{"id":"https://openalex.org/W4413095901","doi":"https://doi.org/10.1109/smacd65553.2025.11092079","title":"3D Monte Carlo Simulations of n-type Nanowire-FETs: The Effect of Gate Scaling","display_name":"3D Monte Carlo Simulations of n-type Nanowire-FETs: The Effect of Gate Scaling","publication_year":2025,"publication_date":"2025-07-07","ids":{"openalex":"https://openalex.org/W4413095901","doi":"https://doi.org/10.1109/smacd65553.2025.11092079"},"language":"en","primary_location":{"id":"doi:10.1109/smacd65553.2025.11092079","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd65553.2025.11092079","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://cronfa.swan.ac.uk/Record/cronfa70139","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024216142","display_name":"Murad Ghazy Khalaf Alabdullah","orcid":"https://orcid.org/0000-0002-4941-2474"},"institutions":[{"id":"https://openalex.org/I39586589","display_name":"Swansea University","ror":"https://ror.org/053fq8t95","country_code":"GB","type":"education","lineage":["https://openalex.org/I39586589"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Murad G. K. Alabdullah","raw_affiliation_strings":["Swansea University Swansea,Faculty of Science &amp; Engineering,Dept. Electronic &amp; Electrical Engineering,Wales,United Kingdom"],"affiliations":[{"raw_affiliation_string":"Swansea University Swansea,Faculty of Science &amp; Engineering,Dept. Electronic &amp; Electrical Engineering,Wales,United Kingdom","institution_ids":["https://openalex.org/I39586589"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069462829","display_name":"Natalia Seoane","orcid":"https://orcid.org/0000-0003-0973-461X"},"institutions":[{"id":"https://openalex.org/I200284239","display_name":"Universidade de Santiago de Compostela","ror":"https://ror.org/030eybx10","country_code":"ES","type":"education","lineage":["https://openalex.org/I200284239"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"N. Seoane","raw_affiliation_strings":["University of Santiago de Compostela,CITIUS,Santiago de Compostela,Spain"],"affiliations":[{"raw_affiliation_string":"University of Santiago de Compostela,CITIUS,Santiago de Compostela,Spain","institution_ids":["https://openalex.org/I200284239"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016054212","display_name":"Antonio J. Garc\u00eda\u2010Loureiro","orcid":"https://orcid.org/0000-0003-0574-1513"},"institutions":[{"id":"https://openalex.org/I39586589","display_name":"Swansea University","ror":"https://ror.org/053fq8t95","country_code":"GB","type":"education","lineage":["https://openalex.org/I39586589"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"A. J. Garc\u00eda-Loureiro","raw_affiliation_strings":["Swansea University Swansea,Faculty of Science &amp; Engineering,Dept. Electronic &amp; Electrical Engineering,Wales,United Kingdom"],"affiliations":[{"raw_affiliation_string":"Swansea University Swansea,Faculty of Science &amp; Engineering,Dept. Electronic &amp; Electrical Engineering,Wales,United Kingdom","institution_ids":["https://openalex.org/I39586589"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018013635","display_name":"K. K\u00e1lna","orcid":"https://orcid.org/0000-0002-6333-9189"},"institutions":[{"id":"https://openalex.org/I39586589","display_name":"Swansea University","ror":"https://ror.org/053fq8t95","country_code":"GB","type":"education","lineage":["https://openalex.org/I39586589"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"K. Kalna","raw_affiliation_strings":["Swansea University Swansea,Faculty of Science &amp; Engineering,Dept. Electronic &amp; Electrical Engineering,Wales,United Kingdom"],"affiliations":[{"raw_affiliation_string":"Swansea University Swansea,Faculty of Science &amp; Engineering,Dept. Electronic &amp; Electrical Engineering,Wales,United Kingdom","institution_ids":["https://openalex.org/I39586589"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5024216142"],"corresponding_institution_ids":["https://openalex.org/I39586589"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18110569,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.7632206678390503},{"id":"https://openalex.org/keywords/nanowire","display_name":"Nanowire","score":0.709307074546814},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.6945106983184814},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.449564665555954},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.3882100284099579},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3108753561973572},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.26422542333602905},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09842121601104736}],"concepts":[{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.7632206678390503},{"id":"https://openalex.org/C74214498","wikidata":"https://www.wikidata.org/wiki/Q631739","display_name":"Nanowire","level":2,"score":0.709307074546814},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.6945106983184814},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.449564665555954},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.3882100284099579},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3108753561973572},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.26422542333602905},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09842121601104736},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/smacd65553.2025.11092079","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd65553.2025.11092079","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)","raw_type":"proceedings-article"},{"id":"pmh:oai:cronfa.swan.ac.uk:cronfa70139","is_oa":true,"landing_page_url":"https://cronfa.swan.ac.uk/Record/cronfa70139","pdf_url":null,"source":{"id":"https://openalex.org/S4306401613","display_name":"Cronfa (Swansea University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I39586589","host_organization_name":"Swansea University","host_organization_lineage":["https://openalex.org/I39586589"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"Conference Paper/Proceeding/Abstract"}],"best_oa_location":{"id":"pmh:oai:cronfa.swan.ac.uk:cronfa70139","is_oa":true,"landing_page_url":"https://cronfa.swan.ac.uk/Record/cronfa70139","pdf_url":null,"source":{"id":"https://openalex.org/S4306401613","display_name":"Cronfa (Swansea University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I39586589","host_organization_name":"Swansea University","host_organization_lineage":["https://openalex.org/I39586589"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"Conference Paper/Proceeding/Abstract"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1981642396","https://openalex.org/W1987451003","https://openalex.org/W2026814124","https://openalex.org/W2029223507","https://openalex.org/W2048331646","https://openalex.org/W2118116654","https://openalex.org/W2141449756","https://openalex.org/W2785517166","https://openalex.org/W2786385800","https://openalex.org/W2793484859","https://openalex.org/W2951930035","https://openalex.org/W2966012355","https://openalex.org/W3011412823","https://openalex.org/W3067903889","https://openalex.org/W3126455199","https://openalex.org/W3197664961","https://openalex.org/W4211157411","https://openalex.org/W4225815893","https://openalex.org/W4285506201","https://openalex.org/W4393171223","https://openalex.org/W4399768230","https://openalex.org/W4402902598","https://openalex.org/W4403937221","https://openalex.org/W4407756997"],"related_works":["https://openalex.org/W3100245096","https://openalex.org/W2519545954","https://openalex.org/W2056843536","https://openalex.org/W1995826969","https://openalex.org/W3217323610","https://openalex.org/W1990001655","https://openalex.org/W2083192414","https://openalex.org/W3102781811","https://openalex.org/W2005266888","https://openalex.org/W1979444024"],"abstract_inverted_index":{"The":[0,65],"potential":[1],"of":[2,28,161],"gate-all-around":[3],"(GAA)":[4],"nanowire":[5],"(NW)":[6],"field-effect":[7],"transistors":[8],"(FETs)":[9],"to":[10,95,99,119,131,140],"replace":[11],"sub-3":[12],"nm":[13,97,118,170],"complementary":[14],"metal-oxide-semiconductor":[15],"(CMOS)":[16],"technology":[17],"has":[18],"attracted":[19],"significant":[20],"interest.":[21],"This":[22,136,154],"simulation":[23,55],"study":[24,155],"investigates":[25],"the":[26,36,62,91,150,158],"impact":[27],"gate":[29,92,171],"length":[30,93],"(L<inf":[31],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[32,41,68,70,105,112],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">G</inf>)":[33],"scaling":[34,90,124],"on":[35],"drain":[37,84],"drive":[38,166],"current":[39,167],"(I<inf":[40],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DD</inf>)":[42],"in":[43,103,164,173,189],"NW-FETs":[44],"using":[45],"an":[46,100],"advanced":[47],"in-house":[48],"3D":[49],"finite-element":[50],"ensemble":[51],"Monte":[52],"Carlo":[53],"(MC)":[54],"toolbox":[56],"that":[57,89],"incorporates":[58],"quantum":[59],"corrections":[60],"via":[61],"Schr\u00f6dinger":[63],"equation.":[64],"MC-simulated":[66],"I<inf":[67,104,111],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">D</inf>-V<inf":[69],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">G</inf>":[71],"characteristics":[72],"show":[73],"excellent":[74],"agreement":[75],"with":[76,123],"experimental":[77],"data":[78],"across":[79],"both":[80],"low":[81],"and":[82,143,182],"high":[83],"biases.":[85],"Our":[86],"results":[87],"reveal":[88],"down":[94],"10":[96,134],"leads":[98],"unexpected":[101],"decline":[102],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DD</inf>":[106,113],"beyond":[107],"16":[108,120],"nm.":[109,135],"While":[110],"initially":[114],"increases":[115],"from":[116,149],"22":[117],"nm,":[121],"consistent":[122],"theory,":[125],"it":[126],"subsequently":[127],"decreases":[128],"by":[129],"up":[130],"12%":[132],"at":[133,168],"reduction":[137],"is":[138],"attributed":[139],"intensified":[141],"back-scattering":[142],"enhanced":[144],"fringing":[145],"electric":[146],"fields":[147],"resulting":[148],"shorter":[151],"source-to-drain":[152],"distance.":[153],"uniquely":[156],"demonstrates":[157],"critical":[159],"role":[160],"these":[162],"effects":[163],"limiting":[165],"sub-16":[169],"lengths":[172],"NW-FETs\u2014providing":[174],"predictive":[175],"insight":[176],"into":[177],"non-ideal":[178],"short-channel":[179],"transport":[180],"behaviors":[181],"highlighting":[183],"key":[184],"challenges":[185],"for":[186],"performance":[187],"optimization":[188],"future":[190],"transistor":[191],"architectures.":[192]},"counts_by_year":[],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}