{"id":"https://openalex.org/W4389101866","doi":"https://doi.org/10.1109/sensors56945.2023.10324989","title":"Materials Design for High Performance of Metal Oxide Semiconductor Gas Sensors","display_name":"Materials Design for High Performance of Metal Oxide Semiconductor Gas Sensors","publication_year":2023,"publication_date":"2023-10-29","ids":{"openalex":"https://openalex.org/W4389101866","doi":"https://doi.org/10.1109/sensors56945.2023.10324989"},"language":"en","primary_location":{"id":"doi:10.1109/sensors56945.2023.10324989","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensors56945.2023.10324989","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE SENSORS","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059181691","display_name":"Kengo Shimanoe","orcid":"https://orcid.org/0000-0002-8401-8982"},"institutions":[{"id":"https://openalex.org/I135598925","display_name":"Kyushu University","ror":"https://ror.org/00p4k0j84","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Kengo Shimanoe","raw_affiliation_strings":["Kyushu University,Faculty of Engineering Sciences,Japan","Faculty of Engineering Sciences, Kyushu University, Japan"],"affiliations":[{"raw_affiliation_string":"Kyushu University,Faculty of Engineering Sciences,Japan","institution_ids":["https://openalex.org/I135598925"]},{"raw_affiliation_string":"Faculty of Engineering Sciences, Kyushu University, Japan","institution_ids":["https://openalex.org/I135598925"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064744149","display_name":"Koichi Suematsu","orcid":"https://orcid.org/0000-0002-6170-447X"},"institutions":[{"id":"https://openalex.org/I135598925","display_name":"Kyushu University","ror":"https://ror.org/00p4k0j84","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koichi Suematsu","raw_affiliation_strings":["Kyushu University,Faculty of Engineering Sciences,Japan","Faculty of Engineering Sciences, Kyushu University, Japan"],"affiliations":[{"raw_affiliation_string":"Kyushu University,Faculty of Engineering Sciences,Japan","institution_ids":["https://openalex.org/I135598925"]},{"raw_affiliation_string":"Faculty of Engineering Sciences, Kyushu University, Japan","institution_ids":["https://openalex.org/I135598925"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082925620","display_name":"Ken Watanabe","orcid":"https://orcid.org/0000-0001-7374-7322"},"institutions":[{"id":"https://openalex.org/I135598925","display_name":"Kyushu University","ror":"https://ror.org/00p4k0j84","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ken Watanabe","raw_affiliation_strings":["Kyushu University,Faculty of Engineering Sciences,Japan","Faculty of Engineering Sciences, Kyushu University, Japan"],"affiliations":[{"raw_affiliation_string":"Kyushu University,Faculty of Engineering Sciences,Japan","institution_ids":["https://openalex.org/I135598925"]},{"raw_affiliation_string":"Faculty of Engineering Sciences, Kyushu University, Japan","institution_ids":["https://openalex.org/I135598925"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5059181691"],"corresponding_institution_ids":["https://openalex.org/I135598925"],"apc_list":null,"apc_paid":null,"fwci":0.1337,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.46671463,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11667","display_name":"Advanced Chemical Sensor Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microelectromechanical-systems","display_name":"Microelectromechanical systems","score":0.7230494022369385},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6052078604698181},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5118696093559265},{"id":"https://openalex.org/keywords/semiconductor","display_name":"Semiconductor","score":0.4457639753818512},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.42526209354400635},{"id":"https://openalex.org/keywords/selectivity","display_name":"Selectivity","score":0.41627931594848633},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3920913338661194},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.37662023305892944},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3380184471607208},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.31966930627822876},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26291725039482117},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.12160378694534302},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.0994655191898346}],"concepts":[{"id":"https://openalex.org/C37977207","wikidata":"https://www.wikidata.org/wiki/Q175561","display_name":"Microelectromechanical systems","level":2,"score":0.7230494022369385},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6052078604698181},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5118696093559265},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.4457639753818512},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.42526209354400635},{"id":"https://openalex.org/C118792377","wikidata":"https://www.wikidata.org/wiki/Q108584245","display_name":"Selectivity","level":3,"score":0.41627931594848633},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3920913338661194},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.37662023305892944},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3380184471607208},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.31966930627822876},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26291725039482117},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.12160378694534302},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0994655191898346},{"id":"https://openalex.org/C161790260","wikidata":"https://www.wikidata.org/wiki/Q82264","display_name":"Catalysis","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sensors56945.2023.10324989","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensors56945.2023.10324989","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE SENSORS","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1847750697","https://openalex.org/W1972706040","https://openalex.org/W1993345383","https://openalex.org/W2003474925","https://openalex.org/W2004989171","https://openalex.org/W2014445809","https://openalex.org/W2020959649","https://openalex.org/W2021203025","https://openalex.org/W2028930871","https://openalex.org/W2087576161","https://openalex.org/W2090546489","https://openalex.org/W2125799005","https://openalex.org/W2333611072","https://openalex.org/W2888561501","https://openalex.org/W3048903158","https://openalex.org/W3107830844","https://openalex.org/W4231181361","https://openalex.org/W6673220219"],"related_works":["https://openalex.org/W2272290532","https://openalex.org/W2120483398","https://openalex.org/W2619424135","https://openalex.org/W1763916368","https://openalex.org/W2114451818","https://openalex.org/W2951237352","https://openalex.org/W2391127530","https://openalex.org/W2074571151","https://openalex.org/W2036143465","https://openalex.org/W2006471881"],"abstract_inverted_index":{"Our":[0],"group":[1],"has":[2],"been":[3],"conducting":[4],"research":[5],"on":[6],"gas":[7,46],"sensors":[8,47],"for":[9,30,38],"approximately":[10],"60":[11],"years.":[12],"In":[13,34],"the":[14,25,50],"past,":[15],"we":[16,41],"have":[17,42],"reported":[18],"several":[19],"important":[20],"material":[21,54],"designs":[22,55],"and":[23,44,62],"demonstrated":[24,45],"effectiveness":[26],"of":[27,52],"integrating":[28],"them":[29],"achieving":[31,59],"high":[32],"performance.":[33],"recent":[35],"years,":[36],"aiming":[37],"further":[39],"improvement,":[40],"proposed":[43],"that":[48],"combine":[49],"usefulness":[51],"these":[53],"with":[56],"MEMS-type":[57],"sensors,":[58],"ultra-high":[60],"sensitivity":[61],"super":[63],"selectivity.":[64]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}