{"id":"https://openalex.org/W2479327096","doi":"https://doi.org/10.1109/smacd.2016.7520646","title":"Reliable design methodology: The combined effect of radiation, variability and temperature","display_name":"Reliable design methodology: The combined effect of radiation, variability and temperature","publication_year":2016,"publication_date":"2016-06-01","ids":{"openalex":"https://openalex.org/W2479327096","doi":"https://doi.org/10.1109/smacd.2016.7520646","mag":"2479327096"},"language":"en","primary_location":{"id":"doi:10.1109/smacd.2016.7520646","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd.2016.7520646","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058982282","display_name":"Fernando Gar\u0107\u0131a-Redondo","orcid":"https://orcid.org/0000-0001-7090-8821"},"institutions":[{"id":"https://openalex.org/I4210123171","display_name":"Museum of Decorative Arts in Prague","ror":"https://ror.org/02y7mzf89","country_code":"CZ","type":"archive","lineage":["https://openalex.org/I4210123171"]}],"countries":["CZ"],"is_corresponding":true,"raw_author_name":"Fernando Garcia-Redondo","raw_affiliation_strings":["Department of Electronic Engineering, UPM"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, UPM","institution_ids":["https://openalex.org/I4210123171"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045572211","display_name":"Marisa L\u00f3pez\u2010Vallejo","orcid":"https://orcid.org/0000-0002-3833-524X"},"institutions":[{"id":"https://openalex.org/I4210123171","display_name":"Museum of Decorative Arts in Prague","ror":"https://ror.org/02y7mzf89","country_code":"CZ","type":"archive","lineage":["https://openalex.org/I4210123171"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Marisa Lopez-Vallejo","raw_affiliation_strings":["Department of Electronic Engineering, UPM"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, UPM","institution_ids":["https://openalex.org/I4210123171"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010345808","display_name":"Hern\u00e1n Aparicio","orcid":"https://orcid.org/0000-0002-4076-7359"},"institutions":[{"id":"https://openalex.org/I88060688","display_name":"Universidad Polit\u00e9cnica de Madrid","ror":"https://ror.org/03n6nwv02","country_code":"ES","type":"education","lineage":["https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Hernan Aparicio","raw_affiliation_strings":["Department of Electronic Engineering, Technical University of Madrid, UPM"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Technical University of Madrid, UPM","institution_ids":["https://openalex.org/I88060688"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068231777","display_name":"Pablo Ituero","orcid":"https://orcid.org/0000-0001-6448-7936"},"institutions":[{"id":"https://openalex.org/I4210123171","display_name":"Museum of Decorative Arts in Prague","ror":"https://ror.org/02y7mzf89","country_code":"CZ","type":"archive","lineage":["https://openalex.org/I4210123171"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Pablo Ituero","raw_affiliation_strings":["Department of Electronic Engineering, UPM"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, UPM","institution_ids":["https://openalex.org/I4210123171"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5058982282"],"corresponding_institution_ids":["https://openalex.org/I4210123171"],"apc_list":null,"apc_paid":null,"fwci":0.3675,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.65061522,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"62","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.7242591381072998},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.689932107925415},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6531811356544495},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.6272698640823364},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5731486082077026},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5542410016059875},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.48501846194267273},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4558776915073395},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20251062512397766},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1989971399307251},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.14482632279396057}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.7242591381072998},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.689932107925415},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6531811356544495},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.6272698640823364},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5731486082077026},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5542410016059875},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.48501846194267273},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4558776915073395},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20251062512397766},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1989971399307251},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.14482632279396057},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/smacd.2016.7520646","is_oa":false,"landing_page_url":"https://doi.org/10.1109/smacd.2016.7520646","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W364841832","https://openalex.org/W1593408479","https://openalex.org/W1967165975","https://openalex.org/W1975904133","https://openalex.org/W2016926482","https://openalex.org/W2048751700","https://openalex.org/W2062623691","https://openalex.org/W2066960937","https://openalex.org/W2106229607","https://openalex.org/W2115516668","https://openalex.org/W2152470721","https://openalex.org/W2539660222","https://openalex.org/W3147044877","https://openalex.org/W4229741704","https://openalex.org/W6635377956","https://openalex.org/W6654520830"],"related_works":["https://openalex.org/W2796521923","https://openalex.org/W95651076","https://openalex.org/W2770163697","https://openalex.org/W2110521006","https://openalex.org/W2543864226","https://openalex.org/W1975778413","https://openalex.org/W143583198","https://openalex.org/W2386329201","https://openalex.org/W2081199158","https://openalex.org/W4206112934"],"abstract_inverted_index":{"The":[0],"effects":[1,22],"caused":[2],"by":[3],"variability,":[4],"temperature,":[5],"radiation":[6,65],"or":[7,101],"aging":[8],"may":[9],"compromise":[10],"the":[11,25,49,83,87,106],"reliability":[12,94],"of":[13,52,63],"electronic":[14],"circuits.":[15,80],"Circuits":[16],"designers":[17],"must":[18],"consider":[19],"their":[20],"combined":[21],"early":[23],"during":[24],"design":[26,51],"cycle,":[27],"even":[28],"though":[29],"it":[30],"is":[31,89],"a":[32,43,60],"time":[33],"and":[34,45,66,78],"effort":[35],"demanding":[36],"task.":[37],"In":[38],"this":[39],"work":[40],"we":[41],"present":[42],"methodology":[44],"simulation":[46,111],"framework":[47],"for":[48,75],"reliable":[50],"circuits":[53],"working":[54],"under":[55],"realistic":[56],"conditions":[57],"such":[58,96],"as":[59,97],"wide":[61],"range":[62],"temperatures,":[64],"process":[67],"variations.":[68],"This":[69],"proposal":[70],"provides":[71],"an":[72],"alternative":[73],"method":[74],"validating":[76],"digital":[77],"analog":[79],"Depending":[81],"on":[82],"analyzed":[84],"circuit":[85,107],"functionality,":[86],"user":[88],"able":[90],"to":[91,104],"define":[92],"complex":[93],"metrics":[95],"signal":[98],"upsets,":[99],"delays":[100],"frequency":[102],"deviations":[103],"measure":[105],"response":[108],"in":[109],"affordable":[110],"time.":[112]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}