{"id":"https://openalex.org/W4415744072","doi":"https://doi.org/10.1109/sbcci66862.2025.11218640","title":"Auto-Tuning Aging Sensor Validated Under Burn-In, Temperature, and Voltage Variations","display_name":"Auto-Tuning Aging Sensor Validated Under Burn-In, Temperature, and Voltage Variations","publication_year":2025,"publication_date":"2025-08-25","ids":{"openalex":"https://openalex.org/W4415744072","doi":"https://doi.org/10.1109/sbcci66862.2025.11218640"},"language":null,"primary_location":{"id":"doi:10.1109/sbcci66862.2025.11218640","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sbcci66862.2025.11218640","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 38th SBC/SBMicro/IEEE Symposium on Integrated Circuits and Systems Design (SBCCI)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030033701","display_name":"Lucas Nogueira","orcid":"https://orcid.org/0000-0002-3612-6524"},"institutions":[{"id":"https://openalex.org/I243754102","display_name":"Universidade Federal do Cear\u00e1","ror":"https://ror.org/03srtnf24","country_code":"BR","type":"education","lineage":["https://openalex.org/I243754102"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Lucas Nogueira","raw_affiliation_strings":["Universidade Federal do Ceará,Fortaleza,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Federal do Ceará,Fortaleza,Brazil","institution_ids":["https://openalex.org/I243754102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5120207017","display_name":"F Mirailton","orcid":null},"institutions":[{"id":"https://openalex.org/I243754102","display_name":"Universidade Federal do Cear\u00e1","ror":"https://ror.org/03srtnf24","country_code":"BR","type":"education","lineage":["https://openalex.org/I243754102"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"F Mirailton","raw_affiliation_strings":["Universidade Federal do Ceará,Fortaleza,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Federal do Ceará,Fortaleza,Brazil","institution_ids":["https://openalex.org/I243754102"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Danilo Alencar","orcid":null},"institutions":[{"id":"https://openalex.org/I243754102","display_name":"Universidade Federal do Cear\u00e1","ror":"https://ror.org/03srtnf24","country_code":"BR","type":"education","lineage":["https://openalex.org/I243754102"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Danilo Alencar","raw_affiliation_strings":["Universidade Federal do Ceará,Fortaleza,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Federal do Ceará,Fortaleza,Brazil","institution_ids":["https://openalex.org/I243754102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024104278","display_name":"Jos\u00e9 Alisson Gomes da Costa Alisson","orcid":null},"institutions":[{"id":"https://openalex.org/I243754102","display_name":"Universidade Federal do Cear\u00e1","ror":"https://ror.org/03srtnf24","country_code":"BR","type":"education","lineage":["https://openalex.org/I243754102"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"J Alisson","raw_affiliation_strings":["Universidade Federal do Ceará,Fortaleza,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Federal do Ceará,Fortaleza,Brazil","institution_ids":["https://openalex.org/I243754102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110664694","display_name":"Jardel Silveira","orcid":null},"institutions":[{"id":"https://openalex.org/I243754102","display_name":"Universidade Federal do Cear\u00e1","ror":"https://ror.org/03srtnf24","country_code":"BR","type":"education","lineage":["https://openalex.org/I243754102"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Jardel Silveira","raw_affiliation_strings":["Universidade Federal do Ceará,Fortaleza,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Federal do Ceará,Fortaleza,Brazil","institution_ids":["https://openalex.org/I243754102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067295217","display_name":"Jarbas Silveira","orcid":"https://orcid.org/0000-0003-2590-9520"},"institutions":[{"id":"https://openalex.org/I243754102","display_name":"Universidade Federal do Cear\u00e1","ror":"https://ror.org/03srtnf24","country_code":"BR","type":"education","lineage":["https://openalex.org/I243754102"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Jarbas Silveira","raw_affiliation_strings":["Universidade Federal do Ceará,Fortaleza,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidade Federal do Ceará,Fortaleza,Brazil","institution_ids":["https://openalex.org/I243754102"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056273734","display_name":"Fabian Vargas","orcid":"https://orcid.org/0000-0002-3871-6464"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Leibniz Institute for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Fabian Vargas","raw_affiliation_strings":["IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany","institution_ids":["https://openalex.org/I92894754"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5352,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.72358056,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.6933000087738037,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.6933000087738037,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.09549999982118607,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.052000001072883606,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4512999951839447},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.43790000677108765},{"id":"https://openalex.org/keywords/tracking","display_name":"Tracking (education)","score":0.4059000015258789},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.3901999890804291},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.3695000112056732},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.3440000116825104},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.3416999876499176},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.3237000107765198},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.32179999351501465}],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4512999951839447},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.43790000677108765},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42989999055862427},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41600000858306885},{"id":"https://openalex.org/C2775936607","wikidata":"https://www.wikidata.org/wiki/Q466845","display_name":"Tracking (education)","level":2,"score":0.4059000015258789},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.3901999890804291},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.38909998536109924},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.385699987411499},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3801000118255615},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.3695000112056732},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.34769999980926514},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.3440000116825104},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.3416999876499176},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33809998631477356},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.3237000107765198},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.32179999351501465},{"id":"https://openalex.org/C2778774385","wikidata":"https://www.wikidata.org/wiki/Q4437810","display_name":"Power management","level":3,"score":0.30169999599456787},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.298799991607666},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.29670000076293945},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.29440000653266907},{"id":"https://openalex.org/C64142963","wikidata":"https://www.wikidata.org/wiki/Q1153902","display_name":"Phase-change memory","level":3,"score":0.28859999775886536},{"id":"https://openalex.org/C12725497","wikidata":"https://www.wikidata.org/wiki/Q810247","display_name":"Baseline (sea)","level":2,"score":0.2865000069141388},{"id":"https://openalex.org/C24590314","wikidata":"https://www.wikidata.org/wiki/Q336038","display_name":"Wireless sensor network","level":2,"score":0.27970001101493835},{"id":"https://openalex.org/C19012869","wikidata":"https://www.wikidata.org/wiki/Q578372","display_name":"Response time","level":2,"score":0.2777999937534332},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2700999975204468},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.2597000002861023},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.2531999945640564},{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.25040000677108765}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sbcci66862.2025.11218640","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sbcci66862.2025.11218640","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 38th SBC/SBMicro/IEEE Symposium on Integrated Circuits and Systems Design (SBCCI)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1902843222","https://openalex.org/W2017807298","https://openalex.org/W2043318181","https://openalex.org/W2053346678","https://openalex.org/W2078871390","https://openalex.org/W2094981849","https://openalex.org/W2141565132","https://openalex.org/W2144283129","https://openalex.org/W2342824154","https://openalex.org/W2539987182","https://openalex.org/W2768972110","https://openalex.org/W3084879046","https://openalex.org/W3094552862","https://openalex.org/W3147784729","https://openalex.org/W4211116224","https://openalex.org/W4399146718","https://openalex.org/W4401329667","https://openalex.org/W4402310821","https://openalex.org/W4409561190"],"related_works":[],"abstract_inverted_index":{"The":[0,68,89],"increasing":[1],"integration":[2],"of":[3,15,53,107],"electronic":[4],"systems":[5],"in":[6,93],"critical":[7,57],"applications":[8],"has":[9],"made":[10],"the":[11,39,63,122,145],"prediction":[12],"and":[13,35,96,112,131,153],"mitigation":[14],"circuit":[16],"aging":[17,50,114,137,164],"effects":[18],"a":[19,47,72,78,99,148,168],"key":[20],"challenge":[21],"for":[22,41,65,83,171],"ensuring":[23],"longterm":[24],"reliability.":[25],"Traditional":[26],"solutions":[27],"such":[28],"as":[29],"guard-banding":[30],"compromise":[31],"performance,":[32],"power,":[33],"area":[34],"ultimately":[36],"cost,":[37],"highlighting":[38],"need":[40,64],"better":[42],"solutions.":[43],"This":[44,159],"work":[45],"proposes":[46],"selftuning":[48],"on-chip":[49],"sensor":[51,74,90,123,146],"capable":[52],"accurately":[54],"tracking":[55],"inmission":[56],"path":[58,125],"time":[59,149],"slack":[60,85,150],"erosion,":[61],"without":[62],"manual":[66],"recalibration.":[67],"proposed":[69],"solution":[70],"enhances":[71],"baseline":[73],"architecture":[75],"by":[76],"incorporating":[77],"dynamic":[79],"phase":[80],"shift":[81],"mechanism":[82],"autonomous":[84],"detection":[86],"during":[87],"operation.":[88],"was":[91],"implemented":[92],"an":[94],"FPGA":[95],"validated":[97],"using":[98],"comprehensive":[100],"experimental":[101],"commercial":[102],"platform,":[103],"enabling":[104],"controlled":[105],"variation":[106],"supply":[108],"voltage,":[109],"core":[110],"temperature,":[111],"accelerated":[113],"through":[115],"burn-in":[116],"stress.":[117],"Experimental":[118],"results":[119],"showed":[120],"that":[121],"tracks":[124],"delay":[126],"increase":[127],"under":[128],"voltage":[129],"reduction":[130],"temperature":[132],"rise,":[133],"while":[134],"continuously":[135],"monitoring":[136],"effects.":[138],"Functional":[139],"failures":[140],"were":[141],"observed":[142],"shortly":[143],"after":[144],"indicated":[147],"approaching":[151],"zero":[152],"so,":[154],"confirming":[155],"its":[156],"predictive":[157],"capability.":[158],"approach":[160],"allows":[161],"in-mission":[162],"mode":[163],"monitoring,":[165],"which":[166],"is":[167],"paramount":[169],"condition":[170],"Silicon":[172],"Lifecycle":[173],"Management":[174],"(SLM)":[175],"strategies.":[176]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-31T00:00:00"}