{"id":"https://openalex.org/W4200034862","doi":"https://doi.org/10.1109/sensors47087.2021.9639730","title":"Improving MOSFET Piezoresistive Strain Gauges Limit of Detection Using Lock-In Principle","display_name":"Improving MOSFET Piezoresistive Strain Gauges Limit of Detection Using Lock-In Principle","publication_year":2021,"publication_date":"2021-10-31","ids":{"openalex":"https://openalex.org/W4200034862","doi":"https://doi.org/10.1109/sensors47087.2021.9639730"},"language":"en","primary_location":{"id":"doi:10.1109/sensors47087.2021.9639730","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensors47087.2021.9639730","pdf_url":null,"source":{"id":"https://openalex.org/S4363605007","display_name":"2021 IEEE Sensors","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE Sensors","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/2078.1/259021","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032510689","display_name":"Thibault Delhaye","orcid":"https://orcid.org/0000-0002-3433-8638"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Thibault P. Delhaye","raw_affiliation_strings":["ICTEAM Institute, UCLouvain, Louvain-la-Neuve, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICTEAM Institute, UCLouvain, Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057779989","display_name":"Nicolas Roisin","orcid":"https://orcid.org/0000-0002-4251-1648"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Nicolas Roisin","raw_affiliation_strings":["ICTEAM Institute, UCLouvain, Louvain-la-Neuve, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICTEAM Institute, UCLouvain, Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102004307","display_name":"Nicol\u00e1s Andr\u00e9","orcid":"https://orcid.org/0000-0002-1514-028X"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Nicolas Andre","raw_affiliation_strings":["ICTEAM Institute, UCLouvain, Louvain-la-Neuve, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICTEAM Institute, UCLouvain, Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028890718","display_name":"Laurent A. Francis","orcid":"https://orcid.org/0000-0003-4683-3916"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Laurent A. Francis","raw_affiliation_strings":["ICTEAM Institute, UCLouvain, Louvain-la-Neuve, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICTEAM Institute, UCLouvain, Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064026729","display_name":"Denis Flandre","orcid":"https://orcid.org/0000-0001-5298-5196"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Denis Flandre","raw_affiliation_strings":["ICTEAM Institute, UCLouvain, Louvain-la-Neuve, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICTEAM Institute, UCLouvain, Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I95674353"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16397019,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/piezoresistive-effect","display_name":"Piezoresistive effect","score":0.8370743989944458},{"id":"https://openalex.org/keywords/lock","display_name":"Lock (firearm)","score":0.6762312054634094},{"id":"https://openalex.org/keywords/strain-gauge","display_name":"Strain gauge","score":0.6525206565856934},{"id":"https://openalex.org/keywords/limit","display_name":"Limit (mathematics)","score":0.6255679130554199},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5879019498825073},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5752226710319519},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5187323689460754},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4425729811191559},{"id":"https://openalex.org/keywords/detection-limit","display_name":"Detection limit","score":0.4112173318862915},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3871878981590271},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.38611018657684326},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36256271600723267},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.3104650676250458},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2815394699573517},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2543899416923523},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.23549723625183105},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.22564631700515747},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.21267592906951904},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2040099799633026},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.100789874792099},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.08828258514404297},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.05907520651817322}],"concepts":[{"id":"https://openalex.org/C198490522","wikidata":"https://www.wikidata.org/wiki/Q1932915","display_name":"Piezoresistive effect","level":2,"score":0.8370743989944458},{"id":"https://openalex.org/C174839445","wikidata":"https://www.wikidata.org/wiki/Q1134386","display_name":"Lock (firearm)","level":2,"score":0.6762312054634094},{"id":"https://openalex.org/C60584519","wikidata":"https://www.wikidata.org/wiki/Q610723","display_name":"Strain gauge","level":2,"score":0.6525206565856934},{"id":"https://openalex.org/C151201525","wikidata":"https://www.wikidata.org/wiki/Q177239","display_name":"Limit (mathematics)","level":2,"score":0.6255679130554199},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5879019498825073},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5752226710319519},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5187323689460754},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4425729811191559},{"id":"https://openalex.org/C119128265","wikidata":"https://www.wikidata.org/wiki/Q900165","display_name":"Detection limit","level":2,"score":0.4112173318862915},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3871878981590271},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.38611018657684326},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36256271600723267},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.3104650676250458},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2815394699573517},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2543899416923523},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.23549723625183105},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.22564631700515747},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.21267592906951904},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2040099799633026},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.100789874792099},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.08828258514404297},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.05907520651817322},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/sensors47087.2021.9639730","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensors47087.2021.9639730","pdf_url":null,"source":{"id":"https://openalex.org/S4363605007","display_name":"2021 IEEE Sensors","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE Sensors","raw_type":"proceedings-article"},{"id":"pmh:oai:dial.uclouvain.be:boreal:259021","is_oa":true,"landing_page_url":"http://hdl.handle.net/2078.1/259021","pdf_url":null,"source":{"id":"https://openalex.org/S4306401902","display_name":"Digital Access to Libraries (Universit\u00e9 catholique de Louvain (UCL), l'Universit\u00e9 de Namur (UNamur) and the Universit\u00e9 Saint-Louis (USL-B))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I95674353","host_organization_name":"UCLouvain","host_organization_lineage":["https://openalex.org/I95674353"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:dial.uclouvain.be:boreal:259484","is_oa":true,"landing_page_url":"http://hdl.handle.net/2078.1/259484","pdf_url":null,"source":{"id":"https://openalex.org/S4306401902","display_name":"Digital Access to Libraries (Universit\u00e9 catholique de Louvain (UCL), l'Universit\u00e9 de Namur (UNamur) and the Universit\u00e9 Saint-Louis (USL-B))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I95674353","host_organization_name":"UCLouvain","host_organization_lineage":["https://openalex.org/I95674353"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:dial.uclouvain.be:boreal:259021","is_oa":true,"landing_page_url":"http://hdl.handle.net/2078.1/259021","pdf_url":null,"source":{"id":"https://openalex.org/S4306401902","display_name":"Digital Access to Libraries (Universit\u00e9 catholique de Louvain (UCL), l'Universit\u00e9 de Namur (UNamur) and the Universit\u00e9 Saint-Louis (USL-B))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I95674353","host_organization_name":"UCLouvain","host_organization_lineage":["https://openalex.org/I95674353"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[{"score":0.7300000190734863,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2016080756","https://openalex.org/W2044133993","https://openalex.org/W2057889396","https://openalex.org/W2070768625","https://openalex.org/W2120255193","https://openalex.org/W2162342569","https://openalex.org/W2520473379","https://openalex.org/W2748202952","https://openalex.org/W2770093914","https://openalex.org/W3046666382","https://openalex.org/W4232216046"],"related_works":["https://openalex.org/W2084250491","https://openalex.org/W2375562665","https://openalex.org/W2184008233","https://openalex.org/W3130958947","https://openalex.org/W1985482365","https://openalex.org/W2025294681","https://openalex.org/W2550172429","https://openalex.org/W2033744549","https://openalex.org/W1609585311","https://openalex.org/W2056590407"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"we":[3],"present":[4],"a":[5,23,60],"way":[6],"to":[7,36,59,70],"improve":[8],"piezoresistive":[9],"MOSFET":[10],"strain":[11],"gauges":[12],"using":[13,54],"Lock-In":[14,41],"principle.":[15],"This":[16,48],"reduces":[17],"the":[18],"influence":[19],"of":[20,25],"1/f-noise,":[21],"showing":[22],"Limit":[24],"Detection":[26],"(LoD)":[27],"reduction":[28,50],"from":[29,63],"474":[30],"(42)":[31],"\u03bc\u03f5":[32,39,66,73],"for":[33,40,53,67,74],"current":[34,68],"measurements":[35,42,69],"40.5":[37],"(15)":[38],"at":[43],"10":[44],"\u03bcA":[45],"(100\u03bcA)":[46],"bias.":[47],"1/f-noise":[49],"also":[51],"allows":[52],"more":[55],"efficiently":[56],"averaging,":[57],"leading":[58],"50-fold":[61],"improvement":[62],"387":[64],"(30)":[65],"7.8":[71],"(2.4)":[72],"Lock-In,":[75],"with":[76],"100":[77],"samples":[78],"averaging.":[79]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}