{"id":"https://openalex.org/W1532168298","doi":"https://doi.org/10.1109/sew.2003.1270742","title":"Applying fault correction profiles","display_name":"Applying fault correction profiles","publication_year":2004,"publication_date":"2004-07-08","ids":{"openalex":"https://openalex.org/W1532168298","doi":"https://doi.org/10.1109/sew.2003.1270742","mag":"1532168298"},"language":"en","primary_location":{"id":"doi:10.1109/sew.2003.1270742","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sew.2003.1270742","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"28th Annual NASA Goddard Software Engineering Workshop, 2003. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111439385","display_name":"Norman F. Schneidewind","orcid":null},"institutions":[{"id":"https://openalex.org/I35364215","display_name":"Naval Postgraduate School","ror":"https://ror.org/033yfkj90","country_code":"US","type":"education","lineage":["https://openalex.org/I1330347796","https://openalex.org/I3130687028","https://openalex.org/I35364215"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"N.F. Schneidewind","raw_affiliation_strings":["Naval Postgraduate School, USA","Naval Postgraduate School, Monterey, CA, USA"],"affiliations":[{"raw_affiliation_string":"Naval Postgraduate School, USA","institution_ids":["https://openalex.org/I35364215"]},{"raw_affiliation_string":"Naval Postgraduate School, Monterey, CA, USA","institution_ids":["https://openalex.org/I35364215"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5111439385"],"corresponding_institution_ids":["https://openalex.org/I35364215"],"apc_list":null,"apc_paid":null,"fwci":0.767,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.73276136,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"185","last_page":"192"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.987500011920929,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.666038990020752},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6529179811477661},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.647729218006134},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6186915636062622},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.536349892616272},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5323292016983032},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4856516122817993},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4747229814529419},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4669346213340759},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.43041855096817017},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4221286475658417},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.42107492685317993},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.41756927967071533},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.3026157021522522},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21938258409500122},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12767350673675537},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.1275014877319336}],"concepts":[{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.666038990020752},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6529179811477661},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.647729218006134},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6186915636062622},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.536349892616272},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5323292016983032},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4856516122817993},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4747229814529419},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4669346213340759},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.43041855096817017},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4221286475658417},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.42107492685317993},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.41756927967071533},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.3026157021522522},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21938258409500122},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12767350673675537},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.1275014877319336},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sew.2003.1270742","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sew.2003.1270742","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"28th Annual NASA Goddard Software Engineering Workshop, 2003. Proceedings.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W563896938","https://openalex.org/W1974598514","https://openalex.org/W1996104597","https://openalex.org/W2096138104","https://openalex.org/W2141619592","https://openalex.org/W2164021611","https://openalex.org/W6649145858"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W1986800855","https://openalex.org/W2024194466","https://openalex.org/W3148663848","https://openalex.org/W2278517150","https://openalex.org/W4256030018","https://openalex.org/W3150960233","https://openalex.org/W2355966237","https://openalex.org/W2742111403","https://openalex.org/W2032374522"],"abstract_inverted_index":{"In":[0],"general,":[1],"software":[2,54],"reliability":[3,55,182],"models":[4],"have":[5,16],"focused":[6],"on":[7],"modeling":[8,22],"and":[9,15,93,140,158,172],"predicting":[10],"the":[11,23,33,41,59,88,103,108,116,122,133,141,149,164],"failure":[12,80],"detection":[13,81],"process":[14,36,44,91,138,157,167,176],"not":[17],"given":[18],"equal":[19],"priority":[20],"to":[21,31,39,52,102,148,179],"fault":[24,34,63,73,84,98,104,110,117,124,136,155],"correction":[25,35,64,74,85,99,105,111,118,125,137,156],"process.":[26],"However,":[27],"it":[28],"is":[29,107],"important":[30],"address":[32],"in":[37,48,175],"order":[38],"identify":[40],"need":[42,89,165],"for":[43,90,96,166],"improvements.":[45],"Process":[46],"improvements,":[47],"turn,":[49],"will":[50],"contribute":[51,178],"achieving":[53],"goals.":[56,183],"We":[57],"introduce":[58],"concept":[60,134],"of":[61,69,79,135,143],"a":[62,67,77],"profile":[65,86,106,114,126],"-":[66],"set":[68],"functions":[70],"that":[71,163,173],"predict":[72],"events":[75],"as":[76],"function":[78],"events.":[82],"The":[83],"identifies":[87],"improvements":[92,174],"provides":[94],"information":[95],"developing":[97],"strategies.":[100],"Related":[101],"goal":[109,119],"profile.":[112],"This":[113,130],"represents":[115],"against":[120],"which":[121],"achieved":[123],"can":[127,169],"be":[128,170],"compared.":[129],"comparison":[131],"motivates":[132],"instability,":[139],"attributes":[142],"instability.":[144],"Applying":[145],"these":[146],"concepts":[147],"NASA":[150],"Goddard":[151],"Space":[152],"Flight":[153],"Center":[154],"its":[159],"data,":[160],"we":[161],"demonstrate":[162],"improvement":[168],"identified,":[171],"would":[177],"meeting":[180],"product":[181]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}