{"id":"https://openalex.org/W1482070616","doi":"https://doi.org/10.1109/sas.2015.7133599","title":"Theoretical modeling of an electrostatic Gas-Path debris detection system with experimental validation","display_name":"Theoretical modeling of an electrostatic Gas-Path debris detection system with experimental validation","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1482070616","doi":"https://doi.org/10.1109/sas.2015.7133599","mag":"1482070616"},"language":"en","primary_location":{"id":"doi:10.1109/sas.2015.7133599","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sas.2015.7133599","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Sensors Applications Symposium (SAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008376177","display_name":"Tommaso Addabbo","orcid":"https://orcid.org/0000-0003-0168-9404"},"institutions":[{"id":"https://openalex.org/I102064193","display_name":"University of Siena","ror":"https://ror.org/01tevnk56","country_code":"IT","type":"education","lineage":["https://openalex.org/I102064193"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"T. Addabbo","raw_affiliation_strings":["Dept. of Information Engineering and Mathematics, University of Siena, Siena, Italy","Department of Information Engineering and Mathematics, University of Siena, Via Roma 56, Siena, Italy"],"affiliations":[{"raw_affiliation_string":"Dept. of Information Engineering and Mathematics, University of Siena, Siena, Italy","institution_ids":["https://openalex.org/I102064193"]},{"raw_affiliation_string":"Department of Information Engineering and Mathematics, University of Siena, Via Roma 56, Siena, Italy","institution_ids":["https://openalex.org/I102064193"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011072460","display_name":"Ada Fort","orcid":"https://orcid.org/0000-0003-0916-1516"},"institutions":[{"id":"https://openalex.org/I102064193","display_name":"University of Siena","ror":"https://ror.org/01tevnk56","country_code":"IT","type":"education","lineage":["https://openalex.org/I102064193"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Fort","raw_affiliation_strings":["Dept. of Information Engineering and Mathematics, University of Siena, Siena, Italy","Department of Information Engineering and Mathematics, University of Siena, Via Roma 56, Siena, Italy"],"affiliations":[{"raw_affiliation_string":"Dept. of Information Engineering and Mathematics, University of Siena, Siena, Italy","institution_ids":["https://openalex.org/I102064193"]},{"raw_affiliation_string":"Department of Information Engineering and Mathematics, University of Siena, Via Roma 56, Siena, Italy","institution_ids":["https://openalex.org/I102064193"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076956231","display_name":"Marco Mugnaini","orcid":"https://orcid.org/0000-0002-2410-1581"},"institutions":[{"id":"https://openalex.org/I102064193","display_name":"University of Siena","ror":"https://ror.org/01tevnk56","country_code":"IT","type":"education","lineage":["https://openalex.org/I102064193"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Mugnaini","raw_affiliation_strings":["Dept. of Information Engineering and Mathematics, University of Siena, Siena, Italy","Department of Information Engineering and Mathematics, University of Siena, Via Roma 56, Siena, Italy"],"affiliations":[{"raw_affiliation_string":"Dept. of Information Engineering and Mathematics, University of Siena, Siena, Italy","institution_ids":["https://openalex.org/I102064193"]},{"raw_affiliation_string":"Department of Information Engineering and Mathematics, University of Siena, Via Roma 56, Siena, Italy","institution_ids":["https://openalex.org/I102064193"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037997327","display_name":"S. Rocchi","orcid":"https://orcid.org/0000-0002-0076-1489"},"institutions":[{"id":"https://openalex.org/I102064193","display_name":"University of Siena","ror":"https://ror.org/01tevnk56","country_code":"IT","type":"education","lineage":["https://openalex.org/I102064193"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. Rocchi","raw_affiliation_strings":["Dept. of Information Engineering and Mathematics, University of Siena, Siena, Italy","Department of Information Engineering and Mathematics, University of Siena, Via Roma 56, Siena, Italy"],"affiliations":[{"raw_affiliation_string":"Dept. of Information Engineering and Mathematics, University of Siena, Siena, Italy","institution_ids":["https://openalex.org/I102064193"]},{"raw_affiliation_string":"Department of Information Engineering and Mathematics, University of Siena, Via Roma 56, Siena, Italy","institution_ids":["https://openalex.org/I102064193"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006110526","display_name":"Valerio Vignoli","orcid":"https://orcid.org/0000-0003-2509-6566"},"institutions":[{"id":"https://openalex.org/I102064193","display_name":"University of Siena","ror":"https://ror.org/01tevnk56","country_code":"IT","type":"education","lineage":["https://openalex.org/I102064193"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"V. Vignoli","raw_affiliation_strings":["Dept. of Information Engineering and Mathematics, University of Siena, Siena, Italy","Department of Information Engineering and Mathematics, University of Siena, Via Roma 56, Siena, Italy"],"affiliations":[{"raw_affiliation_string":"Dept. of Information Engineering and Mathematics, University of Siena, Siena, Italy","institution_ids":["https://openalex.org/I102064193"]},{"raw_affiliation_string":"Department of Information Engineering and Mathematics, University of Siena, Via Roma 56, Siena, Italy","institution_ids":["https://openalex.org/I102064193"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051725531","display_name":"Riccardo Garbin","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R. Garbin","raw_affiliation_strings":["GE Oil & Gas Nuovo Pignone, Florence, Italy","GE Oil & Gas Nuovo Pignone Via Felice Matteucci, 2 - Florence, Italy"],"affiliations":[{"raw_affiliation_string":"GE Oil & Gas Nuovo Pignone, Florence, Italy","institution_ids":[]},{"raw_affiliation_string":"GE Oil & Gas Nuovo Pignone Via Felice Matteucci, 2 - Florence, Italy","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5008376177"],"corresponding_institution_ids":["https://openalex.org/I102064193"],"apc_list":null,"apc_paid":null,"fwci":0.7891,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.74825083,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9886999726295471,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.965499997138977,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debris","display_name":"Debris","score":0.6500024795532227},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.6427204608917236},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5781302452087402},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.5424547791481018},{"id":"https://openalex.org/keywords/electrostatics","display_name":"Electrostatics","score":0.4423831105232239},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.43002721667289734},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4232843518257141},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41894322633743286},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3263135850429535},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2992165684700012},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2847036123275757},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21665534377098083},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09049016237258911}],"concepts":[{"id":"https://openalex.org/C2776023875","wikidata":"https://www.wikidata.org/wiki/Q637703","display_name":"Debris","level":2,"score":0.6500024795532227},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.6427204608917236},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5781302452087402},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.5424547791481018},{"id":"https://openalex.org/C117626034","wikidata":"https://www.wikidata.org/wiki/Q26336","display_name":"Electrostatics","level":2,"score":0.4423831105232239},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.43002721667289734},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4232843518257141},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41894322633743286},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3263135850429535},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2992165684700012},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2847036123275757},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21665534377098083},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09049016237258911},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/sas.2015.7133599","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sas.2015.7133599","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Sensors Applications Symposium (SAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:usiena-air.unisi.it:11365/982025","is_oa":false,"landing_page_url":"http://hdl.handle.net/11365/982025","pdf_url":null,"source":{"id":"https://openalex.org/S4377196319","display_name":"Use Siena air (University of Siena)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I102064193","host_organization_name":"University of Siena","host_organization_lineage":["https://openalex.org/I102064193"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W28676210","https://openalex.org/W251984974","https://openalex.org/W285953880","https://openalex.org/W291474709","https://openalex.org/W1548122905","https://openalex.org/W1990154858","https://openalex.org/W1990944991","https://openalex.org/W1991329286","https://openalex.org/W2008380808","https://openalex.org/W2012481039","https://openalex.org/W2034820728","https://openalex.org/W2037207739","https://openalex.org/W2038445170","https://openalex.org/W2053551788","https://openalex.org/W2065508631","https://openalex.org/W2074776739","https://openalex.org/W2079043827","https://openalex.org/W2084651091","https://openalex.org/W2106338971","https://openalex.org/W2113620996","https://openalex.org/W2124479342","https://openalex.org/W2128201718","https://openalex.org/W2142511518","https://openalex.org/W2144835948","https://openalex.org/W6601138927","https://openalex.org/W6610373867","https://openalex.org/W6653367076"],"related_works":["https://openalex.org/W3132053202","https://openalex.org/W3011362029","https://openalex.org/W3096343057","https://openalex.org/W2361023120","https://openalex.org/W129933923","https://openalex.org/W3014109425","https://openalex.org/W2080580906","https://openalex.org/W4292338037","https://openalex.org/W2913486304","https://openalex.org/W2322660418"],"abstract_inverted_index":{"We":[0,20],"discuss":[1],"the":[2,22,26,31,35,39,42,46,49],"general":[3],"theoretical":[4],"characterization":[5],"of":[6,25,41,48],"a":[7],"Gas-Path":[8],"debris":[9,33],"detection":[10],"monitoring":[11],"system":[12],"based":[13],"on":[14,34,45],"electrostatic":[15],"sensors":[16],"and":[17],"charge":[18,28],"amplifiers.":[19],"provide":[21],"analytical":[23],"expression":[24],"time-varying":[27],"induced":[29],"by":[30],"moving":[32],"sensor":[36],"surface,":[37],"discussing":[38],"effects":[40],"amplifier":[43],"bandwidth":[44],"shape":[47],"output":[50],"voltage":[51],"signal.":[52],"Theoretical":[53],"results":[54],"have":[55],"been":[56],"validated":[57],"with":[58],"experiments.":[59]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}