{"id":"https://openalex.org/W3113252899","doi":"https://doi.org/10.1109/sensors47125.2020.9278602","title":"Empirical Temperature Model of Self-Directed Channel Memristor","display_name":"Empirical Temperature Model of Self-Directed Channel Memristor","publication_year":2020,"publication_date":"2020-10-25","ids":{"openalex":"https://openalex.org/W3113252899","doi":"https://doi.org/10.1109/sensors47125.2020.9278602","mag":"3113252899"},"language":"en","primary_location":{"id":"doi:10.1109/sensors47125.2020.9278602","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensors47125.2020.9278602","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE SENSORS","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046259966","display_name":"Thanasin Bunnam","orcid":"https://orcid.org/0000-0002-5014-6441"},"institutions":[{"id":"https://openalex.org/I84884186","display_name":"Newcastle University","ror":"https://ror.org/01kj2bm70","country_code":"GB","type":"education","lineage":["https://openalex.org/I84884186"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Thanasin Bunnam","raw_affiliation_strings":["School of Engineering, \u00b5Systems Research Group, Newcastle University, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, \u00b5Systems Research Group, Newcastle University, UK","institution_ids":["https://openalex.org/I84884186"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087371461","display_name":"Ahmed Soltan","orcid":"https://orcid.org/0000-0002-5153-3056"},"institutions":[{"id":"https://openalex.org/I57629906","display_name":"Nile University","ror":"https://ror.org/03cg7cp61","country_code":"EG","type":"education","lineage":["https://openalex.org/I57629906"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Ahmed Soltan","raw_affiliation_strings":["NISC group, Nile University, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NISC group, Nile University, Egypt","institution_ids":["https://openalex.org/I57629906"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015272875","display_name":"Danil Sokolov","orcid":"https://orcid.org/0000-0002-4030-0089"},"institutions":[{"id":"https://openalex.org/I84884186","display_name":"Newcastle University","ror":"https://ror.org/01kj2bm70","country_code":"GB","type":"education","lineage":["https://openalex.org/I84884186"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Danil Sokolov","raw_affiliation_strings":["School of Engineering, \u00b5Systems Research Group, Newcastle University, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, \u00b5Systems Research Group, Newcastle University, UK","institution_ids":["https://openalex.org/I84884186"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084216069","display_name":"Oleg Maevsky","orcid":"https://orcid.org/0000-0002-8759-474X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Oleg Maevsky","raw_affiliation_strings":["NanoDevices LTD, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NanoDevices LTD, Russia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021118449","display_name":"Patrick Degenaar","orcid":"https://orcid.org/0000-0002-5984-6698"},"institutions":[{"id":"https://openalex.org/I84884186","display_name":"Newcastle University","ror":"https://ror.org/01kj2bm70","country_code":"GB","type":"education","lineage":["https://openalex.org/I84884186"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Patrick Degenaar","raw_affiliation_strings":["School of Engineering, \u00b5Systems Research Group, Newcastle University, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, \u00b5Systems Research Group, Newcastle University, UK","institution_ids":["https://openalex.org/I84884186"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029446985","display_name":"Alex Yakovlev","orcid":"https://orcid.org/0000-0003-0826-9330"},"institutions":[{"id":"https://openalex.org/I84884186","display_name":"Newcastle University","ror":"https://ror.org/01kj2bm70","country_code":"GB","type":"education","lineage":["https://openalex.org/I84884186"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Alex Yakovlev","raw_affiliation_strings":["School of Engineering, \u00b5Systems Research Group, Newcastle University, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, \u00b5Systems Research Group, Newcastle University, UK","institution_ids":["https://openalex.org/I84884186"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3122,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.58901218,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/memristor","display_name":"Memristor","score":0.9803051948547363},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.53230881690979},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.5297485589981079},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5121173858642578},{"id":"https://openalex.org/keywords/memistor","display_name":"Memistor","score":0.4859958589076996},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.4576387405395508},{"id":"https://openalex.org/keywords/exponential-function","display_name":"Exponential function","score":0.452962189912796},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4322693347930908},{"id":"https://openalex.org/keywords/cover","display_name":"Cover (algebra)","score":0.42872148752212524},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3998187482357025},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.29675596952438354},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29628390073776245},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22264021635055542},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2102934718132019},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.12141594290733337},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.07644429802894592}],"concepts":[{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.9803051948547363},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.53230881690979},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.5297485589981079},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5121173858642578},{"id":"https://openalex.org/C1895703","wikidata":"https://www.wikidata.org/wiki/Q6034938","display_name":"Memistor","level":4,"score":0.4859958589076996},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.4576387405395508},{"id":"https://openalex.org/C151376022","wikidata":"https://www.wikidata.org/wiki/Q168698","display_name":"Exponential function","level":2,"score":0.452962189912796},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4322693347930908},{"id":"https://openalex.org/C2780428219","wikidata":"https://www.wikidata.org/wiki/Q16952335","display_name":"Cover (algebra)","level":2,"score":0.42872148752212524},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3998187482357025},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.29675596952438354},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29628390073776245},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22264021635055542},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2102934718132019},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.12141594290733337},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.07644429802894592}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sensors47125.2020.9278602","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensors47125.2020.9278602","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE SENSORS","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6600000262260437,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G732396245","display_name":null,"funder_award_id":"EP/N023641/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W190738347","https://openalex.org/W1578783943","https://openalex.org/W2003942425","https://openalex.org/W2007898123","https://openalex.org/W2008901850","https://openalex.org/W2089597903","https://openalex.org/W2112181056","https://openalex.org/W2159461700","https://openalex.org/W2162651880","https://openalex.org/W2170551143","https://openalex.org/W2329040051","https://openalex.org/W2493028547","https://openalex.org/W2503190914","https://openalex.org/W2510112518","https://openalex.org/W2510726401","https://openalex.org/W2516467421","https://openalex.org/W2556305966","https://openalex.org/W2605663629","https://openalex.org/W2759890128","https://openalex.org/W2768970100","https://openalex.org/W2769346289","https://openalex.org/W2783539394","https://openalex.org/W2795849550","https://openalex.org/W2800428874","https://openalex.org/W2892030963","https://openalex.org/W2892550733","https://openalex.org/W2959314876","https://openalex.org/W3036540556","https://openalex.org/W3151055086","https://openalex.org/W6607757825","https://openalex.org/W6725628175","https://openalex.org/W6746060703","https://openalex.org/W6755224573","https://openalex.org/W6779591393"],"related_works":["https://openalex.org/W3170109256","https://openalex.org/W2185262500","https://openalex.org/W4251693286","https://openalex.org/W1543954628","https://openalex.org/W4385367273","https://openalex.org/W2797315502","https://openalex.org/W2163054919","https://openalex.org/W4283019775","https://openalex.org/W4252977987","https://openalex.org/W3173413269"],"abstract_inverted_index":{"Memristors":[0],"are":[1,30],"used":[2],"in":[3,19,91],"many":[4,81],"innovative":[5],"research":[6],"areas.":[7],"However,":[8],"the":[9,56],"temperature":[10,37,89,95],"has":[11],"a":[12,23,36,40],"strong":[13],"effect":[14],"on":[15],"memristance,":[16],"which":[17,59],"results":[18,46],"malfunctions.":[20],"Although":[21],"commercial":[22],"memristor":[24,82],"is":[25,69,77],"available,":[26],"its":[27],"thermal":[28],"characteristics":[29],"still":[31],"under-explored.":[32],"This":[33,67],"paper":[34],"presents":[35],"model":[38,76,86],"of":[39,47],"self-directed":[41],"channel":[42],"memristor.":[43],"The":[44,84],"experimental":[45],"measuring":[48],"high-resistive-state":[49],"memristance":[50],"between":[51],"253K":[52],"and":[53,94],"383K":[54],"show":[55],"inverse":[57],"relation,":[58],"can":[60],"be":[61],"described":[62],"by":[63],"an":[64],"exponential":[65],"equation.":[66],"relation":[68],"similar":[70],"to":[71,79],"metal-oxide":[72],"memristors;":[73],"therefore,":[74],"our":[75],"expected":[78],"cover":[80],"types.":[83],"presented":[85],"enables":[87],"improved":[88],"tolerance":[90],"memristive":[92],"circuits":[93],"sensing":[96],"applications.":[97]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}