{"id":"https://openalex.org/W4404954146","doi":"https://doi.org/10.1109/sies62473.2024.10768079","title":"A Lightweight Model Solution for Aluminum Material Defect Detection at the Edge","display_name":"A Lightweight Model Solution for Aluminum Material Defect Detection at the Edge","publication_year":2024,"publication_date":"2024-10-23","ids":{"openalex":"https://openalex.org/W4404954146","doi":"https://doi.org/10.1109/sies62473.2024.10768079"},"language":"en","primary_location":{"id":"doi:10.1109/sies62473.2024.10768079","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sies62473.2024.10768079","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 14th International Symposium on Industrial Embedded Systems (SIES)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000258640","display_name":"Chen Zheng-zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhengzhou Chen","raw_affiliation_strings":["East China Normal University,Shanghai,China"],"affiliations":[{"raw_affiliation_string":"East China Normal University,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040187861","display_name":"Jinhao Liang","orcid":"https://orcid.org/0000-0003-3799-0346"},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinhao Liang","raw_affiliation_strings":["(East China Normal University),National Trusted, Embedded Software Engineering Technology Research Center,Shanghai,China"],"affiliations":[{"raw_affiliation_string":"(East China Normal University),National Trusted, Embedded Software Engineering Technology Research Center,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101993716","display_name":"Yueling Zhang","orcid":"https://orcid.org/0000-0002-5290-5691"},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yueling Zhang","raw_affiliation_strings":["East China Normal University,Shanghai,China"],"affiliations":[{"raw_affiliation_string":"East China Normal University,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100682896","display_name":"Jiangtao Wang","orcid":"https://orcid.org/0000-0002-8704-502X"},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangtao Wang","raw_affiliation_strings":["(East China Normal University),National Trusted, Embedded Software Engineering Technology Research Center,Shanghai,China"],"affiliations":[{"raw_affiliation_string":"(East China Normal University),National Trusted, Embedded Software Engineering Technology Research Center,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101455554","display_name":"Qing Zhang","orcid":"https://orcid.org/0000-0002-8567-0067"},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qing Zhang","raw_affiliation_strings":["(East China Normal University),National Trusted, Embedded Software Engineering Technology Research Center,Shanghai,China"],"affiliations":[{"raw_affiliation_string":"(East China Normal University),National Trusted, Embedded Software Engineering Technology Research Center,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035319364","display_name":"Gang Xu","orcid":"https://orcid.org/0000-0002-3721-9597"},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gang Xu","raw_affiliation_strings":["(East China Normal University),National Trusted, Embedded Software Engineering Technology Research Center,Shanghai,China"],"affiliations":[{"raw_affiliation_string":"(East China Normal University),National Trusted, Embedded Software Engineering Technology Research Center,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5000258640"],"corresponding_institution_ids":["https://openalex.org/I66867065"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.30775948,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"164","last_page":"171"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9225999712944031,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5492427945137024},{"id":"https://openalex.org/keywords/aluminium","display_name":"Aluminium","score":0.5446355938911438},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4967654347419739},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.48423218727111816},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.2673024535179138},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13883227109909058}],"concepts":[{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5492427945137024},{"id":"https://openalex.org/C513153333","wikidata":"https://www.wikidata.org/wiki/Q663","display_name":"Aluminium","level":2,"score":0.5446355938911438},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4967654347419739},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.48423218727111816},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.2673024535179138},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13883227109909058}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sies62473.2024.10768079","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sies62473.2024.10768079","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 14th International Symposium on Industrial Embedded Systems (SIES)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1536680647","https://openalex.org/W2102605133","https://openalex.org/W2109255472","https://openalex.org/W2193145675","https://openalex.org/W2233116163","https://openalex.org/W2407386500","https://openalex.org/W2956119553","https://openalex.org/W2963037989","https://openalex.org/W2963363373","https://openalex.org/W2963809228","https://openalex.org/W2963906675","https://openalex.org/W2964905537","https://openalex.org/W2991907795","https://openalex.org/W2992308087","https://openalex.org/W3164104137","https://openalex.org/W3171165618","https://openalex.org/W3195969653","https://openalex.org/W4307068480","https://openalex.org/W6637709462","https://openalex.org/W6639703010","https://openalex.org/W6726275242","https://openalex.org/W6745148473","https://openalex.org/W6745722055","https://openalex.org/W6750227808","https://openalex.org/W6777046832","https://openalex.org/W6810974023"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2016187641","https://openalex.org/W4404725684","https://openalex.org/W2805339068","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W2898370298","https://openalex.org/W2137437058"],"abstract_inverted_index":{"Defect":[0],"detection":[1,19],"models":[2],"have":[3,21,91],"been":[4],"widely":[5],"applied":[6],"in":[7,12],"industrial":[8,98],"edge":[9],"platform.":[10],"However,":[11],"the":[13,34,58,69,101,112],"field":[14],"of":[15,27,71,114],"aluminum":[16,28,53],"material":[17,29,54],"defect":[18,30,55],"still":[20],"some":[22],"challenges:":[23],"(i)":[24],"limited":[25],"availability":[26],"datasets":[31],"and":[32,80,87,104],"(ii)":[33],"high":[35],"computational":[36],"cost":[37],"associated":[38],"with":[39],"large-scale":[40],"models.":[41],"To":[42],"address":[43],"these":[44],"challenges,":[45],"we":[46,61,74],"propose":[47,62],"a":[48],"novel":[49],"lightweight":[50],"model":[51,76,81,88],"for":[52],"detection.":[56],"For":[57],"first":[59],"challenge,":[60],"Positive":[63],"Sample":[64],"Augmentation(PSA)":[65],"to":[66,83],"effectively":[67],"increase":[68],"number":[70],"samples.":[72],"Additionally,":[73],"employ":[75],"pruning,":[77],"knowledge":[78],"distillation":[79],"quantization":[82],"reduce":[84,105],"inference":[85],"latency":[86],"size.":[89],"We":[90],"successfully":[92],"deployed":[93],"this":[94],"solution":[95],"on":[96],"real-world":[97],"platforms,":[99],"double":[100],"running":[102],"speed":[103],"approximately":[106],"75%":[107],"hardware":[108],"costs,":[109],"thereby":[110],"validating":[111],"feasibility":[113],"our":[115],"approach.":[116]},"counts_by_year":[],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}