{"id":"https://openalex.org/W2735730703","doi":"https://doi.org/10.1109/smacd.2017.7981600","title":"A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging","display_name":"A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging","publication_year":2017,"publication_date":"2017-06-01","ids":{"openalex":"https://openalex.org/W2735730703","doi":"https://doi.org/10.1109/smacd.2017.7981600","mag":"2735730703"},"language":"en","primary_location":{"id":"doi:10.1109/smacd.2017.7981600","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd.2017.7981600","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056827862","display_name":"J. Diaz-Fortuny","orcid":"https://orcid.org/0000-0002-8186-071X"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. Diaz-Fortuny","raw_affiliation_strings":["Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004487540","display_name":"J. Mart\u00edn-Mart\u00ednez","orcid":"https://orcid.org/0000-0001-5938-5898"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. Martin-Martinez","raw_affiliation_strings":["Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058670975","display_name":"R. Rodr\u0131\u0301guez","orcid":"https://orcid.org/0000-0002-4565-6703"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"R. Rodriguez","raw_affiliation_strings":["Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017592638","display_name":"M. Nafr\u0131\u0301a","orcid":"https://orcid.org/0000-0002-9549-2890"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"M. Nafria","raw_affiliation_strings":["Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department (REDEC) group, Universitat Aut\u00f2noma de Barcelona (UAB), Barcelona, Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068422347","display_name":"R. Castro\u2010L\u00f3pez","orcid":"https://orcid.org/0000-0002-6247-3124"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"R. Castro-Lopez","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011140420","display_name":"E. Roca","orcid":"https://orcid.org/0000-0001-6260-6495"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"E. Roca","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041853563","display_name":"F.V. Fern\u00e1ndez","orcid":"https://orcid.org/0000-0001-8682-2280"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"F.V. Fernandez","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla), Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044068164","display_name":"Enrique Barajas","orcid":"https://orcid.org/0000-0002-2072-2268"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"E. Barajas","raw_affiliation_strings":["Electronics Engineering Department, Universitat Polit\u00e8cnica de Catalunya (UPC), Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics Engineering Department, Universitat Polit\u00e8cnica de Catalunya (UPC), Barcelona, Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082608573","display_name":"X. Aragon\u00e9s","orcid":"https://orcid.org/0000-0003-1352-8675"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"X. Aragones","raw_affiliation_strings":["Electronics Engineering Department, Universitat Polit\u00e8cnica de Catalunya (UPC), Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics Engineering Department, Universitat Polit\u00e8cnica de Catalunya (UPC), Barcelona, Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009632779","display_name":"D. Mateo","orcid":"https://orcid.org/0000-0001-5996-9092"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"D. Mateo","raw_affiliation_strings":["Electronics Engineering Department, Universitat Polit\u00e8cnica de Catalunya (UPC), Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics Engineering Department, Universitat Polit\u00e8cnica de Catalunya (UPC), Barcelona, Spain","institution_ids":["https://openalex.org/I9617848"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3157,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.81938719,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"2016","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.7840573787689209},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6786820292472839},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6601447463035583},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.6127786636352539},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5491705536842346},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.518986165523529},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46555501222610474},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.45538970828056335},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4198463261127472},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.4192248582839966},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30421143770217896},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.30258625745773315},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.1789446771144867},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08695724606513977},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.06617829203605652}],"concepts":[{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.7840573787689209},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6786820292472839},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6601447463035583},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.6127786636352539},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5491705536842346},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.518986165523529},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46555501222610474},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.45538970828056335},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4198463261127472},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4192248582839966},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30421143770217896},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.30258625745773315},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1789446771144867},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08695724606513977},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06617829203605652},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/smacd.2017.7981600","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd.2017.7981600","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7099999785423279}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1989756405","https://openalex.org/W2149134343","https://openalex.org/W2155412678","https://openalex.org/W2170644629","https://openalex.org/W2310821187","https://openalex.org/W2320628389","https://openalex.org/W2365858435","https://openalex.org/W2526554864","https://openalex.org/W2546540395","https://openalex.org/W2734764095","https://openalex.org/W6698572308"],"related_works":["https://openalex.org/W3107994849","https://openalex.org/W3014521742","https://openalex.org/W4247143848","https://openalex.org/W2009883749","https://openalex.org/W2735573198","https://openalex.org/W29442446","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4386230336","https://openalex.org/W330727063"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"a":[3,22,43,65],"CMOS":[4],"transistor":[5],"array":[6],"is":[7],"presented,":[8],"which":[9],"allows":[10,47],"performing":[11],"process":[12],"variability,":[13],"Random":[14],"Telegraph":[15],"Noise":[16],"and":[17,35],"BTI/CHC":[18],"aging":[19,61],"characterization":[20],"in":[21],"single":[23,34],"chip.":[24],"The":[25],"array,":[26],"called":[27],"ENDURANCE,":[28],"integrates":[29],"3136":[30],"MOS":[31],"transistors,":[32],"for":[33,60],"massive":[36],"electrical":[37,52],"testing.":[38],"This":[39],"chip,":[40],"together":[41],"with":[42],"dedicated":[44],"measurement":[45],"set-up,":[46],"programming":[48],"any":[49],"of":[50],"these":[51],"tests,":[53],"considerably":[54],"reducing":[55],"the":[56],"total":[57],"time":[58],"needed":[59],"measurements":[62],"by":[63],"using":[64],"parallelization":[66],"technique.":[67]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}