{"id":"https://openalex.org/W4388280024","doi":"https://doi.org/10.1109/safeprocess58597.2023.10295885","title":"A Fault Detection Method Considering Fault Mode Information","display_name":"A Fault Detection Method Considering Fault Mode Information","publication_year":2023,"publication_date":"2023-09-22","ids":{"openalex":"https://openalex.org/W4388280024","doi":"https://doi.org/10.1109/safeprocess58597.2023.10295885"},"language":"en","primary_location":{"id":"doi:10.1109/safeprocess58597.2023.10295885","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/safeprocess58597.2023.10295885","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005338897","display_name":"Jianxue Sang","orcid":"https://orcid.org/0000-0001-6719-7870"},"institutions":[{"id":"https://openalex.org/I4210119012","display_name":"Xichang University","ror":"https://ror.org/02h3fyk31","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210119012"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianxue Sang","raw_affiliation_strings":["Xichang Satellite Launch Center,Technical Department,Xichang,China","Technical Department, Xichang Satellite Launch Center, Xichang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xichang Satellite Launch Center,Technical Department,Xichang,China","institution_ids":["https://openalex.org/I4210119012"]},{"raw_affiliation_string":"Technical Department, Xichang Satellite Launch Center, Xichang, China","institution_ids":["https://openalex.org/I4210119012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111011565","display_name":"Yu Zhao","orcid":"https://orcid.org/0009-0000-7084-731X"},"institutions":[{"id":"https://openalex.org/I4210119012","display_name":"Xichang University","ror":"https://ror.org/02h3fyk31","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210119012"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Zhao","raw_affiliation_strings":["Xichang Satellite Launch Center,Technical Department,Xichang,China","Technical Department, Xichang Satellite Launch Center, Xichang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xichang Satellite Launch Center,Technical Department,Xichang,China","institution_ids":["https://openalex.org/I4210119012"]},{"raw_affiliation_string":"Technical Department, Xichang Satellite Launch Center, Xichang, China","institution_ids":["https://openalex.org/I4210119012"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100696824","display_name":"Jian Wang","orcid":"https://orcid.org/0000-0002-4316-932X"},"institutions":[{"id":"https://openalex.org/I4210119012","display_name":"Xichang University","ror":"https://ror.org/02h3fyk31","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210119012"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Wang","raw_affiliation_strings":["Xichang Satellite Launch Center,Technical Department,Xichang,China","Technical Department, Xichang Satellite Launch Center, Xichang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xichang Satellite Launch Center,Technical Department,Xichang,China","institution_ids":["https://openalex.org/I4210119012"]},{"raw_affiliation_string":"Technical Department, Xichang Satellite Launch Center, Xichang, China","institution_ids":["https://openalex.org/I4210119012"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210119012"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","score":0.9652000069618225,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.7224096059799194},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6449530720710754},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6299073100090027},{"id":"https://openalex.org/keywords/subspace-topology","display_name":"Subspace topology","score":0.5738976001739502},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5417457818984985},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.5267229080200195},{"id":"https://openalex.org/keywords/maximization","display_name":"Maximization","score":0.46277081966400146},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4604502320289612},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4428887367248535},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.4210554361343384},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.39436814188957214},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2524290084838867},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19759413599967957},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14051616191864014},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.10627052187919617},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.06775704026222229}],"concepts":[{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.7224096059799194},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6449530720710754},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6299073100090027},{"id":"https://openalex.org/C32834561","wikidata":"https://www.wikidata.org/wiki/Q660730","display_name":"Subspace topology","level":2,"score":0.5738976001739502},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5417457818984985},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.5267229080200195},{"id":"https://openalex.org/C2776330181","wikidata":"https://www.wikidata.org/wiki/Q18358244","display_name":"Maximization","level":2,"score":0.46277081966400146},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4604502320289612},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4428887367248535},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.4210554361343384},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.39436814188957214},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2524290084838867},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19759413599967957},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14051616191864014},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.10627052187919617},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.06775704026222229},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/safeprocess58597.2023.10295885","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/safeprocess58597.2023.10295885","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1990238127","https://openalex.org/W2002268936","https://openalex.org/W2017477922","https://openalex.org/W2099741732","https://openalex.org/W2146129842","https://openalex.org/W2158958729","https://openalex.org/W2169347809","https://openalex.org/W2322097696","https://openalex.org/W2790718085","https://openalex.org/W3093605579","https://openalex.org/W4245885949"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W3148663848","https://openalex.org/W1986800855","https://openalex.org/W2024194466","https://openalex.org/W2278517150","https://openalex.org/W4256030018","https://openalex.org/W3150960233","https://openalex.org/W2061946964","https://openalex.org/W2147400189","https://openalex.org/W2474604829"],"abstract_inverted_index":{"Mainstream":[0],"data-driven":[1],"fault":[2,19,38,51,61,66,76,86,91,118],"detection":[3,62],"methods":[4],"either":[5],"use":[6,14],"only":[7],"normal":[8,16],"samples":[9,17,20],"for":[10,21,50],"offline":[11,22],"modeling,":[12],"or":[13,44],"both":[15],"and":[18,114],"modeling.":[23],"In":[24],"the":[25,71,75,85,104,121,124],"actual":[26],"industrial":[27],"process,":[28],"it":[29],"is":[30,48,80,101,109,127],"often":[31],"possible":[32],"to":[33,111,115],"obtain":[34],"some":[35],"information":[36,68],"about":[37],"mode":[39,67],"based":[40,97],"on":[41,54,98],"prior":[42],"knowledge":[43],"historical":[45],"data,":[46],"which":[47],"useful":[49],"detection.":[52,119],"Based":[53],"this":[55,57],"consideration,":[56],"paper":[58],"presents":[59],"a":[60,90,130],"method":[63,96,108,126],"of":[64,74,123],"considering":[65,78],"(FMI).":[69],"Firstly,":[70],"mathematical":[72],"description":[73],"model":[77],"FMI":[79],"given;":[81],"Secondly,":[82],"by":[83,129],"analyzing":[84],"signal":[87],"ratio":[88],"(FSR),":[89],"decoupling":[92],"subspace":[93],"(FDS)":[94],"projection":[95],"FSR":[99],"maximization":[100],"proposed;":[102],"Thirdly,":[103],"traditional":[105],"multivariate":[106],"statistics":[107,113],"used":[110],"construct":[112],"carry":[116],"out":[117],"Finally,":[120],"effectiveness":[122],"proposed":[125],"verified":[128],"classical":[131],"numerical":[132],"simulation.":[133]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}