{"id":"https://openalex.org/W7165902084","doi":"https://doi.org/10.1109/sensys-adjunct71932.2026.00071","title":"Poster: EIT Reconstruction with Physics-Consistent Unrolled Learning","display_name":"Poster: EIT Reconstruction with Physics-Consistent Unrolled Learning","publication_year":2026,"publication_date":"2026-05-12","ids":{"openalex":"https://openalex.org/W7165902084","doi":"https://doi.org/10.1109/sensys-adjunct71932.2026.00071"},"language":null,"primary_location":{"id":"doi:10.1109/sensys-adjunct71932.2026.00071","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensys-adjunct71932.2026.00071","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 ACM/IEEE International Conference on Embedded Artificial Intelligence and Sensing Systems - Posters and Demos (SenSys-Adjunct)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009070681","display_name":"Dariusz Majerek","orcid":"https://orcid.org/0000-0002-0035-7187"},"institutions":[{"id":"https://openalex.org/I8264552","display_name":"Lublin University of Technology","ror":"https://ror.org/024zjzd49","country_code":"PL","type":"education","lineage":["https://openalex.org/I8264552"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Dariusz Majerek","raw_affiliation_strings":["Lublin University of Technology,Lublin,Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lublin University of Technology,Lublin,Poland","institution_ids":["https://openalex.org/I8264552"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5139381387","display_name":"Dariusz W\u00f3jcik","orcid":null},"institutions":[{"id":"https://openalex.org/I8264552","display_name":"Lublin University of Technology","ror":"https://ror.org/024zjzd49","country_code":"PL","type":"education","lineage":["https://openalex.org/I8264552"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Dariusz W\u00f3jcik","raw_affiliation_strings":["Lublin University of Technology,Lublin,Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lublin University of Technology,Lublin,Poland","institution_ids":["https://openalex.org/I8264552"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107937922","display_name":"Tomasz Rymarczyk","orcid":null},"institutions":[{"id":"https://openalex.org/I2799788900","display_name":"University of Economics and Innovation","ror":"https://ror.org/012a85e51","country_code":"PL","type":"education","lineage":["https://openalex.org/I2799788900"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Tomasz Rymarczyk","raw_affiliation_strings":["Netrix S.A., WSEI University,Lublin,Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Netrix S.A., WSEI University,Lublin,Poland","institution_ids":["https://openalex.org/I2799788900"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070211011","display_name":"Pawe\u0142 Olszewski","orcid":"https://orcid.org/0000-0002-1015-1190"},"institutions":[{"id":"https://openalex.org/I2799788900","display_name":"University of Economics and Innovation","ror":"https://ror.org/012a85e51","country_code":"PL","type":"education","lineage":["https://openalex.org/I2799788900"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Pawe\u0142 Olszewski","raw_affiliation_strings":["Netrix S.A., WSEI University,Lublin,Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Netrix S.A., WSEI University,Lublin,Poland","institution_ids":["https://openalex.org/I2799788900"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"123","last_page":"124"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.7085999846458435,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.7085999846458435,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.04619999974966049,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.045899998396635056,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.28769999742507935},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.28290000557899475},{"id":"https://openalex.org/keywords/inverse-problem","display_name":"Inverse problem","score":0.25},{"id":"https://openalex.org/keywords/calculus","display_name":"Calculus (dental)","score":0.22509999573230743}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42579999566078186},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.38749998807907104},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3700000047683716},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3463999927043915},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.31369999051094055},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.28769999742507935},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.28290000557899475},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.25},{"id":"https://openalex.org/C2777686260","wikidata":"https://www.wikidata.org/wiki/Q144037","display_name":"Calculus (dental)","level":2,"score":0.22509999573230743},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.22339999675750732}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sensys-adjunct71932.2026.00071","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensys-adjunct71932.2026.00071","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 ACM/IEEE International Conference on Embedded Artificial Intelligence and Sensing Systems - Posters and Demos (SenSys-Adjunct)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W4388517256"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2026-06-26T00:00:00"}