{"id":"https://openalex.org/W2153363805","doi":"https://doi.org/10.1109/sies.2007.4297319","title":"Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems","display_name":"Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems","publication_year":2007,"publication_date":"2007-07-01","ids":{"openalex":"https://openalex.org/W2153363805","doi":"https://doi.org/10.1109/sies.2007.4297319","mag":"2153363805"},"language":"en","primary_location":{"id":"doi:10.1109/sies.2007.4297319","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sies.2007.4297319","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 International Symposium on Industrial Embedded Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034460368","display_name":"Gert Jervan","orcid":"https://orcid.org/0000-0003-2237-0187"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":true,"raw_author_name":"Gert Jervan","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056687934","display_name":"Helena Kruus","orcid":null},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Helena Kruus","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052820399","display_name":"E. Orasson","orcid":null},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Elmet Orasson","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010536057","display_name":"Raimund Ubar","orcid":"https://orcid.org/0000-0001-8186-4385"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Raimund Ubar","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5034460368"],"corresponding_institution_ids":["https://openalex.org/I111112146"],"apc_list":null,"apc_paid":null,"fwci":0.3167,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.65274878,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"9","issue":null,"first_page":"71","last_page":"77"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.8003835082054138},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6849791407585144},{"id":"https://openalex.org/keywords/pseudorandom-number-generator","display_name":"Pseudorandom number generator","score":0.6639562845230103},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6415796279907227},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.613239049911499},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.600109875202179},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.5180066227912903},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4894494116306305},{"id":"https://openalex.org/keywords/core","display_name":"Core (optical fiber)","score":0.43406158685684204},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3857671022415161},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3417249321937561},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17347452044487},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10538724064826965},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.09475788474082947}],"concepts":[{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.8003835082054138},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6849791407585144},{"id":"https://openalex.org/C140642157","wikidata":"https://www.wikidata.org/wiki/Q1623338","display_name":"Pseudorandom number generator","level":2,"score":0.6639562845230103},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6415796279907227},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.613239049911499},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.600109875202179},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.5180066227912903},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4894494116306305},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.43406158685684204},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3857671022415161},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3417249321937561},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17347452044487},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10538724064826965},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.09475788474082947},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sies.2007.4297319","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sies.2007.4297319","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 International Symposium on Industrial Embedded Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1503570386","https://openalex.org/W2022078312","https://openalex.org/W2046314918","https://openalex.org/W2063435983","https://openalex.org/W2097162292","https://openalex.org/W2104918553","https://openalex.org/W2108500347","https://openalex.org/W2115542812","https://openalex.org/W2144033909","https://openalex.org/W2151094122","https://openalex.org/W2152520168","https://openalex.org/W2156368823","https://openalex.org/W2171695647","https://openalex.org/W2171834616","https://openalex.org/W2503952136","https://openalex.org/W2536854812","https://openalex.org/W4297159816","https://openalex.org/W6681008240","https://openalex.org/W6843276737"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W4285708951","https://openalex.org/W2021253405","https://openalex.org/W1991935474","https://openalex.org/W2323083271","https://openalex.org/W2091533492","https://openalex.org/W2570882127","https://openalex.org/W2543176856","https://openalex.org/W2154529098"],"abstract_inverted_index":{"This":[0],"paper":[1,62],"describes":[2],"an":[3],"optimization":[4],"technique":[5],"for":[6,10,52,104,148],"finding":[7],"test":[8,22,53,57,79,86,96,112,121,125,130],"solutions":[9,30],"embedded":[11,15],"core-based":[12,150],"systems.":[13,151],"For":[14],"systems":[16],"the":[17,71,90,120,135],"traditional":[18],"external":[19],"tester":[20],"based":[21,41,108],"is":[23,117],"often":[24],"unfeasible":[25],"and":[26,45,56,93,111,144],"therefore":[27],"different":[28],"self-test":[29,36],"are":[31,39,64,81],"sought":[32],"after.":[33],"Classical":[34],"built-in":[35],"(BIST)":[37],"approaches":[38],"largely":[40],"on":[42,66,109],"pseudorandom":[43,78],"testing,":[44],"using":[46],"linear":[47],"feedback":[48],"shift":[49],"registers":[50],"(LFSR)":[51],"set":[54,113],"generation":[55],"response":[58],"compaction.":[59,114],"In":[60],"this":[61],"we":[63],"concentrating":[65],"one":[67],"possible":[68],"extension":[69],"of":[70],"classical":[72],"BIST,":[73,76],"namely":[74],"hybrid":[75,105,139],"where":[77],"patterns":[80,87],"complemented":[82],"with":[83,138,157],"precomputed":[84],"deterministic":[85],"to":[88,94,118],"increase":[89],"fault":[91],"coverage":[92],"reduce":[95],"time.":[97],"We":[98,132],"will":[99,133,154],"propose":[100],"a":[101],"novel":[102],"method":[103,137],"BIST":[106,140],"optimization,":[107],"reseeding":[110],"The":[115,152],"objective":[116],"minimize":[119],"time":[122],"at":[123],"given":[124],"memory":[126],"constraints,":[127],"without":[128],"losing":[129],"quality.":[131],"compare":[134],"proposed":[136],"methods":[141],"developed":[142],"earlier":[143],"analyze":[145],"its":[146],"suitability":[147],"testing":[149],"results":[153],"be":[155],"illustrated":[156],"several":[158],"experimental":[159],"results.":[160]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}