{"id":"https://openalex.org/W4389077243","doi":"https://doi.org/10.1109/sensors56945.2023.10325198","title":"DipSAR: Deep Image Prior for Sparse Sampled Near-Field SAR Millimeter-Wave Imaging","display_name":"DipSAR: Deep Image Prior for Sparse Sampled Near-Field SAR Millimeter-Wave Imaging","publication_year":2023,"publication_date":"2023-10-29","ids":{"openalex":"https://openalex.org/W4389077243","doi":"https://doi.org/10.1109/sensors56945.2023.10325198"},"language":"en","primary_location":{"id":"doi:10.1109/sensors56945.2023.10325198","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensors56945.2023.10325198","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE SENSORS","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://repository.tudelft.nl/file/File_b40945a3-57c7-4dbe-9244-7620951cf5af","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049895472","display_name":"Rawin Assabumrungrat","orcid":"https://orcid.org/0000-0003-3391-4063"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Rawin Assabumrungrat","raw_affiliation_strings":["School of Engineering, Tohoku University,Japan","School of Engineering, Tohoku University, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, Tohoku University,Japan","institution_ids":["https://openalex.org/I201537933"]},{"raw_affiliation_string":"School of Engineering, Tohoku University, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109543949","display_name":"Nakorn Kumchaiseemak","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153049","display_name":"Vidyasirimedhi Institute of Science and Technology","ror":"https://ror.org/053jehz60","country_code":"TH","type":"education","lineage":["https://openalex.org/I4210153049"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL","TH"],"is_corresponding":false,"raw_author_name":"Nakorn Kumchaiseemak","raw_affiliation_strings":["School of Information Science and Technology, Vidyasirimedhi Institute of Science and Technology,Thailand","School of Information Science and Technology, Vidyasirimedhi Institute of Science and Technology, Thailand","Department of Microelectronics, MS3 Group, Delft University of Technology, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Science and Technology, Vidyasirimedhi Institute of Science and Technology,Thailand","institution_ids":["https://openalex.org/I4210153049"]},{"raw_affiliation_string":"School of Information Science and Technology, Vidyasirimedhi Institute of Science and Technology, Thailand","institution_ids":["https://openalex.org/I4210153049"]},{"raw_affiliation_string":"Department of Microelectronics, MS3 Group, Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100356269","display_name":"Jianping Wang","orcid":"https://orcid.org/0000-0001-9450-8961"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Jianping Wang","raw_affiliation_strings":["Delft University of Technology,MS3 Group,Department of Microelectronics,The Netherlands","Department of Microelectronics, MS3 Group, Delft University of Technology, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Delft University of Technology,MS3 Group,Department of Microelectronics,The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Department of Microelectronics, MS3 Group, Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056306889","display_name":"Dingyang Wang","orcid":"https://orcid.org/0000-0002-4690-5767"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Dingyang Wang","raw_affiliation_strings":["Delft University of Technology,MS3 Group,Department of Microelectronics,The Netherlands","Department of Microelectronics, MS3 Group, Delft University of Technology, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Delft University of Technology,MS3 Group,Department of Microelectronics,The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Department of Microelectronics, MS3 Group, Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093357855","display_name":"Phoom Punpeng","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Phoom Punpeng","raw_affiliation_strings":["Ruamrudee International School,Thailand","Ruamrudee International School, Thailand"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ruamrudee International School,Thailand","institution_ids":[]},{"raw_affiliation_string":"Ruamrudee International School, Thailand","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007936497","display_name":"Francesco Fioranelli","orcid":"https://orcid.org/0000-0001-8254-8093"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Francesco Fioranelli","raw_affiliation_strings":["Delft University of Technology,MS3 Group,Department of Microelectronics,The Netherlands","Department of Microelectronics, MS3 Group, Delft University of Technology, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Delft University of Technology,MS3 Group,Department of Microelectronics,The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Department of Microelectronics, MS3 Group, Delft University of Technology, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022621021","display_name":"Theerawit Wilaiprasitporn","orcid":"https://orcid.org/0000-0003-4941-4354"},"institutions":[{"id":"https://openalex.org/I4210153049","display_name":"Vidyasirimedhi Institute of Science and Technology","ror":"https://ror.org/053jehz60","country_code":"TH","type":"education","lineage":["https://openalex.org/I4210153049"]}],"countries":["TH"],"is_corresponding":false,"raw_author_name":"Theerawit Wilaiprasitporn","raw_affiliation_strings":["School of Information Science and Technology, Vidyasirimedhi Institute of Science and Technology,Thailand","School of Information Science and Technology, Vidyasirimedhi Institute of Science and Technology, Thailand"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Science and Technology, Vidyasirimedhi Institute of Science and Technology,Thailand","institution_ids":["https://openalex.org/I4210153049"]},{"raw_affiliation_string":"School of Information Science and Technology, Vidyasirimedhi Institute of Science and Technology, Thailand","institution_ids":["https://openalex.org/I4210153049"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3075,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.53554502,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11038","display_name":"Advanced SAR Imaging Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7517715096473694},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.736102819442749},{"id":"https://openalex.org/keywords/synthetic-aperture-radar","display_name":"Synthetic aperture radar","score":0.7146558165550232},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.6307586431503296},{"id":"https://openalex.org/keywords/extremely-high-frequency","display_name":"Extremely high frequency","score":0.6264063119888306},{"id":"https://openalex.org/keywords/radar-imaging","display_name":"Radar imaging","score":0.624603271484375},{"id":"https://openalex.org/keywords/intersection","display_name":"Intersection (aeronautics)","score":0.617642343044281},{"id":"https://openalex.org/keywords/sparse-approximation","display_name":"Sparse approximation","score":0.5326882004737854},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.5234493613243103},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.510064423084259},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.4666338562965393},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.44951581954956055},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.44222575426101685},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.40627846121788025},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11396205425262451},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07458245754241943},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.06652691960334778}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7517715096473694},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.736102819442749},{"id":"https://openalex.org/C87360688","wikidata":"https://www.wikidata.org/wiki/Q740686","display_name":"Synthetic aperture radar","level":2,"score":0.7146558165550232},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.6307586431503296},{"id":"https://openalex.org/C45764600","wikidata":"https://www.wikidata.org/wiki/Q570342","display_name":"Extremely high frequency","level":2,"score":0.6264063119888306},{"id":"https://openalex.org/C10929652","wikidata":"https://www.wikidata.org/wiki/Q7279985","display_name":"Radar imaging","level":3,"score":0.624603271484375},{"id":"https://openalex.org/C64543145","wikidata":"https://www.wikidata.org/wiki/Q162942","display_name":"Intersection (aeronautics)","level":2,"score":0.617642343044281},{"id":"https://openalex.org/C124066611","wikidata":"https://www.wikidata.org/wiki/Q28684319","display_name":"Sparse approximation","level":2,"score":0.5326882004737854},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.5234493613243103},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.510064423084259},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.4666338562965393},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.44951581954956055},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.44222575426101685},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.40627846121788025},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11396205425262451},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07458245754241943},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.06652691960334778},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/sensors56945.2023.10325198","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensors56945.2023.10325198","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE SENSORS","raw_type":"proceedings-article"},{"id":"pmh:oai:tudelft.nl:uuid:ddbb29f4-a052-49f1-8e44-f7d0c5252ea8","is_oa":true,"landing_page_url":"http://resolver.tudelft.nl/uuid:ddbb29f4-a052-49f1-8e44-f7d0c5252ea8","pdf_url":"https://repository.tudelft.nl/file/File_b40945a3-57c7-4dbe-9244-7620951cf5af","source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"conference paper"}],"best_oa_location":{"id":"pmh:oai:tudelft.nl:uuid:ddbb29f4-a052-49f1-8e44-f7d0c5252ea8","is_oa":true,"landing_page_url":"http://resolver.tudelft.nl/uuid:ddbb29f4-a052-49f1-8e44-f7d0c5252ea8","pdf_url":"https://repository.tudelft.nl/file/File_b40945a3-57c7-4dbe-9244-7620951cf5af","source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"conference paper"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","score":0.5600000023841858,"display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4389077243.pdf"},"referenced_works_count":13,"referenced_works":["https://openalex.org/W1901129140","https://openalex.org/W1984600520","https://openalex.org/W2078940259","https://openalex.org/W2155684415","https://openalex.org/W2771305881","https://openalex.org/W2905439256","https://openalex.org/W2946608165","https://openalex.org/W2986104933","https://openalex.org/W3004393198","https://openalex.org/W3104724358","https://openalex.org/W3114296353","https://openalex.org/W4225966544","https://openalex.org/W4312459935"],"related_works":["https://openalex.org/W2545123933","https://openalex.org/W2585813813","https://openalex.org/W3110962985","https://openalex.org/W2042726296","https://openalex.org/W2081203575","https://openalex.org/W3016428515","https://openalex.org/W2096748030","https://openalex.org/W2160730947","https://openalex.org/W2747205507","https://openalex.org/W2887270943"],"abstract_inverted_index":{"We":[0,106],"present":[1],"a":[2,27,52,79],"deep":[3,32,42],"learning-based":[4],"approach":[5],"called":[6],"DipSAR":[7,65,112,123],"for":[8,31,51],"reconstructing":[9],"millimeter-wave":[10],"synthetic":[11],"aperture":[12],"radar":[13],"(SAR)":[14],"images":[15],"from":[16,70],"sparse":[17,60,71,99],"samples.":[18],"The":[19,119],"primary":[20],"challenge":[21],"lies":[22],"in":[23,113,128],"the":[24,41,49,59,75,109,116,125,131],"requirement":[25],"of":[26,111,130],"large":[28,53],"training":[29],"dataset":[30,54,90],"learning":[33],"schemes.":[34],"To":[35],"overcome":[36],"this":[37,83],"issue,":[38],"we":[39,85],"employ":[40],"image":[43,77],"prior":[44],"(DIP)":[45],"technique,":[46],"which":[47],"eliminates":[48],"need":[50],"and":[55,73,91],"instead":[56],"utilizes":[57],"only":[58],"sample":[61],"itself.":[62],"Our":[63],"proposed":[64],"model":[66],"recovers":[67],"missing":[68],"samples":[69,100],"data":[72,104],"reconstructs":[74],"SAR":[76,89],"using":[78],"conventional":[80,117,126],"method.":[81,118],"In":[82],"study,":[84],"utilize":[86],"an":[87],"existing":[88],"create":[92],"fourteen":[93],"different":[94],"patterns":[95],"to":[96,115],"generate":[97],"additional":[98],"by":[101],"removing":[102],"certain":[103],"points.":[105],"then":[107],"evaluate":[108],"performance":[110],"comparison":[114],"results":[120],"show":[121],"that":[122],"outperforms":[124],"method":[127],"terms":[129],"intersection":[132],"over":[133],"union":[134],"(IoU)":[135],"score.":[136]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}