{"id":"https://openalex.org/W4310880231","doi":"https://doi.org/10.1109/sensors52175.2022.9967224","title":"1.4kDots Consumer LiDAR up to 10m Based on Indirect Time-of-Flight Sensor","display_name":"1.4kDots Consumer LiDAR up to 10m Based on Indirect Time-of-Flight Sensor","publication_year":2022,"publication_date":"2022-10-30","ids":{"openalex":"https://openalex.org/W4310880231","doi":"https://doi.org/10.1109/sensors52175.2022.9967224"},"language":"en","primary_location":{"id":"doi:10.1109/sensors52175.2022.9967224","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensors52175.2022.9967224","pdf_url":null,"source":{"id":"https://openalex.org/S4363604906","display_name":"2022 IEEE Sensors","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Sensors","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065222472","display_name":"Cedric Tubert","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":true,"raw_author_name":"Cedric Tubert","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049159045","display_name":"Pascal Mellot","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Pascal Mellot","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043527677","display_name":"Jose Sanches","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Jose Sanches","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061844666","display_name":"J. Teyssier","orcid":"https://orcid.org/0000-0002-7590-2987"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Jeremie Teyssier","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039586635","display_name":"Valentin Rebiere","orcid":"https://orcid.org/0000-0002-9183-3424"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Valentin Rebiere","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022681364","display_name":"Thibault Augey","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Thibault Augey","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041137121","display_name":"Thomas Bouchet","orcid":"https://orcid.org/0000-0001-6873-9133"},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Thomas Bouchet","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042104698","display_name":"Valerie Pena-Laroche","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Valerie Pena-Laroche","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041561333","display_name":"Adrien Bonnat","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Adrien Bonnat","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104017635","display_name":"Marc Sanchez","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Marc Sanchez","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074838047","display_name":"Franck Hingant","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Franck Hingant","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079321372","display_name":"Jean-Raphael Bezal","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Jean-Raphael Bezal","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105298960","display_name":"Patrick Laurent","orcid":"https://orcid.org/0000-0003-0126-7332"},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Patrick Laurent","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024323883","display_name":"M. Mellier","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Maxime Mellier","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083300033","display_name":"Jeannie Chinal","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Jeannie Chinal","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048736681","display_name":"Matteo Fissore","orcid":null},"institutions":[{"id":"https://openalex.org/I4210135508","display_name":"STMicroelectronics (United Kingdom)","ror":"https://ror.org/0442wxc77","country_code":"GB","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210135508"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Matteo Fissore","raw_affiliation_strings":["STMicroelectronics,Imaging Division,EDINBURGH,UNITED KINGDOM","Imaging Division, STMicroelectronics, EDINBURGH, UNITED KINGDOM"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,EDINBURGH,UNITED KINGDOM","institution_ids":["https://openalex.org/I4210135508"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, EDINBURGH, UNITED KINGDOM","institution_ids":["https://openalex.org/I4210135508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012567360","display_name":"Kevin Channon","orcid":null},"institutions":[{"id":"https://openalex.org/I4210135508","display_name":"STMicroelectronics (United Kingdom)","ror":"https://ror.org/0442wxc77","country_code":"GB","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210135508"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Kevin Channon","raw_affiliation_strings":["STMicroelectronics,Imaging Division,EDINBURGH,UNITED KINGDOM","Imaging Division, STMicroelectronics, EDINBURGH, UNITED KINGDOM"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,EDINBURGH,UNITED KINGDOM","institution_ids":["https://openalex.org/I4210135508"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, EDINBURGH, UNITED KINGDOM","institution_ids":["https://openalex.org/I4210135508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027041193","display_name":"James Downing","orcid":null},"institutions":[{"id":"https://openalex.org/I4210135508","display_name":"STMicroelectronics (United Kingdom)","ror":"https://ror.org/0442wxc77","country_code":"GB","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210135508"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"James Downing","raw_affiliation_strings":["STMicroelectronics,Imaging Division,EDINBURGH,UNITED KINGDOM","Imaging Division, STMicroelectronics, EDINBURGH, UNITED KINGDOM"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,EDINBURGH,UNITED KINGDOM","institution_ids":["https://openalex.org/I4210135508"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, EDINBURGH, UNITED KINGDOM","institution_ids":["https://openalex.org/I4210135508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064068317","display_name":"Calum Ritchie","orcid":null},"institutions":[{"id":"https://openalex.org/I4210135508","display_name":"STMicroelectronics (United Kingdom)","ror":"https://ror.org/0442wxc77","country_code":"GB","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210135508"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Calum Ritchie","raw_affiliation_strings":["STMicroelectronics,Imaging Division,EDINBURGH,UNITED KINGDOM","Imaging Division, STMicroelectronics, EDINBURGH, UNITED KINGDOM"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,EDINBURGH,UNITED KINGDOM","institution_ids":["https://openalex.org/I4210135508"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, EDINBURGH, UNITED KINGDOM","institution_ids":["https://openalex.org/I4210135508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035071270","display_name":"Colin J. Campbell","orcid":"https://orcid.org/0000-0003-1917-6105"},"institutions":[{"id":"https://openalex.org/I4210135508","display_name":"STMicroelectronics (United Kingdom)","ror":"https://ror.org/0442wxc77","country_code":"GB","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210135508"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Colin Campbell","raw_affiliation_strings":["STMicroelectronics,Imaging Division,EDINBURGH,UNITED KINGDOM","Imaging Division, STMicroelectronics, EDINBURGH, UNITED KINGDOM"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,EDINBURGH,UNITED KINGDOM","institution_ids":["https://openalex.org/I4210135508"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, EDINBURGH, UNITED KINGDOM","institution_ids":["https://openalex.org/I4210135508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054445737","display_name":"William Halliday","orcid":null},"institutions":[{"id":"https://openalex.org/I4210135508","display_name":"STMicroelectronics (United Kingdom)","ror":"https://ror.org/0442wxc77","country_code":"GB","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210135508"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"William Halliday","raw_affiliation_strings":["STMicroelectronics,Imaging Division,EDINBURGH,UNITED KINGDOM","Imaging Division, STMicroelectronics, EDINBURGH, UNITED KINGDOM"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,EDINBURGH,UNITED KINGDOM","institution_ids":["https://openalex.org/I4210135508"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, EDINBURGH, UNITED KINGDOM","institution_ids":["https://openalex.org/I4210135508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053310936","display_name":"Andy Price","orcid":null},"institutions":[{"id":"https://openalex.org/I4210135508","display_name":"STMicroelectronics (United Kingdom)","ror":"https://ror.org/0442wxc77","country_code":"GB","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210135508"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Andy Price","raw_affiliation_strings":["STMicroelectronics,Imaging Division,EDINBURGH,UNITED KINGDOM","Imaging Division, STMicroelectronics, EDINBURGH, UNITED KINGDOM"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,EDINBURGH,UNITED KINGDOM","institution_ids":["https://openalex.org/I4210135508"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, EDINBURGH, UNITED KINGDOM","institution_ids":["https://openalex.org/I4210135508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017048313","display_name":"Sivakumar K. Singaravadivelu","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210106035","display_name":"STMicroelectronics (United States)","ror":"https://ror.org/01f8c3y78","country_code":"US","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210106035"]}],"countries":["CH","US"],"is_corresponding":false,"raw_author_name":"Sivakumar K. Singaravadivelu","raw_affiliation_strings":["STMicroelectronics,Imaging Division,SANTA CLARA,USA","Imaging Division, STMicroelectronics, SANTA CLARA, USA"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,SANTA CLARA,USA","institution_ids":["https://openalex.org/I4210106035","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, SANTA CLARA, USA","institution_ids":["https://openalex.org/I4210106035"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091165482","display_name":"Paul Varillon","orcid":null},"institutions":[{"id":"https://openalex.org/I4210106035","display_name":"STMicroelectronics (United States)","ror":"https://ror.org/01f8c3y78","country_code":"US","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210106035"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","US"],"is_corresponding":false,"raw_author_name":"Paul Varillon","raw_affiliation_strings":["STMicroelectronics,Imaging Division,SANTA CLARA,USA","Imaging Division, STMicroelectronics, SANTA CLARA, USA"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,SANTA CLARA,USA","institution_ids":["https://openalex.org/I4210106035","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, SANTA CLARA, USA","institution_ids":["https://openalex.org/I4210106035"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042165251","display_name":"Arnaud Deleule","orcid":null},"institutions":[{"id":"https://openalex.org/I4210106035","display_name":"STMicroelectronics (United States)","ror":"https://ror.org/01f8c3y78","country_code":"US","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210106035"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","US"],"is_corresponding":false,"raw_author_name":"Arnaud Deleule","raw_affiliation_strings":["STMicroelectronics,Imaging Division,SANTA CLARA,USA","Imaging Division, STMicroelectronics, SANTA CLARA, USA"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,SANTA CLARA,USA","institution_ids":["https://openalex.org/I4210106035","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, SANTA CLARA, USA","institution_ids":["https://openalex.org/I4210106035"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020950801","display_name":"Lucas ZhongMing Hu","orcid":"https://orcid.org/0000-0002-1781-9341"},"institutions":[{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Lucas Hu","raw_affiliation_strings":["STMicroelectronics,SHANGHAI,CHINA","STMicroelectronics, SHANGHAI, CHINA"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,SHANGHAI,CHINA","institution_ids":["https://openalex.org/I4210124177"]},{"raw_affiliation_string":"STMicroelectronics, SHANGHAI, CHINA","institution_ids":["https://openalex.org/I4210124177"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101042058","display_name":"Robin T. Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Robin Wu","raw_affiliation_strings":["STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","Imaging Division, STMicroelectronics, GRENOBLE, FRANCE"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Imaging Division,GRENOBLE,FRANCE","institution_ids":["https://openalex.org/I4210104693","https://openalex.org/I131827901"]},{"raw_affiliation_string":"Imaging Division, STMicroelectronics, GRENOBLE, FRANCE","institution_ids":["https://openalex.org/I4210104693"]}]}],"institutions":[],"countries_distinct_count":5,"institutions_distinct_count":27,"corresponding_author_ids":["https://openalex.org/A5065222472"],"corresponding_institution_ids":["https://openalex.org/I131827901","https://openalex.org/I4210104693"],"apc_list":null,"apc_paid":null,"fwci":1.4683,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.84309133,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10851","display_name":"Optical Wireless Communication Technologies","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11408","display_name":"Advanced Optical Imaging Technologies","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/lidar","display_name":"Lidar","score":0.6627354621887207},{"id":"https://openalex.org/keywords/point-cloud","display_name":"Point cloud","score":0.5830473303794861},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5636875629425049},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5277593731880188},{"id":"https://openalex.org/keywords/diagonal","display_name":"Diagonal","score":0.5177037715911865},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5057697296142578},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.4635111391544342},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.4206249415874481},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41521769762039185},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4044203758239746},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3677249550819397},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.20593425631523132},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.16334739327430725}],"concepts":[{"id":"https://openalex.org/C51399673","wikidata":"https://www.wikidata.org/wiki/Q504027","display_name":"Lidar","level":2,"score":0.6627354621887207},{"id":"https://openalex.org/C131979681","wikidata":"https://www.wikidata.org/wiki/Q1899648","display_name":"Point cloud","level":2,"score":0.5830473303794861},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5636875629425049},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5277593731880188},{"id":"https://openalex.org/C130367717","wikidata":"https://www.wikidata.org/wiki/Q189791","display_name":"Diagonal","level":2,"score":0.5177037715911865},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5057697296142578},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.4635111391544342},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.4206249415874481},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41521769762039185},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4044203758239746},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3677249550819397},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.20593425631523132},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.16334739327430725},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sensors52175.2022.9967224","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensors52175.2022.9967224","pdf_url":null,"source":{"id":"https://openalex.org/S4363604906","display_name":"2022 IEEE Sensors","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Sensors","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1981289394","https://openalex.org/W2528611534","https://openalex.org/W2535756017","https://openalex.org/W2571907177","https://openalex.org/W3134026884","https://openalex.org/W3136617232","https://openalex.org/W3174688585","https://openalex.org/W4200560274","https://openalex.org/W4250415728","https://openalex.org/W6803035127","https://openalex.org/W6940390760"],"related_works":["https://openalex.org/W4319317934","https://openalex.org/W2901265155","https://openalex.org/W2956374172","https://openalex.org/W4293094720","https://openalex.org/W2739701376","https://openalex.org/W2944239605","https://openalex.org/W1873415836","https://openalex.org/W4200290804","https://openalex.org/W2139783875","https://openalex.org/W4312469487"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3,10,35,49,85],"940nm":[4],"indirect":[5],"Time-of-Flight":[6],"(iToF)":[7],"system":[8,24,99],"using":[9],"38x38":[11],"dot":[12,81],"pattern":[13,82],"illumination":[14,23,83],"emitting":[15],"2.5W":[16],"peak":[17],"over":[18],"80\u00b0":[19],"diagonal":[20],"field-of-view.":[21],"The":[22,43,62,98],"takes":[25],"advantages":[26],"of":[27,38,64],"meta-surface":[28],"optical":[29],"elements":[30],"(MOE)":[31],"designed":[32],"to":[33,69,75,78,112,122],"generate":[34],"point":[36],"cloud":[37],"1444":[39],"vertices":[40],"best":[41],"case.":[42],"RX":[44],"subsystem":[45],"is":[46,67,120],"based":[47],"on":[48],"0.54Mpix":[50],"iToF":[51],"sensor":[52],"with":[53,105],"4.6\u00b5m":[54],"pixel":[55],"configured":[56],"in":[57],"2x2":[58],"analogue":[59],"binning":[60],"mode.":[61],"use":[63],"patterned":[65,114],"light":[66,127],"confirmed":[68],"extend":[70],"the":[71,113,116],"depth":[72,86,107],"range":[73],"up":[74],"10m.":[76],"Compared":[77],"flood":[79],"illumination,":[80],"provides":[84],"extension":[87],"factor":[88],"by":[89,94],"2.05":[90],"at":[91,96,103],"0kLux":[92],"and":[93],"5":[95],"100kLux.":[97,110],"consumes":[100],"<":[101],"300mW":[102],"30fps":[104],"<0.92%":[106],"noise":[108],"under":[109],"Due":[111],"light,":[115],"proposed":[117],"consumer":[118],"LiDAR":[119],"demonstrated":[121],"be":[123],"robust":[124],"against":[125],"ambient":[126],"suitable":[128],"for":[129],"AR/VR":[130],"applications.":[131]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}