{"id":"https://openalex.org/W2002047341","doi":"https://doi.org/10.1109/sas.2014.6798928","title":"High-resolution measurement of magnetic field generated from cryptographic LSIs","display_name":"High-resolution measurement of magnetic field generated from cryptographic LSIs","publication_year":2014,"publication_date":"2014-02-01","ids":{"openalex":"https://openalex.org/W2002047341","doi":"https://doi.org/10.1109/sas.2014.6798928","mag":"2002047341"},"language":"en","primary_location":{"id":"doi:10.1109/sas.2014.6798928","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sas.2014.6798928","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Sensors Applications Symposium (SAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053428546","display_name":"Nguyen Ngoc Mai-Khanh","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nguyen Ngoc Mai-Khanh","raw_affiliation_strings":["VLSI Design and Education Center (VDEC), University of Tokyo, Tokyo, Japan","[VLSI Design and Education Center (VDEC), University of Tokyo, Tokyo, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VLSI Design and Education Center (VDEC), University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"[VLSI Design and Education Center (VDEC), University of Tokyo, Tokyo, Japan]","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007028121","display_name":"Tetsuya Iizuka","orcid":"https://orcid.org/0000-0002-1512-4714"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuya Iizuka","raw_affiliation_strings":["Dept. of Electrical Engineering, University of Tokyo, Tokyo, Japan","Dept. of Electr. Eng., Univ. of Tokyo, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007249451","display_name":"Akihiko Sasaki","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Akihiko Sasaki","raw_affiliation_strings":["Kawasaki, Morita-Tech Co., Ltd, Kanagawa, Japan","Morita-Tech Co., Ltd., Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kawasaki, Morita-Tech Co., Ltd, Kanagawa, Japan","institution_ids":[]},{"raw_affiliation_string":"Morita-Tech Co., Ltd., Kawasaki, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047215210","display_name":"Makoto Yamada","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Makoto Yamada","raw_affiliation_strings":["Kawasaki, Morita-Tech Co., Ltd, Kanagawa, Japan","Morita-Tech Co., Ltd., Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kawasaki, Morita-Tech Co., Ltd, Kanagawa, Japan","institution_ids":[]},{"raw_affiliation_string":"Morita-Tech Co., Ltd., Kawasaki, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110712217","display_name":"Osamu Morita","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Osamu Morita","raw_affiliation_strings":["Kawasaki, Morita-Tech Co., Ltd, Kanagawa, Japan","Morita-Tech Co., Ltd., Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kawasaki, Morita-Tech Co., Ltd, Kanagawa, Japan","institution_ids":[]},{"raw_affiliation_string":"Morita-Tech Co., Ltd., Kawasaki, Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028680447","display_name":"Kunihiro Asada","orcid":"https://orcid.org/0000-0002-1150-0241"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kunihiro Asada","raw_affiliation_strings":["VLSI Design and Education Center (VDEC), University of Tokyo, Tokyo, Japan","[VLSI Design and Education Center (VDEC), University of Tokyo, Tokyo, Japan]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VLSI Design and Education Center (VDEC), University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"[VLSI Design and Education Center (VDEC), University of Tokyo, Tokyo, Japan]","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2129,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.5825382,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"111","last_page":"114"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-coil","display_name":"Electromagnetic coil","score":0.7051257491111755},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5437494516372681},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.49726608395576477},{"id":"https://openalex.org/keywords/shielded-cable","display_name":"Shielded cable","score":0.4952060282230377},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4889000952243805},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4666127562522888},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.45245110988616943},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.4326021671295166},{"id":"https://openalex.org/keywords/magnetometer","display_name":"Magnetometer","score":0.42276132106781006},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3847631514072418},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37611567974090576},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.34445273876190186},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3264444172382355},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28047874569892883},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2534116506576538}],"concepts":[{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.7051257491111755},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5437494516372681},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.49726608395576477},{"id":"https://openalex.org/C77590175","wikidata":"https://www.wikidata.org/wiki/Q3506009","display_name":"Shielded cable","level":2,"score":0.4952060282230377},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4889000952243805},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4666127562522888},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.45245110988616943},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.4326021671295166},{"id":"https://openalex.org/C153946474","wikidata":"https://www.wikidata.org/wiki/Q333921","display_name":"Magnetometer","level":3,"score":0.42276132106781006},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3847631514072418},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37611567974090576},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.34445273876190186},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3264444172382355},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28047874569892883},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2534116506576538},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sas.2014.6798928","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sas.2014.6798928","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Sensors Applications Symposium (SAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320309545","display_name":"Synopsys","ror":"https://ror.org/013by2m91"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1511843316","https://openalex.org/W1519539754","https://openalex.org/W2091902715","https://openalex.org/W2096830735","https://openalex.org/W2103519941","https://openalex.org/W2136720693","https://openalex.org/W2139356817","https://openalex.org/W2163432699","https://openalex.org/W2170575992","https://openalex.org/W2198765151","https://openalex.org/W3007577828","https://openalex.org/W3150817275","https://openalex.org/W6630620868","https://openalex.org/W6631075134","https://openalex.org/W6773835464"],"related_works":["https://openalex.org/W3173581336","https://openalex.org/W2366276516","https://openalex.org/W2383534917","https://openalex.org/W1679767655","https://openalex.org/W4320725296","https://openalex.org/W2369647243","https://openalex.org/W4296476671","https://openalex.org/W4311032306","https://openalex.org/W1544800845","https://openalex.org/W2011467983"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,25,49,63,70,74,79,82],"high-resolution":[4],"magnetic":[5,27,59,92],"measurement":[6,86],"for":[7],"detecting":[8],"vulnerable":[9],"and":[10,73,98],"suspicious":[11],"areas":[12],"on":[13,68],"cryptography":[14,75],"LSI":[15],"chips.":[16],"A":[17],"CMOS":[18],"3-stage":[19],"low-noise":[20],"amplifier":[21],"is":[22,45],"integrated":[23],"with":[24,81],"500-\u03bcm\u00d7100-\u03bcm":[26],"pick-up":[28],"coil":[29,44],"to":[30,52],"amplify":[31],"the":[32,36,39,43,54,88],"induced":[33],"voltage":[34],"of":[35],"coil.":[37],"Moreover,":[38],"Si-substrate":[40],"area":[41],"underneath":[42],"removed":[46],"by":[47],"applying":[48],"Focused-Ion-Beam":[50],"technique":[51],"enhance":[53],"coil's":[55],"performance.":[56],"High":[57],"resolution":[58],"scanning":[60],"measurements":[61],"in":[62,94],"shielded":[64],"box":[65],"are":[66],"performed":[67],"both":[69],"micro-strip":[71],"line":[72],"LSI.":[76],"By":[77],"making":[78],"comparison":[80],"commercial":[83],"probe,":[84],"this":[85],"holds":[87],"advantage":[89],"that":[90],"higher-resolution":[91],"maps":[93],"multiple":[95],"frequency":[96],"bands":[97],"more":[99],"revealed":[100],"information":[101],"can":[102],"be":[103],"achieved.":[104]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}