{"id":"https://openalex.org/W2079531190","doi":"https://doi.org/10.1109/sas.2014.6798925","title":"Probabilistic method to determine human subjects for low-resolution thermal imaging sensor","display_name":"Probabilistic method to determine human subjects for low-resolution thermal imaging sensor","publication_year":2014,"publication_date":"2014-02-01","ids":{"openalex":"https://openalex.org/W2079531190","doi":"https://doi.org/10.1109/sas.2014.6798925","mag":"2079531190"},"language":"en","primary_location":{"id":"doi:10.1109/sas.2014.6798925","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sas.2014.6798925","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Sensors Applications Symposium (SAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102133093","display_name":"Yongwoo Jeong","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Yongwoo Jeong","raw_affiliation_strings":["Applied Thermal Imaging Lab Samsung S1 Corporation Seoul, South Korea","Appl. Thermal Imaging Lab., Samsung S1 Corp., Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Applied Thermal Imaging Lab Samsung S1 Corporation Seoul, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Appl. Thermal Imaging Lab., Samsung S1 Corp., Seoul, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076450715","display_name":"Kwanwoo Yoon","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kwanwoo Yoon","raw_affiliation_strings":["Applied Thermal Imaging Lab Samsung S1 Corporation Seoul, South Korea","Appl. Thermal Imaging Lab., Samsung S1 Corp., Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Applied Thermal Imaging Lab Samsung S1 Corporation Seoul, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Appl. Thermal Imaging Lab., Samsung S1 Corp., Seoul, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087793020","display_name":"KyoungHo Joung","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"KyoungHo Joung","raw_affiliation_strings":["Applied Thermal Imaging Lab Samsung S1 Corporation Seoul, South Korea","Appl. Thermal Imaging Lab., Samsung S1 Corp., Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Applied Thermal Imaging Lab Samsung S1 Corporation Seoul, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Appl. Thermal Imaging Lab., Samsung S1 Corp., Seoul, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5102133093"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":0.8098,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.81607409,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"97","last_page":"102"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10331","display_name":"Video Surveillance and Tracking Methods","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12994","display_name":"Infrared Thermography in Medicine","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.7568538784980774},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7470762729644775},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6860396265983582},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6243268251419067},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.6150194406509399},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.6055598855018616},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.5398733615875244},{"id":"https://openalex.org/keywords/gaussian","display_name":"Gaussian","score":0.5088294148445129},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.5003979206085205},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.4931604266166687},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.4915705621242523},{"id":"https://openalex.org/keywords/tracking","display_name":"Tracking (education)","score":0.48220789432525635},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4243248701095581},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19305524230003357},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11918526887893677},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07102030515670776}],"concepts":[{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.7568538784980774},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7470762729644775},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6860396265983582},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6243268251419067},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6150194406509399},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.6055598855018616},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.5398733615875244},{"id":"https://openalex.org/C163716315","wikidata":"https://www.wikidata.org/wiki/Q901177","display_name":"Gaussian","level":2,"score":0.5088294148445129},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.5003979206085205},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.4931604266166687},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.4915705621242523},{"id":"https://openalex.org/C2775936607","wikidata":"https://www.wikidata.org/wiki/Q466845","display_name":"Tracking (education)","level":2,"score":0.48220789432525635},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4243248701095581},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19305524230003357},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11918526887893677},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07102030515670776},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C19417346","wikidata":"https://www.wikidata.org/wiki/Q7922","display_name":"Pedagogy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/sas.2014.6798925","is_oa":false,"landing_page_url":"https://doi.org/10.1109/sas.2014.6798925","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Sensors Applications Symposium (SAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1592674021","https://openalex.org/W1964376493","https://openalex.org/W1992825118","https://openalex.org/W2055787765","https://openalex.org/W2114486396","https://openalex.org/W2119401053","https://openalex.org/W2146064909","https://openalex.org/W2158295905","https://openalex.org/W3151111735","https://openalex.org/W6677010739","https://openalex.org/W6677830517"],"related_works":["https://openalex.org/W2085033728","https://openalex.org/W4285411112","https://openalex.org/W2171299904","https://openalex.org/W4252337044","https://openalex.org/W118630527","https://openalex.org/W2614621130","https://openalex.org/W4289655544","https://openalex.org/W2044092692","https://openalex.org/W2547665164","https://openalex.org/W3103111272"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"we":[3],"present":[4],"a":[5,12,53,79],"method":[6],"of":[7,21,36,67],"determining":[8],"human":[9,37,60],"subjects":[10,38,61],"via":[11],"low-resolution":[13,23],"thermal":[14,24],"imaging":[15,25],"sensor.":[16],"Since":[17],"the":[18,22],"image":[19],"quality":[20],"sensor":[26],"could":[27],"be":[28,42,63,92],"suffering":[29],"from":[30],"heat":[31],"signatures":[32],"and":[33,78,87,103],"recognizable":[34],"patterns":[35],"are":[39],"unable":[40],"to":[41,45,51],"determined":[43],"due":[44],"resolution":[46],"issues,":[47],"it":[48],"is":[49],"recommended":[50],"employ":[52],"probabilistic":[54],"method.":[55],"This":[56],"paper":[57],"presents":[58],"how":[59],"can":[62],"expressed":[64],"in":[65],"terms":[66],"pixel":[68],"size,":[69],"standard":[70],"deviation,":[71],"label":[72,76],"movement,":[73],"vector":[74],"tracking,":[75],"lifetime":[77],"rewarding":[80],"system":[81],"based":[82],"on":[83],"those.":[84],"Various":[85],"pre":[86],"post-image":[88],"processing":[89],"methods":[90],"will":[91],"covered":[93],"including":[94],"background":[95,104],"collection,":[96],"Gaussian":[97],"filtering,":[98],"segmentation,":[99],"local/global":[100],"adaptive":[101],"threshold":[102],"learning.":[105]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":4},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}