{"id":"https://openalex.org/W4391307616","doi":"https://doi.org/10.1109/smc53992.2023.10393899","title":"Real-Time Defect Detection Network Based on Hybrid Attention Mechanism for Small-Size Printed Circuit Boards","display_name":"Real-Time Defect Detection Network Based on Hybrid Attention Mechanism for Small-Size Printed Circuit Boards","publication_year":2023,"publication_date":"2023-10-01","ids":{"openalex":"https://openalex.org/W4391307616","doi":"https://doi.org/10.1109/smc53992.2023.10393899"},"language":"en","primary_location":{"id":"doi:10.1109/smc53992.2023.10393899","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smc53992.2023.10393899","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Conference on Systems, Man, and Cybernetics (SMC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100358621","display_name":"Congcong Wang","orcid":"https://orcid.org/0009-0003-8742-3902"},"institutions":[{"id":"https://openalex.org/I152269853","display_name":"Qilu University of Technology","ror":"https://ror.org/04hyzq608","country_code":"CN","type":"education","lineage":["https://openalex.org/I152269853"]},{"id":"https://openalex.org/I4210142748","display_name":"Shandong Academy of Sciences","ror":"https://ror.org/04y8d6y55","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210142748"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Congcong Wang","raw_affiliation_strings":["Qilu University of Technology (Shandong Academy of Sciences),China","Qilu University of Technology (Shandong Academy of Sciences), China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qilu University of Technology (Shandong Academy of Sciences),China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]},{"raw_affiliation_string":"Qilu University of Technology (Shandong Academy of Sciences), China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038780727","display_name":"Xiumei Wei","orcid":"https://orcid.org/0000-0003-2214-0576"},"institutions":[{"id":"https://openalex.org/I152269853","display_name":"Qilu University of Technology","ror":"https://ror.org/04hyzq608","country_code":"CN","type":"education","lineage":["https://openalex.org/I152269853"]},{"id":"https://openalex.org/I4210142748","display_name":"Shandong Academy of Sciences","ror":"https://ror.org/04y8d6y55","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210142748"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiumei Wei","raw_affiliation_strings":["Qilu University of Technology (Shandong Academy of Sciences),China","Qilu University of Technology (Shandong Academy of Sciences), China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qilu University of Technology (Shandong Academy of Sciences),China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]},{"raw_affiliation_string":"Qilu University of Technology (Shandong Academy of Sciences), China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101981129","display_name":"Xiaoming Wu","orcid":"https://orcid.org/0000-0002-5129-1210"},"institutions":[{"id":"https://openalex.org/I152269853","display_name":"Qilu University of Technology","ror":"https://ror.org/04hyzq608","country_code":"CN","type":"education","lineage":["https://openalex.org/I152269853"]},{"id":"https://openalex.org/I4210142748","display_name":"Shandong Academy of Sciences","ror":"https://ror.org/04y8d6y55","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210142748"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoming Wu","raw_affiliation_strings":["Qilu University of Technology (Shandong Academy of Sciences),China","Qilu University of Technology (Shandong Academy of Sciences), China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qilu University of Technology (Shandong Academy of Sciences),China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]},{"raw_affiliation_string":"Qilu University of Technology (Shandong Academy of Sciences), China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013465582","display_name":"Xuesong Jiang","orcid":"https://orcid.org/0000-0001-5854-0550"},"institutions":[{"id":"https://openalex.org/I152269853","display_name":"Qilu University of Technology","ror":"https://ror.org/04hyzq608","country_code":"CN","type":"education","lineage":["https://openalex.org/I152269853"]},{"id":"https://openalex.org/I4210142748","display_name":"Shandong Academy of Sciences","ror":"https://ror.org/04y8d6y55","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210142748"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuesong Jiang","raw_affiliation_strings":["Qilu University of Technology (Shandong Academy of Sciences),China","Qilu University of Technology (Shandong Academy of Sciences), China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qilu University of Technology (Shandong Academy of Sciences),China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]},{"raw_affiliation_string":"Qilu University of Technology (Shandong Academy of Sciences), China","institution_ids":["https://openalex.org/I152269853","https://openalex.org/I4210142748"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.567,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.84747378,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"2258","last_page":"2263"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9067999720573425,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.7169503569602966},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6230920553207397},{"id":"https://openalex.org/keywords/mechanism","display_name":"Mechanism (biology)","score":0.6204581260681152},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08307239413261414}],"concepts":[{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.7169503569602966},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6230920553207397},{"id":"https://openalex.org/C89611455","wikidata":"https://www.wikidata.org/wiki/Q6804646","display_name":"Mechanism (biology)","level":2,"score":0.6204581260681152},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08307239413261414},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/smc53992.2023.10393899","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smc53992.2023.10393899","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Conference on Systems, Man, and Cybernetics (SMC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W2555875178","https://openalex.org/W2897772777","https://openalex.org/W2913074553","https://openalex.org/W2914154500","https://openalex.org/W2920311927","https://openalex.org/W2944303778","https://openalex.org/W2997747012","https://openalex.org/W3013984308","https://openalex.org/W3034552520","https://openalex.org/W3040739812","https://openalex.org/W3126247872","https://openalex.org/W3135077060","https://openalex.org/W3162418282","https://openalex.org/W3174491732","https://openalex.org/W4226212070","https://openalex.org/W4226444513","https://openalex.org/W4293370779","https://openalex.org/W4308602927","https://openalex.org/W6759044181"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2599361292","https://openalex.org/W4252608911","https://openalex.org/W2184913151","https://openalex.org/W2389426768","https://openalex.org/W2098273855","https://openalex.org/W3147987719","https://openalex.org/W2698654916","https://openalex.org/W3163908127","https://openalex.org/W2013997577"],"abstract_inverted_index":{"The":[0],"defect":[1,69,112,158],"detection":[2,148,159],"of":[3,18,23,46,85],"Printed":[4],"Circuit":[5],"boards":[6],"(PCB)":[7],"is":[8],"challenging":[9],"due":[10],"to":[11,58],"the":[12,30,42,49,60,81,96,115,143,147,155],"complex":[13],"image":[14],"background,":[15],"various":[16],"types":[17],"defects,":[19],"and":[20,28,73,87,127,138,146],"small":[21],"size":[22],"defects.":[24],"This":[25],"paper":[26],"develops":[27],"evaluates":[29],"SC-YOLOv5":[31,133,161],"network":[32],"for":[33,95],"accurately":[34],"detecting":[35],"printed":[36],"circuit":[37],"boards.":[38],"First,":[39],"we":[40,79],"combine":[41],"spatial":[43],"attention":[44,56,62],"mechanism":[45,63],"SA":[47],"with":[48,154],"Efficient":[50],"Channel":[51],"Attention":[52],"Mechanism":[53],"(ECA-Net)":[54],"channel":[55],"module":[57,64,93],"construct":[59,88],"hybrid":[61],"(SCA).":[65],"SCA":[66],"has":[67,101],"higher":[68],"feature":[70,82,98,116],"expression":[71],"ability":[72],"doesn't":[74],"need":[75],"dimensionality":[76],"reduction.":[77],"Second,":[78],"analyze":[80],"pyramid":[83,117],"structure":[84],"YOLOv5":[86],"a":[89,102],"multi-direction":[90],"dilated":[91],"convolution":[92],"(MD)":[94],"last":[97],"layer.":[99],"MD":[100,108],"rich":[103],"receptive":[104],"field":[105],"so":[106],"that":[107,132],"can":[109,150],"retain":[110],"more":[111],"information":[113],"during":[114],"downsampling":[118],"process.":[119],"We":[120],"perform":[121],"experimental":[122],"evaluations":[123],"on":[124,142],"PCB":[125],"Dataset":[126],"DeepPCB":[128],"datasets.":[129],"Experiments":[130],"show":[131],"improves":[134,163],"mAP":[135],"by":[136],"1.9%":[137],"1.6":[139],"%,":[140],"respectively,":[141],"two":[144],"datasets,":[145],"speed":[149],"reach":[151],"120FPS.":[152],"Compared":[153],"mainstream":[156],"indication":[157],"algorithms,":[160],"significantly":[162],"accuracy.":[164]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2}],"updated_date":"2026-08-05T07:39:15.569665","created_date":"2025-10-10T00:00:00"}