{"id":"https://openalex.org/W2033769672","doi":"https://doi.org/10.1109/sbcci.2013.6644858","title":"CMOS smart temperature sensors for RFID applications","display_name":"CMOS smart temperature sensors for RFID applications","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W2033769672","doi":"https://doi.org/10.1109/sbcci.2013.6644858","mag":"2033769672"},"language":"en","primary_location":{"id":"doi:10.1109/sbcci.2013.6644858","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sbcci.2013.6644858","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 26th Symposium on Integrated Circuits and Systems Design (SBCCI)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003148604","display_name":"Juan Pablo Mart\u00ednez Brito","orcid":"https://orcid.org/0000-0002-7417-659X"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Juan Pablo Martinez Brito","raw_affiliation_strings":["CEITEC-SA Semiconductors, Porto Alegre, Brazil","CEITEC-SA Semicond., Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"CEITEC-SA Semiconductors, Porto Alegre, Brazil","institution_ids":[]},{"raw_affiliation_string":"CEITEC-SA Semicond., Porto Alegre, Brazil","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000899574","display_name":"Alain Rabaeijs","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Alain Rabaeijs","raw_affiliation_strings":["CEITEC-SA Semiconductors, Porto Alegre, Brazil","CEITEC-SA Semicond., Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"CEITEC-SA Semiconductors, Porto Alegre, Brazil","institution_ids":[]},{"raw_affiliation_string":"CEITEC-SA Semicond., Porto Alegre, Brazil","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5003148604"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2364,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.60037583,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"22","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11392","display_name":"Energy Harvesting in Wireless Networks","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11392","display_name":"Energy Harvesting in Wireless Networks","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9901000261306763,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.8469827175140381},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.690894365310669},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.6293644905090332},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5348109006881714},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4658990800380707},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.44320785999298096},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.43946966528892517},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33733272552490234},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3346100449562073},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07302165031433105}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.8469827175140381},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.690894365310669},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.6293644905090332},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5348109006881714},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4658990800380707},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.44320785999298096},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.43946966528892517},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33733272552490234},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3346100449562073},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07302165031433105},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sbcci.2013.6644858","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sbcci.2013.6644858","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 26th Symposium on Integrated Circuits and Systems Design (SBCCI)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7799999713897705}],"awards":[],"funders":[{"id":"https://openalex.org/F4320323870","display_name":"Central European Institute of Technology","ror":"https://ror.org/01p7k1986"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W81374453","https://openalex.org/W1479972308","https://openalex.org/W1982026919","https://openalex.org/W1985892360","https://openalex.org/W2039333700","https://openalex.org/W2045303111","https://openalex.org/W2055944305","https://openalex.org/W2061704654","https://openalex.org/W2064189791","https://openalex.org/W2102783565","https://openalex.org/W2107271589","https://openalex.org/W2108923470","https://openalex.org/W2118198953","https://openalex.org/W2123516803","https://openalex.org/W2124217950","https://openalex.org/W2124899616","https://openalex.org/W2126036714","https://openalex.org/W2136600361","https://openalex.org/W2138935288","https://openalex.org/W2147495308","https://openalex.org/W2149483010","https://openalex.org/W2159263848","https://openalex.org/W2160710178","https://openalex.org/W2162875321","https://openalex.org/W2163523513","https://openalex.org/W2165613379","https://openalex.org/W2171950777","https://openalex.org/W2589569398","https://openalex.org/W4247586331","https://openalex.org/W4285719527","https://openalex.org/W6662005105","https://openalex.org/W6665802445","https://openalex.org/W6675747943","https://openalex.org/W6678501734"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4386230336","https://openalex.org/W4306968100","https://openalex.org/W2109445684","https://openalex.org/W2081082331","https://openalex.org/W2507745370","https://openalex.org/W2889599805","https://openalex.org/W4318601828"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3],"overview":[4],"of":[5,27,59],"the":[6,25],"capabilities":[7],"and":[8,45,54,79],"different":[9],"architectures":[10],"for":[11,24],"integrated":[12],"temperature":[13,28,43,50,70],"sensors":[14,29],"in":[15,30,73],"RFID":[16,31],"tags":[17,32],"using":[18],"CMOS":[19,75],"technology.":[20],"A":[21],"feasibility":[22],"study":[23,36],"integration":[26],"is":[33,77],"described.":[34],"The":[35],"focuses":[37],"on":[38,64],"four":[39],"topologies":[40],"to":[41,68],"make":[42],"measurements":[44],"compare":[46],"them":[47],"regarding":[48],"power,":[49],"range,":[51],"accuracy,":[52],"resolution":[53],"technology":[55,76],"node.":[56],"Measurement":[57],"results":[58],"a":[60,65],"test":[61],"structure":[62],"based":[63],"potential":[66],"proportional":[67],"absolute":[69],"(Vptat)":[71],"fabricated":[72],"deep-submicron":[74],"presented":[78],"discussed.":[80]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}