{"id":"https://openalex.org/W4413096212","doi":"https://doi.org/10.1109/smacd65553.2025.11092024","title":"Circuit-Level Modeling and Simulation of Read Disturbance Phenomena: RowHammer and RowPress","display_name":"Circuit-Level Modeling and Simulation of Read Disturbance Phenomena: RowHammer and RowPress","publication_year":2025,"publication_date":"2025-07-07","ids":{"openalex":"https://openalex.org/W4413096212","doi":"https://doi.org/10.1109/smacd65553.2025.11092024"},"language":"en","primary_location":{"id":"doi:10.1109/smacd65553.2025.11092024","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd65553.2025.11092024","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Eda Deniz Demirel","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Eda Deniz Demirel","raw_affiliation_strings":["Boğaziçi University,Department of Electrical and Electronics Engineering"],"affiliations":[{"raw_affiliation_string":"Boğaziçi University,Department of Electrical and Electronics Engineering","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048055344","display_name":"Eng\u00edn Afacan","orcid":"https://orcid.org/0000-0002-1581-3894"},"institutions":[{"id":"https://openalex.org/I109297418","display_name":"Gebze Technical University","ror":"https://ror.org/01sdnnq10","country_code":"TR","type":"education","lineage":["https://openalex.org/I109297418"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Engin Afacan","raw_affiliation_strings":["Gebze Technical University,Department of Electronics Engineering"],"affiliations":[{"raw_affiliation_string":"Gebze Technical University,Department of Electronics Engineering","institution_ids":["https://openalex.org/I109297418"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052669741","display_name":"G\u00fcnhan D\u00fcndar","orcid":"https://orcid.org/0000-0003-2044-2706"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Gunhan D\u00fcndar","raw_affiliation_strings":["Boğaziçi University,Department of Electrical and Electronics Engineering"],"affiliations":[{"raw_affiliation_string":"Boğaziçi University,Department of Electrical and Electronics Engineering","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17528942,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/disturbance","display_name":"Disturbance (geology)","score":0.8024842143058777},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5453831553459167},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4371863007545471},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3387514352798462},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27910393476486206},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.09667527675628662}],"concepts":[{"id":"https://openalex.org/C2777601987","wikidata":"https://www.wikidata.org/wiki/Q5283581","display_name":"Disturbance (geology)","level":2,"score":0.8024842143058777},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5453831553459167},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4371863007545471},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3387514352798462},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27910393476486206},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.09667527675628662},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/smacd65553.2025.11092024","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd65553.2025.11092024","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W2063397409","https://openalex.org/W2150909864","https://openalex.org/W2157116240","https://openalex.org/W2164586147","https://openalex.org/W2786858886","https://openalex.org/W2910622707","https://openalex.org/W3096869711","https://openalex.org/W3102014803","https://openalex.org/W3133752511","https://openalex.org/W3146763006","https://openalex.org/W3205305497","https://openalex.org/W4287849479","https://openalex.org/W4308643042","https://openalex.org/W4380875579","https://openalex.org/W4401990408"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2038604956","https://openalex.org/W2296560746","https://openalex.org/W2338222801","https://openalex.org/W2347583731","https://openalex.org/W2106602008","https://openalex.org/W2067832159","https://openalex.org/W2153353177"],"abstract_inverted_index":{"As":[0],"DRAM":[1,151],"cells":[2],"continue":[3],"to":[4,11,94],"scale":[5],"down,":[6],"they":[7,71],"become":[8],"increasingly":[9],"susceptible":[10],"read":[12,138],"disturbance":[13,119,139],"effects":[14,115],"such":[15],"as":[16],"RowHammer":[17,49],"and":[18,31,50,60,116],"RowPress.":[19],"These":[20],"phenomena":[21],"cause":[22],"bitflips":[23],"in":[24,34],"unaccessed":[25],"memory":[26,29],"regions,":[27],"compromising":[28],"isolation":[30],"data":[32,127],"integrity":[33],"modern":[35],"computing":[36],"systems,":[37],"with":[38,125],"vulnerability":[39,69],"levels":[40],"increasing":[41],"more":[42],"than":[43],"10x":[44],"over":[45],"the":[46,74,104,132],"past":[47],"decade.":[48],"RowPress":[51],"have":[52],"traditionally":[53],"been":[54],"investigated":[55],"through":[56],"real-world":[57],"chip":[58,65],"experiments":[59,66],"detailed":[61],"TCAD":[62,79],"simulations.":[63],"While":[64],"demonstrate":[67],"realworld":[68],"levels,":[70],"cannot":[72],"reveal":[73],"underlying":[75],"circuit":[76,152],"dynamics.":[77],"Meanwhile,":[78],"simulations,":[80],"though":[81],"capable":[82,110],"of":[83,111],"capturing":[84,117],"these":[85,100],"dynamics,":[86],"face":[87],"significant":[88],"computational":[89],"limitations,":[90,101],"restricting":[91],"their":[92],"analyses":[93],"small-scale":[95],"cell-level":[96],"studies.":[97],"To":[98],"address":[99],"we":[102],"propose":[103],"first":[105],"circuit-level":[106],"SPICE-based":[107,134],"simulation":[108],"framework":[109,124],"integrating":[112],"layout-induced":[113],"aggressor":[114],"key":[118],"mechanisms.":[120],"By":[121],"aligning":[122],"our":[123],"experimental":[126],"from":[128],"off-the-shelf":[129],"DDR4":[130],"modules,":[131],"proposed":[133],"model":[135],"effectively":[136],"demonstrates":[137],"vulnerabilities":[140],"under":[141],"various":[142],"operating":[143],"conditions,":[144],"providing":[145],"a":[146],"practical":[147],"foundation":[148],"for":[149],"robust":[150],"design":[153],"improvements.":[154]},"counts_by_year":[],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}