{"id":"https://openalex.org/W4389077275","doi":"https://doi.org/10.1109/sensors56945.2023.10325047","title":"Seismic Monitoring of High-Rise Buildings Based on Fiber Optic Jerk Sensor","display_name":"Seismic Monitoring of High-Rise Buildings Based on Fiber Optic Jerk Sensor","publication_year":2023,"publication_date":"2023-10-29","ids":{"openalex":"https://openalex.org/W4389077275","doi":"https://doi.org/10.1109/sensors56945.2023.10325047"},"language":"en","primary_location":{"id":"doi:10.1109/sensors56945.2023.10325047","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensors56945.2023.10325047","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE SENSORS","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059335293","display_name":"Zhoutao Sun","orcid":"https://orcid.org/0000-0002-4712-9966"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhoutao Sun","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences,Beijing,China","Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100311115","display_name":"Jie Yi","orcid":null},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Yi","raw_affiliation_strings":["Tongji University,State Key Laboratory of Disaster Reduction in Civil Engineering,Shanghai,China","State Key Laboratory of Disaster Reduction in Civil Engineering, Tongji University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tongji University,State Key Laboratory of Disaster Reduction in Civil Engineering,Shanghai,China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"State Key Laboratory of Disaster Reduction in Civil Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059020284","display_name":"Yuntian Teng","orcid":"https://orcid.org/0000-0002-3644-272X"},"institutions":[{"id":"https://openalex.org/I90149893","display_name":"China Earthquake Administration","ror":"https://ror.org/045sza929","country_code":"CN","type":"facility","lineage":["https://openalex.org/I90149893"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuntian Teng","raw_affiliation_strings":["Institute of Geophysics,China Earthquake Administration,Beijing,China","China Earthquake Administration, Institute of Geophysics, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Geophysics,China Earthquake Administration,Beijing,China","institution_ids":["https://openalex.org/I90149893"]},{"raw_affiliation_string":"China Earthquake Administration, Institute of Geophysics, Beijing, China","institution_ids":["https://openalex.org/I90149893"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015385606","display_name":"Wenzhu Huang","orcid":"https://orcid.org/0000-0001-9530-3925"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenzhu Huang","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences,Beijing,China","Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","Center of Materials Science and Optoelectronic Engineering, University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Center of Materials Science and Optoelectronic Engineering, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075495436","display_name":"Bin Zhao","orcid":"https://orcid.org/0000-0003-3961-7035"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Zhao","raw_affiliation_strings":["Tongji University,State Key Laboratory of Disaster Reduction in Civil Engineering,Shanghai,China","State Key Laboratory of Disaster Reduction in Civil Engineering, Tongji University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tongji University,State Key Laboratory of Disaster Reduction in Civil Engineering,Shanghai,China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"State Key Laboratory of Disaster Reduction in Civil Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100394213","display_name":"Fang Li","orcid":"https://orcid.org/0000-0003-1477-3875"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fang Li","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences,Beijing,China","Center of Materials Science and Optoelectronic Engineering, University of Chinese Academy of Sciences, Beijing, China","Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Center of Materials Science and Optoelectronic Engineering, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100459879","display_name":"Wentao Zhang","orcid":"https://orcid.org/0000-0003-4869-6564"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wentao Zhang","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences,Beijing,China","Shenzhen Academy of Disaster Prevention and Reduction, Shenzhen, China","Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","Center of Materials Science and Optoelectronic Engineering, University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Shenzhen Academy of Disaster Prevention and Reduction, Shenzhen, China","institution_ids":[]},{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Center of Materials Science and Optoelectronic Engineering, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2454,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.54700844,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13885","display_name":"Geophysics and Sensor Technology","score":0.9648000001907349,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12233","display_name":"Geotechnical Engineering and Underground Structures","score":0.9408000111579895,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jerk","display_name":"Jerk","score":0.9270893335342407},{"id":"https://openalex.org/keywords/accelerometer","display_name":"Accelerometer","score":0.6674366593360901},{"id":"https://openalex.org/keywords/optical-fiber","display_name":"Optical fiber","score":0.6203725337982178},{"id":"https://openalex.org/keywords/fiber-optic-sensor","display_name":"Fiber optic sensor","score":0.5792388916015625},{"id":"https://openalex.org/keywords/consistency","display_name":"Consistency (knowledge bases)","score":0.47468993067741394},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4201815724372864},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4042201042175293},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3417365252971649},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2628483176231384},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.20037183165550232},{"id":"https://openalex.org/keywords/acceleration","display_name":"Acceleration","score":0.18625369668006897},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15486404299736023},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.06404614448547363}],"concepts":[{"id":"https://openalex.org/C181605269","wikidata":"https://www.wikidata.org/wiki/Q497332","display_name":"Jerk","level":3,"score":0.9270893335342407},{"id":"https://openalex.org/C89805583","wikidata":"https://www.wikidata.org/wiki/Q192940","display_name":"Accelerometer","level":2,"score":0.6674366593360901},{"id":"https://openalex.org/C194232370","wikidata":"https://www.wikidata.org/wiki/Q162","display_name":"Optical fiber","level":2,"score":0.6203725337982178},{"id":"https://openalex.org/C21651689","wikidata":"https://www.wikidata.org/wiki/Q1397427","display_name":"Fiber optic sensor","level":3,"score":0.5792388916015625},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.47468993067741394},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4201815724372864},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4042201042175293},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3417365252971649},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2628483176231384},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.20037183165550232},{"id":"https://openalex.org/C117896860","wikidata":"https://www.wikidata.org/wiki/Q11376","display_name":"Acceleration","level":2,"score":0.18625369668006897},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15486404299736023},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.06404614448547363},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sensors56945.2023.10325047","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensors56945.2023.10325047","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE SENSORS","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6899999976158142,"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1231959491","https://openalex.org/W1969152264","https://openalex.org/W1993956380","https://openalex.org/W2133249892","https://openalex.org/W2137057824","https://openalex.org/W4214606290","https://openalex.org/W4214770653","https://openalex.org/W6627981161"],"related_works":["https://openalex.org/W610912452","https://openalex.org/W2942569287","https://openalex.org/W2547494374","https://openalex.org/W1979506785","https://openalex.org/W2075841941","https://openalex.org/W3182082895","https://openalex.org/W1996601847","https://openalex.org/W2092877997","https://openalex.org/W2082444836","https://openalex.org/W2056020721"],"abstract_inverted_index":{"This":[0],"paper":[1],"introduces":[2],"the":[3,36],"application":[4],"of":[5,13,28],"fiber":[6,17],"optic":[7,18],"jerk":[8,19],"sensor":[9,20],"in":[10],"earthquake":[11],"monitoring":[12],"high-rise":[14],"buildings.":[15],"The":[16],"can":[21],"monitor":[22],"different":[23,26],"types":[24],"and":[25,31],"intensities":[27],"seismic":[29],"wave,":[30],"has":[32],"good":[33],"consistency":[34],"with":[35],"standard":[37],"piezoelectric":[38],"accelerometer.":[39]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}