{"id":"https://openalex.org/W2003867701","doi":"https://doi.org/10.1109/sas.2014.6798960","title":"Phase-height relationship by plane analysis in 3D shape measurement using fringe pattern projector","display_name":"Phase-height relationship by plane analysis in 3D shape measurement using fringe pattern projector","publication_year":2014,"publication_date":"2014-02-01","ids":{"openalex":"https://openalex.org/W2003867701","doi":"https://doi.org/10.1109/sas.2014.6798960","mag":"2003867701"},"language":"en","primary_location":{"id":"doi:10.1109/sas.2014.6798960","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sas.2014.6798960","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Sensors Applications Symposium (SAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068788722","display_name":"Byeong-Mook Chung","orcid":null},"institutions":[{"id":"https://openalex.org/I55240360","display_name":"Yeungnam University","ror":"https://ror.org/05yc6p159","country_code":"KR","type":"education","lineage":["https://openalex.org/I55240360"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Byeong-Mook Chung","raw_affiliation_strings":["School of Mechanical Eng., Yeungnam University, Gyeongsan, South Korea","Sch. of Mech. Eng., Yeungnam Univ., Gyeongsan, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Eng., Yeungnam University, Gyeongsan, South Korea","institution_ids":["https://openalex.org/I55240360"]},{"raw_affiliation_string":"Sch. of Mech. Eng., Yeungnam Univ., Gyeongsan, South Korea","institution_ids":["https://openalex.org/I55240360"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081601318","display_name":"Yoon-Chang Park","orcid":null},"institutions":[{"id":"https://openalex.org/I51926615","display_name":"Sun Moon University","ror":"https://ror.org/009e5cd49","country_code":"KR","type":"education","lineage":["https://openalex.org/I51926615"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yoon-Chang Park","raw_affiliation_strings":["Department of Infor. & Com. Eng., Sunmoon University, Asan, South Korea","Dept. of Infor. & Com. Eng., Sunmoon Univ., Asan, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Infor. & Com. Eng., Sunmoon University, Asan, South Korea","institution_ids":["https://openalex.org/I51926615"]},{"raw_affiliation_string":"Dept. of Infor. & Com. Eng., Sunmoon Univ., Asan, South Korea","institution_ids":["https://openalex.org/I51926615"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012397718","display_name":"Jin-Yeong Do","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111091","display_name":"Daegu TechnoPark","ror":"https://ror.org/01zh21529","country_code":"KR","type":"archive","lineage":["https://openalex.org/I4210111091"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jin-Yeong Do","raw_affiliation_strings":["R & D Center AVACO Co., Ltd, Daegu, South Korea","R&D Center, AVACO Co., Ltd., Daegu, South Korea"],"affiliations":[{"raw_affiliation_string":"R & D Center AVACO Co., Ltd, Daegu, South Korea","institution_ids":["https://openalex.org/I4210111091"]},{"raw_affiliation_string":"R&D Center, AVACO Co., Ltd., Daegu, South Korea","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5068788722"],"corresponding_institution_ids":["https://openalex.org/I55240360"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.07760703,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"272","last_page":"277"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/projector","display_name":"Projector","score":0.8670263290405273},{"id":"https://openalex.org/keywords/plane","display_name":"Plane (geometry)","score":0.6812999248504639},{"id":"https://openalex.org/keywords/image-plane","display_name":"Image plane","score":0.588308572769165},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.5631722211837769},{"id":"https://openalex.org/keywords/structured-light-3d-scanner","display_name":"Structured-light 3D scanner","score":0.5361461639404297},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.5149034261703491},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4403141438961029},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.4361996054649353},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3972531855106354},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.36857548356056213},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3665618300437927},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.33943384885787964},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.30953794717788696},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.2723442316055298},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22238829731941223}],"concepts":[{"id":"https://openalex.org/C2776865275","wikidata":"https://www.wikidata.org/wiki/Q311666","display_name":"Projector","level":2,"score":0.8670263290405273},{"id":"https://openalex.org/C17825722","wikidata":"https://www.wikidata.org/wiki/Q17285","display_name":"Plane (geometry)","level":2,"score":0.6812999248504639},{"id":"https://openalex.org/C120515352","wikidata":"https://www.wikidata.org/wiki/Q2564580","display_name":"Image plane","level":3,"score":0.588308572769165},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.5631722211837769},{"id":"https://openalex.org/C184577583","wikidata":"https://www.wikidata.org/wiki/Q1485537","display_name":"Structured-light 3D scanner","level":3,"score":0.5361461639404297},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.5149034261703491},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4403141438961029},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.4361996054649353},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3972531855106354},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.36857548356056213},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3665618300437927},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.33943384885787964},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.30953794717788696},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.2723442316055298},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22238829731941223},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sas.2014.6798960","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sas.2014.6798960","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Sensors Applications Symposium (SAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","score":0.6899999976158142,"id":"https://metadata.un.org/sdg/11"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321380","display_name":"Yeungnam University","ror":"https://ror.org/05yc6p159"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1979902902","https://openalex.org/W2000290695","https://openalex.org/W2021098540","https://openalex.org/W2035737735","https://openalex.org/W2045222221","https://openalex.org/W2048620148","https://openalex.org/W2050575514","https://openalex.org/W2058710124","https://openalex.org/W2062285348","https://openalex.org/W2066642144","https://openalex.org/W2074371610","https://openalex.org/W2079885867","https://openalex.org/W2087487299","https://openalex.org/W2088075533","https://openalex.org/W2099713545","https://openalex.org/W2100716706","https://openalex.org/W2138428607","https://openalex.org/W2148783195","https://openalex.org/W2162460163","https://openalex.org/W2167536595"],"related_works":["https://openalex.org/W2043684885","https://openalex.org/W2604381042","https://openalex.org/W2029756664","https://openalex.org/W2911038112","https://openalex.org/W2751204429","https://openalex.org/W2947923341","https://openalex.org/W2512159635","https://openalex.org/W2624775032","https://openalex.org/W2884903798","https://openalex.org/W2036531457"],"abstract_inverted_index":{"In":[0],"a":[1,7,14,16,33,114],"three-dimensional(3-D)":[2],"measurement":[3,30],"system":[4],"based":[5,22],"on":[6,23,79,120],"digital":[8],"light":[9],"processing":[10],"(DLP)":[11],"projector":[12,76],"and":[13,43,60,82,104],"camera,":[15],"height":[17,106],"estimating":[18],"function":[19],"is":[20,32,89,111],"proposed":[21,27,179],"geometric":[24,39],"analysis.":[25],"The":[26,150],"3-D":[28,126,191],"shape":[29,127],"method":[31,35,42,49,180],"hybrid":[34],"that":[36,137],"combines":[37],"the":[38,44,51,61,67,75,80,83,86,92,96,99,105,108,117,121,125,129,138,142,153,166,171,175,178,184],"parameter":[40,115],"measuring":[41,87,109],"least":[45,68],"squares":[46,69],"method.":[47,70],"This":[48],"uses":[50],"phase-to-height":[52],"relationship":[53,97],"for":[54,141,152,190],"one":[55],"line":[56],"by":[57,101,160],"plane":[58,145,162,168],"analysis,":[59],"related":[62],"parameters":[63],"are":[64,77,146,173],"estimated":[65],"using":[66],"Sinusoidal":[71],"fringe":[72,102],"patterns":[73,103],"of":[74,85,107,116,128,186],"projected":[78],"object,":[81],"phase":[84,100],"point":[88,110],"calculated":[90],"from":[91],"camera":[93],"image.":[94],"Then,":[95],"between":[98],"described":[112],"as":[113],"horizontal":[118],"coordinate":[119],"image":[122],"plane.":[123],"Thus,":[124],"object":[130],"can":[131,157,181],"be":[132,158],"obtained.":[133],"Our":[134],"experiments":[135],"show":[136],"modeling":[139],"errors":[140],"given":[143],"x-z":[144,167],"within":[147],"\u00b10.1":[148],"mm.":[149],"model":[151],"entire":[154],"working":[155],"space":[156],"represented":[159],"several":[161],"models":[163,169],"because":[164],"all":[165],"along":[170],"y-axis":[172],"nearly":[174],"same.":[176],"Therefore,":[177],"dramatically":[182],"reduce":[183],"number":[185],"mapping":[187],"functions":[188],"needed":[189],"measurement.":[192]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}