{"id":"https://openalex.org/W2483070682","doi":"https://doi.org/10.1109/smacd.2016.7520720","title":"Semi-empirical aging model development via accelerated aging test","display_name":"Semi-empirical aging model development via accelerated aging test","publication_year":2016,"publication_date":"2016-06-01","ids":{"openalex":"https://openalex.org/W2483070682","doi":"https://doi.org/10.1109/smacd.2016.7520720","mag":"2483070682"},"language":"en","primary_location":{"id":"doi:10.1109/smacd.2016.7520720","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd.2016.7520720","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048055344","display_name":"Eng\u00edn Afacan","orcid":"https://orcid.org/0000-0002-1581-3894"},"institutions":[{"id":"https://openalex.org/I4405392","display_name":"Bo\u011fazi\u00e7i University","ror":"https://ror.org/03z9tma90","country_code":"TR","type":"education","lineage":["https://openalex.org/I4405392"]}],"countries":["TR"],"is_corresponding":true,"raw_author_name":"Engin Afacan","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Bogazici University"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Bogazici University","institution_ids":["https://openalex.org/I4405392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052669741","display_name":"G\u00fcnhan D\u00fcndar","orcid":"https://orcid.org/0000-0003-2044-2706"},"institutions":[{"id":"https://openalex.org/I4405392","display_name":"Bo\u011fazi\u00e7i University","ror":"https://ror.org/03z9tma90","country_code":"TR","type":"education","lineage":["https://openalex.org/I4405392"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Gunhan Dundar","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Bogazici University"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Bogazici University","institution_ids":["https://openalex.org/I4405392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059780057","display_name":"Al\u00ed Emre Pusane","orcid":"https://orcid.org/0000-0002-8412-6684"},"institutions":[{"id":"https://openalex.org/I4405392","display_name":"Bo\u011fazi\u00e7i University","ror":"https://ror.org/03z9tma90","country_code":"TR","type":"education","lineage":["https://openalex.org/I4405392"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Ali E. Pusane","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Bogazici University"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Bogazici University","institution_ids":["https://openalex.org/I4405392"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041703213","display_name":"Fa\u00edk Ba\u015fkaya","orcid":"https://orcid.org/0000-0001-6743-3992"},"institutions":[{"id":"https://openalex.org/I4405392","display_name":"Bo\u011fazi\u00e7i University","ror":"https://ror.org/03z9tma90","country_code":"TR","type":"education","lineage":["https://openalex.org/I4405392"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Faik Baskaya","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Bogazici University"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Bogazici University","institution_ids":["https://openalex.org/I4405392"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5048055344"],"corresponding_institution_ids":["https://openalex.org/I4405392"],"apc_list":null,"apc_paid":null,"fwci":0.5586,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.70956188,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6233770847320557},{"id":"https://openalex.org/keywords/empirical-research","display_name":"Empirical research","score":0.5500609874725342},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5492364168167114},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.532267689704895},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5041743516921997},{"id":"https://openalex.org/keywords/accelerated-aging","display_name":"Accelerated aging","score":0.49006330966949463},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.44459137320518494},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4349724054336548},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4105411767959595},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18082812428474426},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10378193855285645},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08285504579544067}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6233770847320557},{"id":"https://openalex.org/C120936955","wikidata":"https://www.wikidata.org/wiki/Q2155640","display_name":"Empirical research","level":2,"score":0.5500609874725342},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5492364168167114},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.532267689704895},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5041743516921997},{"id":"https://openalex.org/C118820876","wikidata":"https://www.wikidata.org/wiki/Q4672283","display_name":"Accelerated aging","level":2,"score":0.49006330966949463},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.44459137320518494},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4349724054336548},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4105411767959595},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18082812428474426},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10378193855285645},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08285504579544067},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/smacd.2016.7520720","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd.2016.7520720","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","raw_type":"proceedings-article"},{"id":"pmh:5848def3-bf4d-4abe-b91f-a03a20ad7ebe","is_oa":false,"landing_page_url":"https://avesis.kocaeli.edu.tr/publication/details/5848def3-bf4d-4abe-b91f-a03a20ad7ebe/oai","pdf_url":null,"source":{"id":"https://openalex.org/S7407055291","display_name":"Kocaeli \u00dcniversitesi - AVES\u0130S","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.47999998927116394}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2012639686","https://openalex.org/W2026891388","https://openalex.org/W2064654398","https://openalex.org/W2102352834","https://openalex.org/W2123693687","https://openalex.org/W2141565132","https://openalex.org/W2144085963","https://openalex.org/W2144178021","https://openalex.org/W2166005805"],"related_works":["https://openalex.org/W906988849","https://openalex.org/W141820298","https://openalex.org/W2049584446","https://openalex.org/W2145182585","https://openalex.org/W2079781215","https://openalex.org/W4378770497","https://openalex.org/W4308245303","https://openalex.org/W2014033564","https://openalex.org/W2910573937","https://openalex.org/W4385571583"],"abstract_inverted_index":{"Modelling":[0],"of":[1,17],"the":[2,10,15,18,29,38,59,64,67,81,97],"degradation":[3,39],"mechanisms":[4],"has":[5],"a":[6,90],"crucial":[7],"role":[8],"during":[9,28,37,58],"aging":[11,30,76],"analysis,":[12],"which":[13,83],"determines":[14],"accuracy":[16],"lifetime":[19],"estimation.":[20],"Conventionally,":[21],"analytical":[22],"and":[23,41,56],"semi-empirical":[24,70,98],"models":[25,33,71],"are":[26,72],"utilized":[27],"analysis.":[31],"Analytical":[32],"employ":[34],"deterministic":[35],"equations":[36],"calculation":[40],"they":[42],"can":[43],"be":[44],"scaled":[45],"for":[46,89],"different":[47],"technology":[48],"nodes;":[49],"hence":[50],"providing":[51],"flexibility.":[52],"However,":[53],"scaling":[54],"errors":[55],"approximations":[57],"model":[60],"development":[61],"may":[62],"degrade":[63],"accuracy.":[65],"On":[66],"other":[68],"hand,":[69],"generated":[73],"via":[74],"accelerated":[75],"test":[77,102],"(AAT)":[78],"performed":[79],"on":[80],"silicon,":[82],"often":[84],"promise":[85],"more":[86],"reliable":[87],"results":[88],"given":[91],"technology.":[92],"This":[93],"paper":[94],"comprehensively":[95],"examines":[96],"modelling":[99],"process":[100],"from":[101],"chip":[103],"design":[104],"to":[105],"AAT":[106],"experiments.":[107]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2026-03-07T16:01:11.037858","created_date":"2025-10-10T00:00:00"}