{"id":"https://openalex.org/W3174371962","doi":"https://doi.org/10.1109/sbcci.2016.7724046","title":"A standard cell characterization flow for non-standard voltage supplies","display_name":"A standard cell characterization flow for non-standard voltage supplies","publication_year":2016,"publication_date":"2016-08-01","ids":{"openalex":"https://openalex.org/W3174371962","doi":"https://doi.org/10.1109/sbcci.2016.7724046","mag":"3174371962"},"language":"en","primary_location":{"id":"doi:10.1109/sbcci.2016.7724046","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sbcci.2016.7724046","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 29th Symposium on Integrated Circuits and Systems Design (SBCCI)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012661588","display_name":"Matheus Gibiluka","orcid":null},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Matheus Gibiluka","raw_affiliation_strings":["GAPH - Faculty of Computer Science, PUCRS, Porto Alegre, RS, Brazil"],"affiliations":[{"raw_affiliation_string":"GAPH - Faculty of Computer Science, PUCRS, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I45643870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101963901","display_name":"Matheus T. Moreira","orcid":"https://orcid.org/0000-0001-5030-9215"},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Matheus Trevisan Moreira","raw_affiliation_strings":["GAPH - Faculty of Computer Science, PUCRS, Porto Alegre, RS, Brazil"],"affiliations":[{"raw_affiliation_string":"GAPH - Faculty of Computer Science, PUCRS, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I45643870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028824039","display_name":"Walter Lau Neto","orcid":"https://orcid.org/0000-0002-9349-4964"},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Walter Lau Neto","raw_affiliation_strings":["GAPH - Faculty of Computer Science, PUCRS, Porto Alegre, RS, Brazil"],"affiliations":[{"raw_affiliation_string":"GAPH - Faculty of Computer Science, PUCRS, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I45643870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072149252","display_name":"Ney Calazans","orcid":"https://orcid.org/0000-0002-0467-4294"},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Ney Laert Vilar Calazans","raw_affiliation_strings":["GAPH - Faculty of Computer Science, PUCRS, Porto Alegre, RS, Brazil"],"affiliations":[{"raw_affiliation_string":"GAPH - Faculty of Computer Science, PUCRS, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I45643870"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5012661588"],"corresponding_institution_ids":["https://openalex.org/I45643870"],"apc_list":null,"apc_paid":null,"fwci":0.3153,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.63908219,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"616","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.8576644062995911},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6959970593452454},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.656004786491394},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.6274656057357788},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5267079472541809},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.5238124132156372},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5203803777694702},{"id":"https://openalex.org/keywords/flow","display_name":"Flow (mathematics)","score":0.4310990273952484},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.333446204662323},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.30791887640953064},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2540668249130249},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21803835034370422},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20159807801246643},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07984602451324463}],"concepts":[{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.8576644062995911},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6959970593452454},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.656004786491394},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.6274656057357788},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5267079472541809},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.5238124132156372},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5203803777694702},{"id":"https://openalex.org/C38349280","wikidata":"https://www.wikidata.org/wiki/Q1434290","display_name":"Flow (mathematics)","level":2,"score":0.4310990273952484},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.333446204662323},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.30791887640953064},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2540668249130249},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21803835034370422},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20159807801246643},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07984602451324463},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sbcci.2016.7724046","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sbcci.2016.7724046","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 29th Symposium on Integrated Circuits and Systems Design (SBCCI)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5099999904632568,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2012158213","https://openalex.org/W2070152203","https://openalex.org/W2085583524","https://openalex.org/W2126693329","https://openalex.org/W2128748528","https://openalex.org/W2152406824","https://openalex.org/W2161380844","https://openalex.org/W4244408760","https://openalex.org/W4252053159","https://openalex.org/W6653508289","https://openalex.org/W6678797189","https://openalex.org/W6683473956","https://openalex.org/W6792412695"],"related_works":["https://openalex.org/W2031753133","https://openalex.org/W2080129643","https://openalex.org/W2051041430","https://openalex.org/W2151657833","https://openalex.org/W1554205582","https://openalex.org/W3111996845","https://openalex.org/W2126379574","https://openalex.org/W1998894515","https://openalex.org/W2922751745","https://openalex.org/W1596716095"],"abstract_inverted_index":{"Static":[0],"timing":[1,11,34],"analysis":[2,148],"(STA)":[3],"is":[4,101],"a":[5,73,87,122,128,137,143,169],"widely":[6],"used":[7],"technique":[8],"to":[9,81,94],"perform":[10],"verification":[12],"of":[13,124,136,171,182,194,201],"digital":[14],"circuits":[15],"analytically.":[16],"These":[17],"models":[18],"are":[19,26,44],"available":[20],"in":[21,66],"standard":[22,96,139],"cell":[23,97,114,140],"libraries,":[24],"and":[25,70,103,162],"usually":[27],"generated":[28],"based":[29],"on":[30,106],"data":[31],"acquired":[32],"from":[33,112],"characterization":[35,88,135,189],"performed":[36],"by":[37,85,121,176],"foundries.":[38],"Even":[39],"though":[40],"advanced":[41],"node":[42],"libraries":[43],"characterized":[45,155],"for":[46,75,142,156,203],"some":[47],"corners,":[48],"they":[49],"currently":[50],"do":[51],"not":[52],"cover":[53],"voltage":[54],"levels":[55],"that":[56,90,108,150,165,185,191],"will":[57],"likely":[58],"drive":[59],"ultra-low":[60],"power":[61],"applications":[62],"as":[63,158,160,174],"those":[64,193,204],"present":[65],"domains":[67],"like":[68],"IoT":[69],"wearable":[71],"devices,":[72],"trend":[74],"upcoming":[76],"years.":[77],"This":[78],"work":[79,173],"contributes":[80],"solve":[82],"this":[83,151],"issue,":[84],"proposing":[86],"flow":[89,100,187],"can":[91,109,153],"be":[92,110,154],"applied":[93],"any":[95,113],"set.":[98],"The":[99,147],"foundry-independent":[102],"relies":[104],"solely":[105],"information":[107],"obtained":[111],"library.":[115],"It":[116],"employs":[117],"commercial":[118,138,197],"tools":[119],"incremented":[120],"set":[123,181],"in-house":[125],"scripts.":[126],"As":[127],"case":[129],"study,":[130],"the":[131,134,177,186,195,207],"article":[132],"explores":[133],"library":[141,152,198],"28nm":[144],"FDSOI":[145],"technology.":[146],"shows":[149],"voltages":[157,205],"low":[159],"250mV":[161],"still":[163],"guarantee":[164],"its":[166],"cells,":[167],"or":[168],"subset":[170],"these,":[172],"intended":[175],"technology":[178],"rules.":[179],"A":[180],"experiments":[183],"show":[184],"obtains":[188],"results":[190],"match":[192],"associated":[196],"within":[199],"5%":[200],"error,":[202],"where":[206],"latter":[208],"provides":[209],"information.":[210]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}