{"id":"https://openalex.org/W4413096228","doi":"https://doi.org/10.1109/smacd65553.2025.11091985","title":"Dark Current Analysis in Silicon PIN Photodetectors: TCAD, Lifetime and Statistical Process Control","display_name":"Dark Current Analysis in Silicon PIN Photodetectors: TCAD, Lifetime and Statistical Process Control","publication_year":2025,"publication_date":"2025-07-07","ids":{"openalex":"https://openalex.org/W4413096228","doi":"https://doi.org/10.1109/smacd65553.2025.11091985"},"language":"en","primary_location":{"id":"doi:10.1109/smacd65553.2025.11091985","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd65553.2025.11091985","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075852005","display_name":"Yigithan Mehmet Kose","orcid":null},"institutions":[{"id":"https://openalex.org/I4210141511","display_name":"TUBITAK BILGEM","ror":"https://ror.org/057kvja37","country_code":"TR","type":"government","lineage":["https://openalex.org/I4210141511"]}],"countries":["TR"],"is_corresponding":true,"raw_author_name":"Yigithan Mehmet Kose","raw_affiliation_strings":["TUBITAK BILGEM UEKAE YITAL,Turkiye"],"affiliations":[{"raw_affiliation_string":"TUBITAK BILGEM UEKAE YITAL,Turkiye","institution_ids":["https://openalex.org/I4210141511"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5119265323","display_name":"Utku Guney","orcid":null},"institutions":[{"id":"https://openalex.org/I4210141511","display_name":"TUBITAK BILGEM","ror":"https://ror.org/057kvja37","country_code":"TR","type":"government","lineage":["https://openalex.org/I4210141511"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Utku Guney","raw_affiliation_strings":["TUBITAK BILGEM UEKAE YITAL,Turkiye"],"affiliations":[{"raw_affiliation_string":"TUBITAK BILGEM UEKAE YITAL,Turkiye","institution_ids":["https://openalex.org/I4210141511"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089182407","display_name":"El\u00e7in Mert","orcid":null},"institutions":[{"id":"https://openalex.org/I4210141511","display_name":"TUBITAK BILGEM","ror":"https://ror.org/057kvja37","country_code":"TR","type":"government","lineage":["https://openalex.org/I4210141511"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Elcin Mert","raw_affiliation_strings":["TUBITAK BILGEM UEKAE YITAL,Turkiye"],"affiliations":[{"raw_affiliation_string":"TUBITAK BILGEM UEKAE YITAL,Turkiye","institution_ids":["https://openalex.org/I4210141511"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068771144","display_name":"Dilek Al\u0131ml\u0131","orcid":"https://orcid.org/0000-0003-4564-9447"},"institutions":[{"id":"https://openalex.org/I4210141511","display_name":"TUBITAK BILGEM","ror":"https://ror.org/057kvja37","country_code":"TR","type":"government","lineage":["https://openalex.org/I4210141511"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Dilek Alimli","raw_affiliation_strings":["TUBITAK BILGEM UEKAE YITAL,Turkiye"],"affiliations":[{"raw_affiliation_string":"TUBITAK BILGEM UEKAE YITAL,Turkiye","institution_ids":["https://openalex.org/I4210141511"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5075852005"],"corresponding_institution_ids":["https://openalex.org/I4210141511"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.33008079,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photodetector","display_name":"Photodetector","score":0.7497464418411255},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.7232578992843628},{"id":"https://openalex.org/keywords/dark-current","display_name":"Dark current","score":0.6876817941665649},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5988174676895142},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5332764387130737},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.522911012172699},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.46624866127967834},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4637174606323242},{"id":"https://openalex.org/keywords/process-control","display_name":"Process control","score":0.4486468434333801},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32796376943588257},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23482176661491394},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17643186450004578}],"concepts":[{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.7497464418411255},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.7232578992843628},{"id":"https://openalex.org/C180651308","wikidata":"https://www.wikidata.org/wiki/Q1265973","display_name":"Dark current","level":3,"score":0.6876817941665649},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5988174676895142},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5332764387130737},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.522911012172699},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.46624866127967834},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4637174606323242},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.4486468434333801},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32796376943588257},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23482176661491394},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17643186450004578},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/smacd65553.2025.11091985","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd65553.2025.11091985","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1491885026","https://openalex.org/W2109150339","https://openalex.org/W2171968814","https://openalex.org/W2756942455","https://openalex.org/W4391079271","https://openalex.org/W4391079350","https://openalex.org/W6681509880"],"related_works":["https://openalex.org/W2371692126","https://openalex.org/W2592416155","https://openalex.org/W2978010793","https://openalex.org/W4387019742","https://openalex.org/W2473086924","https://openalex.org/W3160253050","https://openalex.org/W2590831201","https://openalex.org/W2000235131","https://openalex.org/W2182698433","https://openalex.org/W1964259304"],"abstract_inverted_index":{"Photodetectors,":[0],"particularly":[1],"those":[2],"employing":[3],"silicon":[4],"PIN":[5],"diodes,":[6],"are":[7],"critical":[8],"in":[9,137,154],"various":[10],"applications":[11],"due":[12],"to":[13,130],"their":[14],"high":[15],"responsivity":[16],"and":[17,41,52,71,84,97,134],"speed.":[18],"However,":[19],"minimizing":[20],"dark":[21,39,85,108,126],"current":[22,40,86,109,127],"a":[23,45],"primary":[24],"source":[25],"of":[26,57,107],"noise":[27],"is":[28],"essential":[29],"for":[30,64,146],"improving":[31],"performance.":[32,156],"This":[33,140],"study":[34],"investigates":[35],"the":[36,105,144],"relationship":[37],"between":[38,81],"minority":[42],"carrier":[43,118],"lifetime,":[44],"key":[46],"parameter":[47],"influenced":[48],"by":[49,92],"material":[50],"defects":[51],"process":[53,68,132],"variability.":[54],"A":[55],"combination":[56],"experimental":[58],"techniques,":[59],"including":[60],"microwave":[61],"photoconductance":[62],"decay":[63],"lifetime":[65,82],"mapping,":[66],"statistical":[67,93],"control":[69,133],"(SPC),":[70],"TCAD":[72,102],"simulations,":[73],"was":[74],"employed.":[75],"Experimental":[76],"results":[77],"revealed":[78],"minimal":[79],"correlation":[80,99],"values":[83],"across":[87],"production":[88],"phases,":[89],"as":[90],"indicated":[91],"analyses":[94],"using":[95],"Spearman":[96],"Pearson":[98],"coefficients.":[100],"Meanwhile,":[101],"simulations":[103],"demonstrated":[104],"dependence":[106],"on":[110],"Shockley-Reed-Hall":[111],"(SRH)":[112],"recombination,":[113],"which":[114],"dominated":[115],"under":[116],"low":[117],"injection":[119],"conditions.":[120],"These":[121],"findings":[122],"provide":[123],"insight":[124],"into":[125],"behavior,":[128],"contributing":[129],"enhanced":[131],"defect":[135],"analysis":[136],"photodetector":[138,148],"manufacturing.":[139],"comprehensive":[141],"approach":[142],"lays":[143],"groundwork":[145],"optimizing":[147],"fabrication":[149],"processes":[150],"while":[151],"addressing":[152],"variability":[153],"device":[155]},"counts_by_year":[],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}