{"id":"https://openalex.org/W2066773388","doi":"https://doi.org/10.1109/sies.2007.4297337","title":"Applying Model Checking to an Automotive Microcontroller Application","display_name":"Applying Model Checking to an Automotive Microcontroller Application","publication_year":2007,"publication_date":"2007-07-01","ids":{"openalex":"https://openalex.org/W2066773388","doi":"https://doi.org/10.1109/sies.2007.4297337","mag":"2066773388"},"language":"en","primary_location":{"id":"doi:10.1109/sies.2007.4297337","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sies.2007.4297337","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 International Symposium on Industrial Embedded Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072429798","display_name":"Bastian Schlich","orcid":null},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Bastian Schlich","raw_affiliation_strings":["Embedded Software Laboratory, RWTH Aachen University, Aachen, Germany","RWTH Aachen University, Aachen;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Embedded Software Laboratory, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]},{"raw_affiliation_string":"RWTH Aachen University, Aachen;","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043792809","display_name":"Falk Salewski","orcid":null},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Falk Salewski","raw_affiliation_strings":["Embedded Software Laboratory, RWTH Aachen University, Aachen, Germany","RWTH Aachen University, Aachen;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Embedded Software Laboratory, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]},{"raw_affiliation_string":"RWTH Aachen University, Aachen;","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019982470","display_name":"Stefan Kowalewski","orcid":"https://orcid.org/0000-0001-9397-2009"},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stefan Kowalewski","raw_affiliation_strings":["Embedded Software Laboratory, RWTH Aachen University, Aachen, Germany","RWTH Aachen University, Aachen;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Embedded Software Laboratory, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]},{"raw_affiliation_string":"RWTH Aachen University, Aachen;","institution_ids":["https://openalex.org/I887968799"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.8638,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.95084072,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"3440","issue":null,"first_page":"209","last_page":"216"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.7814524173736572},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7707171440124512},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.7138177156448364},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5765976309776306},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5406590700149536},{"id":"https://openalex.org/keywords/model-checking","display_name":"Model checking","score":0.540481686592102},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5278608202934265},{"id":"https://openalex.org/keywords/embedded-software","display_name":"Embedded software","score":0.4998352527618408},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.435314416885376},{"id":"https://openalex.org/keywords/code","display_name":"Code (set theory)","score":0.42534366250038147},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.35433948040008545},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.3429907262325287},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.312151700258255},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.12877240777015686},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11777099967002869}],"concepts":[{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.7814524173736572},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7707171440124512},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.7138177156448364},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5765976309776306},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5406590700149536},{"id":"https://openalex.org/C110251889","wikidata":"https://www.wikidata.org/wiki/Q1569697","display_name":"Model checking","level":2,"score":0.540481686592102},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5278608202934265},{"id":"https://openalex.org/C154488198","wikidata":"https://www.wikidata.org/wiki/Q1335007","display_name":"Embedded software","level":3,"score":0.4998352527618408},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.435314416885376},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.42534366250038147},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.35433948040008545},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.3429907262325287},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.312151700258255},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.12877240777015686},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11777099967002869},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/sies.2007.4297337","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sies.2007.4297337","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 International Symposium on Industrial Embedded Systems","raw_type":"proceedings-article"},{"id":"pmh:oai:publications.rwth-aachen.de:117071","is_oa":false,"landing_page_url":"https://publications.rwth-aachen.de/record/117071","pdf_url":null,"source":{"id":"https://openalex.org/S4306401362","display_name":"RWTH Publications (RWTH Aachen)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I887968799","host_organization_name":"RWTH Aachen University","host_organization_lineage":["https://openalex.org/I887968799"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2007 International Symposium on Industrial Embedded Systems : Costa da Caparica, [Lisbon], Portugal, 4 - 6 July 2007 ; [SIES'2007] / IEEE / IEEE Computer Society Press<br/>International Symposium on Industrial Embedded Systems, SIES' 2007, Costa da Caparica, Portugal, 2007-07-04 - 2007-07-06","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1557059153","https://openalex.org/W1568105243","https://openalex.org/W1581604070","https://openalex.org/W1813719546","https://openalex.org/W2037416037","https://openalex.org/W2056556272","https://openalex.org/W2088855835","https://openalex.org/W2126301692","https://openalex.org/W2145000217","https://openalex.org/W2146924294","https://openalex.org/W2151721315","https://openalex.org/W2165614474","https://openalex.org/W2340735175","https://openalex.org/W2951534983","https://openalex.org/W3090662866","https://openalex.org/W3126957415","https://openalex.org/W4254718585","https://openalex.org/W6633414551","https://openalex.org/W6672767243","https://openalex.org/W6678828286","https://openalex.org/W6684644128","https://openalex.org/W6783478782","https://openalex.org/W6789986635"],"related_works":["https://openalex.org/W4316095964","https://openalex.org/W2383001583","https://openalex.org/W2771395446","https://openalex.org/W2131084560","https://openalex.org/W3112038843","https://openalex.org/W2088310429","https://openalex.org/W3094215878","https://openalex.org/W3209836052","https://openalex.org/W1605551782","https://openalex.org/W2740682747"],"abstract_inverted_index":{"Microcontrollers":[0],"in":[1,100,110,122],"automotive":[2,82],"applications":[3],"perform":[4],"more":[5,7,152],"and":[6,20],"safety":[8],"critical":[9],"functions.":[10],"The":[11,68,94],"reliability":[12],"of":[13,17,33,70,107],"these":[14,113],"systems":[15],"is":[16,23],"great":[18],"importance":[19],"model":[21,44,76,108],"checking":[22,109],"seen":[24],"as":[25],"a":[26,59,85,101],"promising":[27],"future":[28,148],"tool":[29],"for":[30,46,147],"the":[31,34,105],"analysis":[32],"corresponding":[35],"software.":[36,125],"For":[37],"this":[38,71],"purpose":[39],"an":[40,81],"explicit,":[41],"on-the-fly":[42],"CTL":[43],"checker":[45],"assembly":[47],"code":[48],"called":[49],"[mc]square":[50],"was":[51,63,74],"developed":[52],"at":[53],"our":[54],"institute.":[55],"This":[56,126],"paper":[57],"describes":[58],"case":[60,72,127],"study":[61,73,128],"that":[62,79,130],"conducted":[64],"using":[65],"[mc]":[66],"square.":[67],"aim":[69],"to":[75,150],"check":[77],"programs":[78,95,114,136,154],"solve":[80],"problem,":[83],"namely":[84],"four":[86],"channel":[87],"speed":[88],"measurement":[89],"with":[90,142],"CAN":[91],"bus":[92],"interface.":[93],"were":[96],"written":[97],"by":[98],"students":[99],"lab":[102],"course":[103],"without":[104,140],"application":[106],"mind.":[111],"Hence,":[112],"contain":[115],"all":[116],"features":[117],"which":[118],"can":[119,137],"be":[120,138],"found":[121],"real":[123],"world":[124],"showed":[129],"small":[131],"or":[132],"medium":[133],"sized":[134],"microcontroller":[135],"verified":[139],"respectively":[141],"minor":[143],"modifications.":[144],"Additional":[145],"potentials":[146],"improvements":[149],"handle":[151],"complex":[153],"have":[155],"been":[156],"identified.":[157]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}