{"id":"https://openalex.org/W7125926515","doi":"https://doi.org/10.1109/smc58881.2025.11343177","title":"VDGPG: A Virtual Data-Guided Prompt Generation Framework for Incremental Learning with Application to Wafer Defect Detection","display_name":"VDGPG: A Virtual Data-Guided Prompt Generation Framework for Incremental Learning with Application to Wafer Defect Detection","publication_year":2025,"publication_date":"2025-10-05","ids":{"openalex":"https://openalex.org/W7125926515","doi":"https://doi.org/10.1109/smc58881.2025.11343177"},"language":null,"primary_location":{"id":"doi:10.1109/smc58881.2025.11343177","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smc58881.2025.11343177","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Conference on Systems, Man, and Cybernetics (SMC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5124071076","display_name":"Bingwen Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I126924076","display_name":"Chongqing Normal University","ror":"https://ror.org/01dcw5w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I126924076"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Bingwen Liu","raw_affiliation_strings":["Chongqing Normal University,College of Computer and Information Science,Chongqing,China,401331"],"affiliations":[{"raw_affiliation_string":"Chongqing Normal University,College of Computer and Information Science,Chongqing,China,401331","institution_ids":["https://openalex.org/I126924076"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025201374","display_name":"Yang Tian","orcid":"https://orcid.org/0000-0003-2642-4760"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yibin Tian","raw_affiliation_strings":["Shenzhen University,State Key Laboratory of Radio Frequency Heterogenous Integration & College of Mechatronics and Control Engineering,Shenzhen,China,518060"],"affiliations":[{"raw_affiliation_string":"Shenzhen University,State Key Laboratory of Radio Frequency Heterogenous Integration & College of Mechatronics and Control Engineering,Shenzhen,China,518060","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102744202","display_name":"Shanglei Chai","orcid":"https://orcid.org/0000-0002-0631-1438"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shanglei Chai","raw_affiliation_strings":["Shenzhen University,State Key Laboratory of Radio Frequency Heterogenous Integration & College of Mechatronics and Control Engineering,Shenzhen,China,518060"],"affiliations":[{"raw_affiliation_string":"Shenzhen University,State Key Laboratory of Radio Frequency Heterogenous Integration & College of Mechatronics and Control Engineering,Shenzhen,China,518060","institution_ids":["https://openalex.org/I180726961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5124090904","display_name":"Zhiyuan Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I79891267","display_name":"Singapore Management University","ror":"https://ror.org/050qmg959","country_code":"SG","type":"education","lineage":["https://openalex.org/I79891267"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Zhiyuan Zhang","raw_affiliation_strings":["Singapore Management University,School of Computing and Information Systems,Singapore,Singapore,188065"],"affiliations":[{"raw_affiliation_string":"Singapore Management University,School of Computing and Information Systems,Singapore,Singapore,188065","institution_ids":["https://openalex.org/I79891267"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5124146880","display_name":"Zhi Zeng","orcid":null},"institutions":[{"id":"https://openalex.org/I126924076","display_name":"Chongqing Normal University","ror":"https://ror.org/01dcw5w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I126924076"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhi Zeng","raw_affiliation_strings":["Chongqing Normal University,College of Computer and Information Science,Chongqing,China,401331"],"affiliations":[{"raw_affiliation_string":"Chongqing Normal University,College of Computer and Information Science,Chongqing,China,401331","institution_ids":["https://openalex.org/I126924076"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5124071076"],"corresponding_institution_ids":["https://openalex.org/I126924076"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.73573077,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"7074","last_page":"7079"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9146999716758728,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9146999716758728,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.02539999969303608,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.007699999958276749,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5767999887466431},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5584999918937683},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.47999998927116394},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.4334000051021576},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.42250001430511475},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.3937999904155731},{"id":"https://openalex.org/keywords/mechanism","display_name":"Mechanism (biology)","score":0.382099986076355},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.38119998574256897},{"id":"https://openalex.org/keywords/adaptation","display_name":"Adaptation (eye)","score":0.35989999771118164}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7128999829292297},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5777999758720398},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5767999887466431},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5584999918937683},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.47999998927116394},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.43540000915527344},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.4334000051021576},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.42250001430511475},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.3937999904155731},{"id":"https://openalex.org/C89611455","wikidata":"https://www.wikidata.org/wiki/Q6804646","display_name":"Mechanism (biology)","level":2,"score":0.382099986076355},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.38119998574256897},{"id":"https://openalex.org/C139807058","wikidata":"https://www.wikidata.org/wiki/Q352374","display_name":"Adaptation (eye)","level":2,"score":0.35989999771118164},{"id":"https://openalex.org/C138236772","wikidata":"https://www.wikidata.org/wiki/Q25098575","display_name":"Edge device","level":3,"score":0.33500000834465027},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.321399986743927},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.31690001487731934},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.31619998812675476},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.31220000982284546},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.30630001425743103},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.3012999892234802},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.29429998993873596},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.29249998927116394},{"id":"https://openalex.org/C36464697","wikidata":"https://www.wikidata.org/wiki/Q451553","display_name":"Visualization","level":2,"score":0.2906000018119812},{"id":"https://openalex.org/C2780735816","wikidata":"https://www.wikidata.org/wiki/Q28324931","display_name":"Incremental learning","level":2,"score":0.2883000075817108},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.275299996137619},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.2621000111103058},{"id":"https://openalex.org/C4775677","wikidata":"https://www.wikidata.org/wiki/Q7449393","display_name":"Semiconductor device modeling","level":3,"score":0.2603999972343445},{"id":"https://openalex.org/C2777851325","wikidata":"https://www.wikidata.org/wiki/Q7094102","display_name":"Online model","level":2,"score":0.25360000133514404}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/smc58881.2025.11343177","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smc58881.2025.11343177","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Conference on Systems, Man, and Cybernetics (SMC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.44004306197166443,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W2020286945","https://openalex.org/W2034243637","https://openalex.org/W2034851609","https://openalex.org/W2286515324","https://openalex.org/W2612133367","https://openalex.org/W2790607928","https://openalex.org/W2794933040","https://openalex.org/W2805484002","https://openalex.org/W2920311927","https://openalex.org/W2964189064","https://openalex.org/W2997442117","https://openalex.org/W3003020497","https://openalex.org/W3039229032","https://openalex.org/W3082906739","https://openalex.org/W3083472197","https://openalex.org/W4225484930","https://openalex.org/W4283387112","https://openalex.org/W4312731352","https://openalex.org/W4360993939","https://openalex.org/W4391288556","https://openalex.org/W4400981428","https://openalex.org/W4402754307","https://openalex.org/W4406920015"],"related_works":[],"abstract_inverted_index":{"Although":[0],"convolutional":[1],"neural":[2],"networks":[3],"have":[4],"been":[5],"widely":[6],"used":[7],"for":[8,87,139],"wafer":[9,88,188],"defect":[10,33,89,189],"detection":[11,90,190],"in":[12,42,187],"semiconductor":[13],"manufacturing,":[14],"they":[15],"typically":[16],"rely":[17],"on":[18,135,158],"static":[19],"offline":[20],"datasets":[21],"to":[22,47,60,63,106,119,131,166],"train":[23],"models.":[24],"These":[25],"models":[26,59],"show":[27],"strong":[28],"reliability":[29],"when":[30],"detecting":[31],"known":[32],"types,":[34],"but":[35],"struggle":[36],"with":[37,154],"unknown":[38],"ones,":[39],"posing":[40],"challenges":[41],"model":[43,130,165],"adaptation":[44],"and":[45,95,116],"leading":[46],"high":[48],"maintenance":[49],"costs.":[50],"Incremental":[51],"Learning":[52],"(IL)":[53],"offers":[54],"a":[55,76,83,111,124,155],"solution":[56],"that":[57,91,181],"allows":[58],"continuously":[61],"adapt":[62],"new":[64,171],"types":[65],"of":[66,142,169],"defects":[67],"without":[68],"accessing":[69],"full":[70],"historical":[71],"data.":[72],"This":[73,127],"paper":[74],"introduces":[75],"Virtual":[77],"Data-Guided":[78],"Prompt":[79],"Generation":[80],"(VDGPG)":[81],"framework,":[82],"novel":[84],"IL":[85,193],"approach":[86],"integrates":[92],"prompt-guided":[93],"learning":[94],"dual-branch":[96,145],"virtual":[97,146,152],"data":[98,147],"generation.":[99],"Specifically,":[100],"VDGPG":[101,182],"assigns":[102],"task-specific":[103],"prompt":[104,121,125],"vectors":[105,122],"individual":[107],"attention":[108,113],"heads,":[109],"using":[110,175],"channel":[112],"gating":[114],"mechanism":[115],"similarity":[117],"computation":[118],"select":[120],"from":[123],"pool.":[126],"enables":[128],"the":[129,136,164,176],"focus":[132],"more":[133],"effectively":[134],"relevant":[137],"features":[138,168],"each":[140],"category":[141],"defects.":[143],"The":[144],"generation":[148],"module":[149],"generates":[150],"diverse":[151],"samples,":[153],"special":[156],"emphasis":[157],"contour":[159],"edge":[160],"generation,":[161],"which":[162],"guides":[163],"learn":[167],"potential":[170],"categories":[172],"proactively.":[173],"Experiments":[174],"public":[177],"WM-811K":[178],"dataset":[179],"demonstrate":[180],"achieves":[183],"significant":[184],"performance":[185],"improvements":[186],"over":[191],"existing":[192],"methods.":[194]},"counts_by_year":[],"updated_date":"2026-01-29T23:17:01.242718","created_date":"2026-01-29T00:00:00"}