{"id":"https://openalex.org/W2967435731","doi":"https://doi.org/10.1109/smacd.2019.8795296","title":"A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs","display_name":"A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs","publication_year":2019,"publication_date":"2019-07-01","ids":{"openalex":"https://openalex.org/W2967435731","doi":"https://doi.org/10.1109/smacd.2019.8795296","mag":"2967435731"},"language":"en","primary_location":{"id":"doi:10.1109/smacd.2019.8795296","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd.2019.8795296","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021426042","display_name":"Luca Sterpone","orcid":"https://orcid.org/0000-0002-3080-2560"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Luca Sterpone","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy","Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091713814","display_name":"Ludovica Bozzoli","orcid":"https://orcid.org/0000-0001-5099-9359"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Ludovica Bozzoli","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy","Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018567565","display_name":"Corrado De Sio","orcid":"https://orcid.org/0000-0003-4212-3052"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Corrado De Sio","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy","Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091108518","display_name":"Boyang Du","orcid":"https://orcid.org/0000-0002-1305-0459"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Boyang Du","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy","Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004083312","display_name":"Sarah Azimi","orcid":"https://orcid.org/0000-0002-9169-6140"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Sarah Azimi","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy","Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5021426042"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":null,"apc_paid":null,"fwci":0.2421,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.553583,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"205","last_page":"208"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7492821216583252},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6995517611503601},{"id":"https://openalex.org/keywords/lookup-table","display_name":"Lookup table","score":0.6782435178756714},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5415033102035522},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5219920873641968},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4993925094604492},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.4805651009082794},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.45842161774635315},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45580270886421204},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.44587942957878113},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4415142834186554},{"id":"https://openalex.org/keywords/table","display_name":"Table (database)","score":0.43188437819480896},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.357035368680954},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.24094024300575256},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.15641972422599792},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1255401372909546},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11232763528823853}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7492821216583252},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6995517611503601},{"id":"https://openalex.org/C134835016","wikidata":"https://www.wikidata.org/wiki/Q690265","display_name":"Lookup table","level":2,"score":0.6782435178756714},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5415033102035522},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5219920873641968},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4993925094604492},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.4805651009082794},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.45842161774635315},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45580270886421204},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.44587942957878113},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4415142834186554},{"id":"https://openalex.org/C45235069","wikidata":"https://www.wikidata.org/wiki/Q278425","display_name":"Table (database)","level":2,"score":0.43188437819480896},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.357035368680954},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.24094024300575256},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.15641972422599792},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1255401372909546},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11232763528823853},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/smacd.2019.8795296","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd.2019.8795296","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1605870922","https://openalex.org/W1977594038","https://openalex.org/W2014652530","https://openalex.org/W2116759779","https://openalex.org/W2123000916","https://openalex.org/W2133425482","https://openalex.org/W2144149750","https://openalex.org/W2151542687","https://openalex.org/W2157643673","https://openalex.org/W2558453873","https://openalex.org/W2604465481","https://openalex.org/W2783081454","https://openalex.org/W2789715134","https://openalex.org/W4240648805","https://openalex.org/W6679441171"],"related_works":["https://openalex.org/W2044069930","https://openalex.org/W2078707653","https://openalex.org/W3196277062","https://openalex.org/W4224229821","https://openalex.org/W2079643259","https://openalex.org/W2782341877","https://openalex.org/W2593605297","https://openalex.org/W2969553121","https://openalex.org/W1553526993","https://openalex.org/W2408771053"],"abstract_inverted_index":{"In":[0,51],"recent":[1],"years,":[2],"three-dimensional":[3],"IC":[4,17],"(3D":[5],"IC)":[6],"has":[7],"gained":[8],"much":[9],"attention":[10],"as":[11],"a":[12,56,101,106,118],"promising":[13],"approach":[14,116],"to":[15,20,65,87],"increase":[16],"performance":[18],"due":[19],"their":[21],"several":[22],"advantages":[23],"in":[24],"terms":[25],"of":[26,38,62,80,94,131,138,147],"integration":[27],"density,":[28],"power":[29],"dissipation":[30],"and":[31,91],"achievable":[32],"clock":[33],"frequencies.":[34],"However,":[35],"the":[36,60,78,81,88,95,115,129,132,135],"reliability":[37],"3D":[39,63,92,120],"ICs":[40,64],"regarding":[41],"soft":[42],"errors":[43],"induced":[44,69],"by":[45,70],"radiation":[46,89],"is":[47],"not":[48],"investigated":[49],"yet.":[50],"this":[52],"work,":[53],"we":[54],"propose":[55],"method":[57,99],"for":[58],"evaluating":[59],"sensitivity":[61],"Single":[66],"Event":[67],"Transient":[68],"Heavy":[71],"Ions.":[72],"The":[73],"flow":[74],"starts":[75],"with":[76,85],"identifying":[77],"characteristics":[79],"generated":[82],"transient":[83],"pulses":[84],"respect":[86],"profile":[90],"layout":[93],"design.":[96],"Secondly,":[97],"our":[98],"provides":[100],"Dynamic":[102],"Error":[103],"Rate":[104],"using":[105,143],"Simulation-based":[107],"Fault":[108],"Injection":[109],"environment.":[110],"Experimental":[111],"results":[112],"achieved":[113],"applying":[114],"on":[117,125],"15nm":[119],"configurable":[121],"Look-Up-Table":[122],"(LUT)":[123],"designed":[124],"two":[126],"tiers":[127],"demonstrated":[128],"feasibility":[130],"method,":[133],"showing":[134],"vulnerability":[136],"characterization":[137],"four":[139],"different":[140,145],"functional":[141],"configurations":[142],"eight":[144],"types":[146],"heavy":[148],"ions.":[149]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-04-19T08:26:33.389920","created_date":"2025-10-10T00:00:00"}