{"id":"https://openalex.org/W2999093890","doi":"https://doi.org/10.1109/sensors43011.2019.8956562","title":"A Methodology for Interference Insensitive Angular Measurement","display_name":"A Methodology for Interference Insensitive Angular Measurement","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W2999093890","doi":"https://doi.org/10.1109/sensors43011.2019.8956562","mag":"2999093890"},"language":"en","primary_location":{"id":"doi:10.1109/sensors43011.2019.8956562","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensors43011.2019.8956562","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE SENSORS","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019845106","display_name":"Phil Meier","orcid":null},"institutions":[{"id":"https://openalex.org/I2799859273","display_name":"Ostfalia University of Applied Sciences","ror":"https://ror.org/01bk10867","country_code":"DE","type":"education","lineage":["https://openalex.org/I2799859273"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Phil Meier","raw_affiliation_strings":["Ostfalia University of Applied Sciences,Faculty of Electrical Engineering,Germany","Faculty of Electrical Engineering, Ostfalia University of Applied Sciences, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ostfalia University of Applied Sciences,Faculty of Electrical Engineering,Germany","institution_ids":["https://openalex.org/I2799859273"]},{"raw_affiliation_string":"Faculty of Electrical Engineering, Ostfalia University of Applied Sciences, Germany","institution_ids":["https://openalex.org/I2799859273"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046253584","display_name":"Kris Rohrmann","orcid":"https://orcid.org/0000-0001-6414-153X"},"institutions":[{"id":"https://openalex.org/I2799859273","display_name":"Ostfalia University of Applied Sciences","ror":"https://ror.org/01bk10867","country_code":"DE","type":"education","lineage":["https://openalex.org/I2799859273"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Kris Rohrmann","raw_affiliation_strings":["Ostfalia University of Applied Sciences,Faculty of Electrical Engineering,Germany","Faculty of Electrical Engineering, Ostfalia University of Applied Sciences, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ostfalia University of Applied Sciences,Faculty of Electrical Engineering,Germany","institution_ids":["https://openalex.org/I2799859273"]},{"raw_affiliation_string":"Faculty of Electrical Engineering, Ostfalia University of Applied Sciences, Germany","institution_ids":["https://openalex.org/I2799859273"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078869215","display_name":"Oussama Ferhi","orcid":null},"institutions":[{"id":"https://openalex.org/I2799859273","display_name":"Ostfalia University of Applied Sciences","ror":"https://ror.org/01bk10867","country_code":"DE","type":"education","lineage":["https://openalex.org/I2799859273"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Oussama Ferhi","raw_affiliation_strings":["Ostfalia University of Applied Sciences,Faculty of Electrical Engineering,Germany","Faculty of Electrical Engineering, Ostfalia University of Applied Sciences, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ostfalia University of Applied Sciences,Faculty of Electrical Engineering,Germany","institution_ids":["https://openalex.org/I2799859273"]},{"raw_affiliation_string":"Faculty of Electrical Engineering, Ostfalia University of Applied Sciences, Germany","institution_ids":["https://openalex.org/I2799859273"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064490837","display_name":"Marvin Sandner","orcid":"https://orcid.org/0009-0009-8184-6297"},"institutions":[{"id":"https://openalex.org/I2799859273","display_name":"Ostfalia University of Applied Sciences","ror":"https://ror.org/01bk10867","country_code":"DE","type":"education","lineage":["https://openalex.org/I2799859273"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Marvin Sandner","raw_affiliation_strings":["Ostfalia University of Applied Sciences,Faculty of Electrical Engineering,Germany","Faculty of Electrical Engineering, Ostfalia University of Applied Sciences, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ostfalia University of Applied Sciences,Faculty of Electrical Engineering,Germany","institution_ids":["https://openalex.org/I2799859273"]},{"raw_affiliation_string":"Faculty of Electrical Engineering, Ostfalia University of Applied Sciences, Germany","institution_ids":["https://openalex.org/I2799859273"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066723108","display_name":"Marcus Prochaska","orcid":"https://orcid.org/0000-0002-1615-6080"},"institutions":[{"id":"https://openalex.org/I2799859273","display_name":"Ostfalia University of Applied Sciences","ror":"https://ror.org/01bk10867","country_code":"DE","type":"education","lineage":["https://openalex.org/I2799859273"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Marcus Prochaska","raw_affiliation_strings":["Ostfalia University of Applied Sciences,Faculty of Electrical Engineering,Germany","Faculty of Electrical Engineering, Ostfalia University of Applied Sciences, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ostfalia University of Applied Sciences,Faculty of Electrical Engineering,Germany","institution_ids":["https://openalex.org/I2799859273"]},{"raw_affiliation_string":"Faculty of Electrical Engineering, Ostfalia University of Applied Sciences, Germany","institution_ids":["https://openalex.org/I2799859273"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I2799859273"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.824934720993042},{"id":"https://openalex.org/keywords/magnetometer","display_name":"Magnetometer","score":0.6849886178970337},{"id":"https://openalex.org/keywords/digitization","display_name":"Digitization","score":0.6272107362747192},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.6063240766525269},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.561216413974762},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5563327074050903},{"id":"https://openalex.org/keywords/workflow","display_name":"Workflow","score":0.5504211783409119},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.4997107982635498},{"id":"https://openalex.org/keywords/fourier-transform","display_name":"Fourier transform","score":0.4707748591899872},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.4501931965351105},{"id":"https://openalex.org/keywords/demagnetizing-field","display_name":"Demagnetizing field","score":0.4265114665031433},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.423249214887619},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3312631845474243},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3176426589488983},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21317151188850403},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.15071392059326172},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11901521682739258},{"id":"https://openalex.org/keywords/magnetization","display_name":"Magnetization","score":0.1007237434387207}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.824934720993042},{"id":"https://openalex.org/C153946474","wikidata":"https://www.wikidata.org/wiki/Q333921","display_name":"Magnetometer","level":3,"score":0.6849886178970337},{"id":"https://openalex.org/C2779308522","wikidata":"https://www.wikidata.org/wiki/Q843958","display_name":"Digitization","level":2,"score":0.6272107362747192},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.6063240766525269},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.561216413974762},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5563327074050903},{"id":"https://openalex.org/C177212765","wikidata":"https://www.wikidata.org/wiki/Q627335","display_name":"Workflow","level":2,"score":0.5504211783409119},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.4997107982635498},{"id":"https://openalex.org/C102519508","wikidata":"https://www.wikidata.org/wiki/Q6520159","display_name":"Fourier transform","level":2,"score":0.4707748591899872},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.4501931965351105},{"id":"https://openalex.org/C60434167","wikidata":"https://www.wikidata.org/wiki/Q5255001","display_name":"Demagnetizing field","level":4,"score":0.4265114665031433},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.423249214887619},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3312631845474243},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3176426589488983},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21317151188850403},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.15071392059326172},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11901521682739258},{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.1007237434387207},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sensors43011.2019.8956562","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sensors43011.2019.8956562","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE SENSORS","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.47999998927116394,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W592126670","https://openalex.org/W2031895748","https://openalex.org/W2048627956","https://openalex.org/W2139356817","https://openalex.org/W2166116275","https://openalex.org/W2742724989","https://openalex.org/W2810243424","https://openalex.org/W2889101302","https://openalex.org/W2906863219","https://openalex.org/W2907138342","https://openalex.org/W2911090220","https://openalex.org/W2914308321","https://openalex.org/W2946517241","https://openalex.org/W2982425479","https://openalex.org/W4229727159","https://openalex.org/W6757907045"],"related_works":["https://openalex.org/W1539704186","https://openalex.org/W4254109238","https://openalex.org/W2399890175","https://openalex.org/W4308177873","https://openalex.org/W3202479762","https://openalex.org/W2480493049","https://openalex.org/W2592115649","https://openalex.org/W4322582183","https://openalex.org/W1937392525","https://openalex.org/W2347632764"],"abstract_inverted_index":{"An":[0],"essential":[1],"part":[2],"of":[3,20,25,61],"many":[4,19],"automotive,":[5],"industrial":[6],"or":[7],"technical":[8],"applications":[9,30],"are":[10],"magnetic":[11],"field":[12,22],"sensors.":[13],"The":[14,54,78],"ongoing":[15],"digitization":[16],"effort":[17],"in":[18,28],"such":[21,29],"the":[23],"number":[24],"electronic":[26],"components":[27],"is":[31,52,56,67],"dramatically":[32],"increasing.":[33],"In":[34],"this":[35],"paper":[36],"an":[37,59],"angular":[38],"sensing":[39],"approach":[40,55,79],"with":[41],"improved":[42],"robustness":[43],"against":[44],"stray":[45],"fields":[46],"as":[47,49],"well":[48],"mechanical":[50],"tolerances":[51],"presented.":[53],"based":[57,69],"on":[58,70],"array":[60],"2D":[62,71],"magnetometers.":[63],"A":[64],"two-tier":[65],"workflow":[66],"presented":[68],"discrete":[72],"Fourier":[73],"transformations":[74],"and":[75,85],"neuronal":[76],"networks.":[77],"was":[80],"verified":[81],"by":[82],"extensive":[83],"simulations":[84],"measurements.":[86]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}