{"id":"https://openalex.org/W2735773740","doi":"https://doi.org/10.1109/smacd.2017.7981593","title":"Importance of IR drops on the modeling of laser-induced transient faults","display_name":"Importance of IR drops on the modeling of laser-induced transient faults","publication_year":2017,"publication_date":"2017-06-01","ids":{"openalex":"https://openalex.org/W2735773740","doi":"https://doi.org/10.1109/smacd.2017.7981593","mag":"2735773740"},"language":"en","primary_location":{"id":"doi:10.1109/smacd.2017.7981593","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd.2017.7981593","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-01721087/document","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054844530","display_name":"Raphael Viera","orcid":"https://orcid.org/0000-0002-3292-5011"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Raphael A. Camponogara Viera","raw_affiliation_strings":["LIRMM, Montpellier, Languedoc-Roussillon, FR","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LIRMM, Montpellier, Languedoc-Roussillon, FR","institution_ids":["https://openalex.org/I4210101743"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015351510","display_name":"Philippe Maurine","orcid":"https://orcid.org/0000-0002-9706-5710"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Philippe Maurine","raw_affiliation_strings":["LIRMM, UMR, Montpellier, France","SmartIES - Smart Integrated Electronic Systems (LIRMM, 161 rue Ada, 34000 Montpellier - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LIRMM, UMR, Montpellier, France","institution_ids":["https://openalex.org/I4210101743"]},{"raw_affiliation_string":"SmartIES - Smart Integrated Electronic Systems (LIRMM, 161 rue Ada, 34000 Montpellier - France)","institution_ids":["https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070109221","display_name":"Jean-Max Dutertre","orcid":"https://orcid.org/0000-0002-2251-7815"},"institutions":[{"id":"https://openalex.org/I3019848993","display_name":"Mines Saint-\u00c9tienne","ror":"https://ror.org/05a1dws80","country_code":"FR","type":"education","lineage":["https://openalex.org/I203339264","https://openalex.org/I205703379","https://openalex.org/I3019848993"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Jean-Max Dutertre","raw_affiliation_strings":["Ecole Nat. Sup. des Mines de St-Etienne, Gardanne, France","ENSM ST-ETIENNE - Ecole Nationale Sup\u00e9rieure des Mines de St Etienne (158 Cour Fauriel, 42100 Saint-\u00c9tienne - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ecole Nat. Sup. des Mines de St-Etienne, Gardanne, France","institution_ids":["https://openalex.org/I3019848993"]},{"raw_affiliation_string":"ENSM ST-ETIENNE - Ecole Nationale Sup\u00e9rieure des Mines de St Etienne (158 Cour Fauriel, 42100 Saint-\u00c9tienne - France)","institution_ids":["https://openalex.org/I3019848993"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021853209","display_name":"Rodrigo Possamai Bastos","orcid":"https://orcid.org/0000-0002-9964-0424"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Rodrigo Possamai Bastos","raw_affiliation_strings":["CNRS, Univ. Grenoble Alpes, Grenoble, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, Univ. Grenoble Alpes, Grenoble, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I899635006"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet 38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.8180406093597412},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.7137867212295532},{"id":"https://openalex.org/keywords/drop","display_name":"Drop (telecommunication)","score":0.5345954298973083},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.5010781288146973},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.45203980803489685},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4303257465362549},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2940524220466614},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29280006885528564},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.2362191379070282},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20862212777137756},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20210203528404236},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.18761420249938965},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.06150633096694946}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.8180406093597412},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.7137867212295532},{"id":"https://openalex.org/C2781345722","wikidata":"https://www.wikidata.org/wiki/Q5308388","display_name":"Drop (telecommunication)","level":2,"score":0.5345954298973083},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.5010781288146973},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.45203980803489685},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4303257465362549},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2940524220466614},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29280006885528564},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.2362191379070282},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20862212777137756},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20210203528404236},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.18761420249938965},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.06150633096694946},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/smacd.2017.7981593","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd.2017.7981593","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01721087v1","is_oa":true,"landing_page_url":"https://hal.science/hal-01721087","pdf_url":"https://hal.science/hal-01721087/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Jun 2017, Giardini Naxos, Italy. ⟨10.1109/SMACD.2017.7981593⟩","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-01721087v1","is_oa":true,"landing_page_url":"https://hal.science/hal-01721087","pdf_url":"https://hal.science/hal-01721087/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Jun 2017, Giardini Naxos, Italy. ⟨10.1109/SMACD.2017.7981593⟩","raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2735773740.pdf","grobid_xml":"https://content.openalex.org/works/W2735773740.grobid-xml"},"referenced_works_count":10,"referenced_works":["https://openalex.org/W1999233841","https://openalex.org/W2012516917","https://openalex.org/W2030501553","https://openalex.org/W2035736061","https://openalex.org/W2050199021","https://openalex.org/W2115762432","https://openalex.org/W2144309898","https://openalex.org/W2167123894","https://openalex.org/W2333503602","https://openalex.org/W2547800307"],"related_works":["https://openalex.org/W2758798772","https://openalex.org/W2081338125","https://openalex.org/W4239924455","https://openalex.org/W2001630809","https://openalex.org/W4244925124","https://openalex.org/W2377879397","https://openalex.org/W2903984874","https://openalex.org/W1577327694","https://openalex.org/W2887517211","https://openalex.org/W1909312109"],"abstract_inverted_index":{"Laser":[0],"fault":[1],"injection":[2],"attacks":[3],"induce":[4],"transient":[5,10,26,75,97],"faults":[6,27,76,105],"by":[7,29,77],"locally":[8],"generating":[9],"currents":[11],"capable":[12],"of":[13,18,39,65,73,104],"temporarily":[14],"flip":[15],"the":[16,37,40,63,66,71,102],"outputs":[17],"several":[19,32],"gates.":[20],"Many":[21],"models":[22],"used":[23],"to":[24,34,94],"simulate":[25],"induced":[28,67],"laser":[30,41],"consider":[31],"elements":[33],"better":[35],"represent":[36],"effects":[38,115],"on":[42,70,106],"ICs.":[43],"However,":[44],"a":[45,100,107],"laser-induced":[46,74,87],"current":[47],"between":[48],"VDD":[49],"and":[50],"GND,":[51],"which":[52],"provokes":[53],"significant":[54],"IR":[55,68,79,88,113],"drops,":[56],"has":[57],"been":[58],"neglected.":[59],"This":[60],"paper":[61],"highlights":[62],"importance":[64],"drops":[69,89],"modeling":[72],"using":[78],"drop":[80,114],"CAD":[81],"tools.":[82],"It":[83],"also":[84],"shows":[85],"that":[86],"can":[90],"be":[91],"sufficiently":[92],"strong":[93],"produce":[95],"alone":[96],"faults.":[98],"As":[99],"result,":[101],"number":[103],"case-study":[108],"circuit":[109],"is":[110],"accentuated":[111],"whether":[112],"are":[116],"taken":[117],"into":[118],"account.":[119]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}