{"id":"https://openalex.org/W1964653892","doi":"https://doi.org/10.1109/samos.2013.6621126","title":"Compiler-aided methodology for low overhead on-line testing","display_name":"Compiler-aided methodology for low overhead on-line testing","publication_year":2013,"publication_date":"2013-07-01","ids":{"openalex":"https://openalex.org/W1964653892","doi":"https://doi.org/10.1109/samos.2013.6621126","mag":"1964653892"},"language":"en","primary_location":{"id":"doi:10.1109/samos.2013.6621126","is_oa":false,"landing_page_url":"https://doi.org/10.1109/samos.2013.6621126","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://publications.lib.chalmers.se/records/fulltext/188281/local_188281.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086441373","display_name":"Ghazaleh Nazarian","orcid":null},"institutions":[{"id":"https://openalex.org/I2801952686","display_name":"Erasmus MC","ror":"https://ror.org/018906e22","country_code":"NL","type":"funder","lineage":["https://openalex.org/I2801952686"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Ghazaleh Nazarian","raw_affiliation_strings":["Department of Neuroscience, Erasmus MC, Faculty of Electrical Engineering, Mathematics and Computer Science, Delft University of Technology, Delft, Netherlands","Comput. Sci., Delft Univ. of Technol., Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Department of Neuroscience, Erasmus MC, Faculty of Electrical Engineering, Mathematics and Computer Science, Delft University of Technology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874","https://openalex.org/I2801952686"]},{"raw_affiliation_string":"Comput. Sci., Delft Univ. of Technol., Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007409439","display_name":"Robert M. Seepers","orcid":"https://orcid.org/0000-0002-9510-7323"},"institutions":[{"id":"https://openalex.org/I2801952686","display_name":"Erasmus MC","ror":"https://ror.org/018906e22","country_code":"NL","type":"funder","lineage":["https://openalex.org/I2801952686"]},{"id":"https://openalex.org/I913958620","display_name":"Erasmus University Rotterdam","ror":"https://ror.org/057w15z03","country_code":"NL","type":"education","lineage":["https://openalex.org/I913958620"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Robert M. Seepers","raw_affiliation_strings":["Department of Neuroscience, Erasmus MC, Rotterdam, Netherlands","Dept. of Neurosci., Erasmus MC, Rotterdam, Netherlands"],"affiliations":[{"raw_affiliation_string":"Department of Neuroscience, Erasmus MC, Rotterdam, Netherlands","institution_ids":["https://openalex.org/I913958620","https://openalex.org/I2801952686"]},{"raw_affiliation_string":"Dept. of Neurosci., Erasmus MC, Rotterdam, Netherlands","institution_ids":["https://openalex.org/I913958620"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077785373","display_name":"Christos Strydis","orcid":"https://orcid.org/0000-0002-0935-9322"},"institutions":[{"id":"https://openalex.org/I2801952686","display_name":"Erasmus MC","ror":"https://ror.org/018906e22","country_code":"NL","type":"funder","lineage":["https://openalex.org/I2801952686"]},{"id":"https://openalex.org/I913958620","display_name":"Erasmus University Rotterdam","ror":"https://ror.org/057w15z03","country_code":"NL","type":"education","lineage":["https://openalex.org/I913958620"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Christos Strydis","raw_affiliation_strings":["Department of Neuroscience, Erasmus MC, Rotterdam, Netherlands","Dept. of Neurosci., Erasmus MC, Rotterdam, Netherlands"],"affiliations":[{"raw_affiliation_string":"Department of Neuroscience, Erasmus MC, Rotterdam, Netherlands","institution_ids":["https://openalex.org/I913958620","https://openalex.org/I2801952686"]},{"raw_affiliation_string":"Dept. of Neurosci., Erasmus MC, Rotterdam, Netherlands","institution_ids":["https://openalex.org/I913958620"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075050234","display_name":"Georgi Gaydadjiev","orcid":"https://orcid.org/0000-0002-3678-7007"},"institutions":[{"id":"https://openalex.org/I66862912","display_name":"Chalmers University of Technology","ror":"https://ror.org/040wg7k59","country_code":"SE","type":"education","lineage":["https://openalex.org/I66862912"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Georgi N. Gaydadjiev","raw_affiliation_strings":["Chalmers tekniska hogskola, Goteborg, SE","Dept. of Computer Science and Engineering, Chalmers University of Technology, Goteburg, Sweden"],"affiliations":[{"raw_affiliation_string":"Chalmers tekniska hogskola, Goteborg, SE","institution_ids":["https://openalex.org/I66862912"]},{"raw_affiliation_string":"Dept. of Computer Science and Engineering, Chalmers University of Technology, Goteburg, Sweden","institution_ids":["https://openalex.org/I66862912"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5086441373"],"corresponding_institution_ids":["https://openalex.org/I2801952686","https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":0.2402,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.58012322,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"219","last_page":"226"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7709265947341919},{"id":"https://openalex.org/keywords/compiler","display_name":"Compiler","score":0.7404698729515076},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.7307854890823364},{"id":"https://openalex.org/keywords/control-flow-graph","display_name":"Control flow graph","score":0.6782948970794678},{"id":"https://openalex.org/keywords/control-flow","display_name":"Control flow","score":0.5979433655738831},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.566529393196106},{"id":"https://openalex.org/keywords/compile-time","display_name":"Compile time","score":0.5602606534957886},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5124383568763733},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5062702894210815},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4782930016517639},{"id":"https://openalex.org/keywords/optimizing-compiler","display_name":"Optimizing compiler","score":0.45390382409095764},{"id":"https://openalex.org/keywords/data-flow-analysis","display_name":"Data-flow analysis","score":0.43657630681991577},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4358968436717987},{"id":"https://openalex.org/keywords/data-flow-diagram","display_name":"Data flow diagram","score":0.32217705249786377},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.2790139615535736},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2202569544315338},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13059556484222412},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12162399291992188},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.11532828211784363}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7709265947341919},{"id":"https://openalex.org/C169590947","wikidata":"https://www.wikidata.org/wiki/Q47506","display_name":"Compiler","level":2,"score":0.7404698729515076},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.7307854890823364},{"id":"https://openalex.org/C27458966","wikidata":"https://www.wikidata.org/wiki/Q1187693","display_name":"Control flow graph","level":2,"score":0.6782948970794678},{"id":"https://openalex.org/C160191386","wikidata":"https://www.wikidata.org/wiki/Q868299","display_name":"Control flow","level":2,"score":0.5979433655738831},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.566529393196106},{"id":"https://openalex.org/C200833197","wikidata":"https://www.wikidata.org/wiki/Q333707","display_name":"Compile time","level":3,"score":0.5602606534957886},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5124383568763733},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5062702894210815},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4782930016517639},{"id":"https://openalex.org/C190902152","wikidata":"https://www.wikidata.org/wiki/Q1325106","display_name":"Optimizing compiler","level":3,"score":0.45390382409095764},{"id":"https://openalex.org/C88468194","wikidata":"https://www.wikidata.org/wiki/Q1172416","display_name":"Data-flow analysis","level":3,"score":0.43657630681991577},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4358968436717987},{"id":"https://openalex.org/C489000","wikidata":"https://www.wikidata.org/wiki/Q747385","display_name":"Data flow diagram","level":2,"score":0.32217705249786377},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.2790139615535736},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2202569544315338},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13059556484222412},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12162399291992188},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.11532828211784363},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/samos.2013.6621126","is_oa":false,"landing_page_url":"https://doi.org/10.1109/samos.2013.6621126","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS)","raw_type":"proceedings-article"},{"id":"pmh:oai:research.chalmers.se:188281","is_oa":true,"landing_page_url":"https://research.chalmers.se/en/publication/188281","pdf_url":"http://publications.lib.chalmers.se/records/fulltext/188281/local_188281.pdf","source":{"id":"https://openalex.org/S4306402469","display_name":"Chalmers Research (Chalmers University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I66862912","host_organization_name":"Chalmers University of Technology","host_organization_lineage":["https://openalex.org/I66862912"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""},{"id":"pmh:eur:oai:pure.eur.nl:publications/d0f3a986-be96-48c2-abae-9f02e0ed0190","is_oa":false,"landing_page_url":"https://pure.eur.nl/en/publications/d0f3a986-be96-48c2-abae-9f02e0ed0190","pdf_url":null,"source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Proceedings - 2013 International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation, IC-SAMOS 2013, 219 - 226","raw_type":"info:eu-repo/semantics/conferencepaper"},{"id":"pmh:oai:publications.lib.chalmers.se:188281","is_oa":false,"landing_page_url":"http://publications.lib.chalmers.se/publication/188281-compiler-aided-methodology-for-low-overhead-on-line-testing","pdf_url":null,"source":{"id":"https://openalex.org/S4377196470","display_name":"Chalmers Publication Library (Chalmers University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I66862912","host_organization_name":"Chalmers University of Technology","host_organization_lineage":["https://openalex.org/I66862912"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text.Article.Conference.PeerReviewed"}],"best_oa_location":{"id":"pmh:oai:research.chalmers.se:188281","is_oa":true,"landing_page_url":"https://research.chalmers.se/en/publication/188281","pdf_url":"http://publications.lib.chalmers.se/records/fulltext/188281/local_188281.pdf","source":{"id":"https://openalex.org/S4306402469","display_name":"Chalmers Research (Chalmers University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I66862912","host_organization_name":"Chalmers University of Technology","host_organization_lineage":["https://openalex.org/I66862912"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1964653892.pdf","grobid_xml":"https://content.openalex.org/works/W1964653892.grobid-xml"},"referenced_works_count":22,"referenced_works":["https://openalex.org/W1547528813","https://openalex.org/W1866736315","https://openalex.org/W1981514768","https://openalex.org/W2034593585","https://openalex.org/W2050304880","https://openalex.org/W2096641229","https://openalex.org/W2108557605","https://openalex.org/W2116991991","https://openalex.org/W2121374091","https://openalex.org/W2123331260","https://openalex.org/W2130189691","https://openalex.org/W2135123845","https://openalex.org/W2145930995","https://openalex.org/W2152125017","https://openalex.org/W2153295660","https://openalex.org/W2163690561","https://openalex.org/W2164022333","https://openalex.org/W2169596872","https://openalex.org/W2189305330","https://openalex.org/W3141828823","https://openalex.org/W4236548448","https://openalex.org/W6996547567"],"related_works":["https://openalex.org/W1999711970","https://openalex.org/W2166895275","https://openalex.org/W2151163382","https://openalex.org/W2998775986","https://openalex.org/W1971022286","https://openalex.org/W1484884871","https://openalex.org/W1565879960","https://openalex.org/W3168189449","https://openalex.org/W3022519409","https://openalex.org/W94523631"],"abstract_inverted_index":{"Reliability":[0],"is":[1,64],"emerging":[2],"as":[3],"an":[4,40],"important":[5],"design":[6,27],"criterion":[7],"in":[8],"modern":[9],"systems":[10],"due":[11],"to":[12,22,66,77,91,102],"increasing":[13],"transient":[14],"fault":[15,109],"rates.":[16],"Hardware":[17],"fault-tolerance":[18],"techniques,":[19],"commonly":[20],"used":[21,65],"address":[23],"this,":[24],"introduce":[25],"high":[26],"costs.":[28],"As":[29],"alternative,":[30],"software":[31],"Signature-Monitoring":[32],"(SM)":[33],"schemes":[34],"based":[35],"on":[36],"compiler":[37],"assertions":[38,69],"are":[39],"efficient":[41],"method":[42,97],"for":[43],"control-flow-error":[44],"detection.":[45],"Existing":[46],"SM":[47],"techniques":[48],"do":[49],"not":[50],"consider":[51],"application-specific-information":[52],"causing":[53],"unnecessary":[54],"overheads.":[55,79],"In":[56],"this":[57],"paper,":[58],"compile-time":[59],"Control-Flow-Graph":[60],"(CFG)":[61],"topology":[62],"analysis":[63],"place":[67],"best-suited":[68],"at":[70],"optimal":[71],"locations":[72],"of":[73],"the":[74,96],"assembly":[75],"code":[76],"reduce":[78],"Our":[80],"evaluation":[81],"with":[82,88,98,121],"representative":[83],"workloads":[84],"shows":[85],"fault-coverage":[86],"increase":[87],"overheads":[89],"close":[90],"Assertion-based":[92],"Control-Flow":[93],"Correction":[94],"(ACFC),":[95],"lowest":[99],"overhead.":[100,124],"Compared":[101],"ACFC,":[103],"our":[104],"technique":[105],"improves":[106],"(on":[107],"average)":[108],"coverage":[110],"by":[111,115,119],"17%,":[112],"performance":[113],"overhead":[114],"5%":[116],"and":[117],"power-consumption":[118],"3%":[120],"equal":[122],"code-size":[123]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}