An","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110597963","display_name":"Jung Won Jung","orcid":null},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jung Won Jung","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024137527","display_name":"Jae Wook Jeon","orcid":"https://orcid.org/0000-0003-0037-112X"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jae Wook Jeon","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, Korea","institution_ids":["https://openalex.org/I848706"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I848706"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.08224693,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"24n","issue":null,"first_page":"200","last_page":"205"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10601","display_name":"Handwritten Text Recognition Techniques","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fiducial-marker","display_name":"Fiducial marker","score":0.9342907667160034},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7597730755805969},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.706379771232605},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6983997821807861},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.6077511310577393},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6070172786712646},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5726382732391357},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.5630408525466919},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.5609327554702759},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.5401943922042847},{"id":"https://openalex.org/keywords/template-matching","display_name":"Template matching","score":0.5266692042350769},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.23325490951538086},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21032217144966125},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13330575823783875},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10337567329406738}],"concepts":[{"id":"https://openalex.org/C173974348","wikidata":"https://www.wikidata.org/wiki/Q1469893","display_name":"Fiducial marker","level":2,"score":0.9342907667160034},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7597730755805969},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.706379771232605},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6983997821807861},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.6077511310577393},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6070172786712646},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5726382732391357},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.5630408525466919},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.5609327554702759},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.5401943922042847},{"id":"https://openalex.org/C158096908","wikidata":"https://www.wikidata.org/wiki/Q3983303","display_name":"Template matching","level":3,"score":0.5266692042350769},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.23325490951538086},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21032217144966125},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13330575823783875},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10337567329406738},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/snpd.2018.8441132","is_oa":false,"landing_page_url":"https://doi.org/10.1109/snpd.2018.8441132","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 19th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1596717185","https://openalex.org/W2005617509","https://openalex.org/W2011430131","https://openalex.org/W2023948527","https://openalex.org/W2086393750","https://openalex.org/W2130103520","https://openalex.org/W2161160262","https://openalex.org/W2295106276","https://openalex.org/W2406810007","https://openalex.org/W4239510810","https://openalex.org/W6679388247"],"related_works":["https://openalex.org/W2525537761","https://openalex.org/W2072325087","https://openalex.org/W2905789513","https://openalex.org/W402593573","https://openalex.org/W2972424784","https://openalex.org/W1486589819","https://openalex.org/W1429720065","https://openalex.org/W2948909270","https://openalex.org/W1514490562","https://openalex.org/W3030478768"],"abstract_inverted_index":{"In":[0,24],"this":[1],"paper,":[2],"we":[3,81],"propose":[4,82],"a":[5,18,56,68,74,83],"method":[6,30,84],"to":[7,33,65],"improve":[8],"the":[9,12,25,35,44,48,51,60,77,95,98,102],"performance":[10],"of":[11,50,86,101],"fiducial":[13,36,103],"mark":[14,49,61,104],"detection":[15],"function":[16],"using":[17],"vision":[19],"sensor":[20],"in":[21,76],"automation":[22,26],"equipment.":[23],"industry,":[27],"Template":[28,38],"matching":[29,39],"is":[31,62,73,105],"used":[32],"recognize":[34],"mark.":[37],"can":[40],"be":[41],"detected":[42],"because":[43],"error":[45],"increases":[46],"when":[47],"target":[52],"rotates":[53],"more":[54],"than":[55],"certain":[57],"angle.":[58],"If":[59],"damaged":[63],"due":[64],"illumination":[66],"and":[67,91,107],"physical":[69],"external":[70],"force,":[71],"there":[72],"reduction":[75],"recognition":[78,99],"rate.":[79],"Therefore,":[80],"consisting":[85],"K-means":[87],"Clustering,":[88],"SVM":[89],"Classification,":[90],"Linear":[92],"Regression.":[93],"Using":[94],"proposed":[96],"method,":[97],"rate":[100],"improved":[106],"accurate":[108],"center":[109],"coordinates":[110],"are":[111],"obtained.":[112]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}