{"id":"https://openalex.org/W4388280012","doi":"https://doi.org/10.1109/safeprocess58597.2023.10295682","title":"PCB bare board defect detection based on improved YOLOv5s","display_name":"PCB bare board defect detection based on improved YOLOv5s","publication_year":2023,"publication_date":"2023-09-22","ids":{"openalex":"https://openalex.org/W4388280012","doi":"https://doi.org/10.1109/safeprocess58597.2023.10295682"},"language":"en","primary_location":{"id":"doi:10.1109/safeprocess58597.2023.10295682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/safeprocess58597.2023.10295682","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007251058","display_name":"Yuxin Jin","orcid":"https://orcid.org/0000-0001-7291-2015"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]},{"id":"https://openalex.org/I4210131342","display_name":"Yibin University","ror":"https://ror.org/03w8m2977","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210131342"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuxin Jin","raw_affiliation_strings":["Sichuan University of Science & Engineering Sanjiang Artificial Intelligence and Robot Research Institute, Yibin University,School of Automation and Information Engineering,Yibin,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sichuan University of Science & Engineering Sanjiang Artificial Intelligence and Robot Research Institute, Yibin University,School of Automation and Information Engineering,Yibin,China","institution_ids":["https://openalex.org/I4210131342","https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040190040","display_name":"Lecai Cai","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131342","display_name":"Yibin University","ror":"https://ror.org/03w8m2977","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210131342"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lecai Cai","raw_affiliation_strings":["Yibin University,Sanjiang Artificial Intelligence and Robot Research Institute,Yibin,China","Sanjiang Artificial Intelligence and Robot Research Institute, Yibin University, Yibin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yibin University,Sanjiang Artificial Intelligence and Robot Research Institute,Yibin,China","institution_ids":["https://openalex.org/I4210131342"]},{"raw_affiliation_string":"Sanjiang Artificial Intelligence and Robot Research Institute, Yibin University, Yibin, China","institution_ids":["https://openalex.org/I4210131342"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084513122","display_name":"Kui Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131342","display_name":"Yibin University","ror":"https://ror.org/03w8m2977","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210131342"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kui Cheng","raw_affiliation_strings":["Yibin University,Sanjiang Artificial Intelligence and Robot Research Institute,Yibin,China","Sanjiang Artificial Intelligence and Robot Research Institute, Yibin University, Yibin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yibin University,Sanjiang Artificial Intelligence and Robot Research Institute,Yibin,China","institution_ids":["https://openalex.org/I4210131342"]},{"raw_affiliation_string":"Sanjiang Artificial Intelligence and Robot Research Institute, Yibin University, Yibin, China","institution_ids":["https://openalex.org/I4210131342"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115597529","display_name":"Xinjie Wang","orcid":"https://orcid.org/0009-0008-0300-7749"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]},{"id":"https://openalex.org/I4210131342","display_name":"Yibin University","ror":"https://ror.org/03w8m2977","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210131342"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinjie Wang","raw_affiliation_strings":["Sichuan University of Science & Engineering Sanjiang Artificial Intelligence and Robot Research Institute, Yibin University,School of Automation and Information Engineering,Yibin,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sichuan University of Science & Engineering Sanjiang Artificial Intelligence and Robot Research Institute, Yibin University,School of Automation and Information Engineering,Yibin,China","institution_ids":["https://openalex.org/I4210131342","https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002678452","display_name":"Chunlan Luo","orcid":null},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]},{"id":"https://openalex.org/I4210131342","display_name":"Yibin University","ror":"https://ror.org/03w8m2977","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210131342"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunlan Luo","raw_affiliation_strings":["Sichuan University of Science & Engineering Sanjiang Artificial Intelligence and Robot Research Institute, Yibin University,School of Automation and Information Engineering,Yibin,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sichuan University of Science & Engineering Sanjiang Artificial Intelligence and Robot Research Institute, Yibin University,School of Automation and Information Engineering,Yibin,China","institution_ids":["https://openalex.org/I4210131342","https://openalex.org/I24185976"]}]},{"author_position":"last","author":{"id":null,"display_name":"Sanxiu Jiao","orcid":null},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]},{"id":"https://openalex.org/I4210131342","display_name":"Yibin University","ror":"https://ror.org/03w8m2977","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210131342"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sanxiu Jiao","raw_affiliation_strings":["Sichuan University of Science & Engineering Sanjiang Artificial Intelligence and Robot Research Institute, Yibin University,School of Automation and Information Engineering,Yibin,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sichuan University of Science & Engineering Sanjiang Artificial Intelligence and Robot Research Institute, Yibin University,School of Automation and Information Engineering,Yibin,China","institution_ids":["https://openalex.org/I4210131342","https://openalex.org/I24185976"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3167,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.83650058,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13918","display_name":"Advanced Data and IoT Technologies","score":0.9358999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.7132172584533691},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6976408958435059},{"id":"https://openalex.org/keywords/backbone-network","display_name":"Backbone network","score":0.637352466583252},{"id":"https://openalex.org/keywords/convolution","display_name":"Convolution (computer science)","score":0.5528212189674377},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5029503703117371},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.49481505155563354},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.47135868668556213},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.4673232138156891},{"id":"https://openalex.org/keywords/fusion","display_name":"Fusion","score":0.4316338002681732},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3894299864768982},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3505696654319763},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.32617121934890747},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.13035693764686584},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11742940545082092}],"concepts":[{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.7132172584533691},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6976408958435059},{"id":"https://openalex.org/C88796919","wikidata":"https://www.wikidata.org/wiki/Q1142907","display_name":"Backbone network","level":2,"score":0.637352466583252},{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.5528212189674377},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5029503703117371},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.49481505155563354},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.47135868668556213},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.4673232138156891},{"id":"https://openalex.org/C158525013","wikidata":"https://www.wikidata.org/wiki/Q2593739","display_name":"Fusion","level":2,"score":0.4316338002681732},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3894299864768982},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3505696654319763},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.32617121934890747},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.13035693764686584},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11742940545082092},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/safeprocess58597.2023.10295682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/safeprocess58597.2023.10295682","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6399999856948853,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2549337046","https://openalex.org/W2622826443","https://openalex.org/W2941001797","https://openalex.org/W2943694032","https://openalex.org/W4386075524"],"related_works":["https://openalex.org/W2599361292","https://openalex.org/W4252608911","https://openalex.org/W2184913151","https://openalex.org/W2389426768","https://openalex.org/W2098273855","https://openalex.org/W3147987719","https://openalex.org/W2698654916","https://openalex.org/W3163908127","https://openalex.org/W2013997577","https://openalex.org/W2975185102"],"abstract_inverted_index":{"In":[0],"industrial":[1,201],"inspection,":[2],"printed":[3],"circuit":[4],"board":[5,42],"(PCB)":[6],"defects":[7],"are":[8,21],"numerous":[9],"and":[10,28,59,83,105,148,155],"complex,":[11],"small":[12,128,158],"size,":[13],"difficult":[14],"to":[15,23,69,87,109,134,175],"detect.":[16],"The":[17,95,181],"traditional":[18],"inspection":[19],"methods":[20],"prone":[22],"the":[24,32,51,71,80,102,111,117,124,127,136,143,157,163,168,173,178,185,198],"shortcomings":[25],"of":[26,53,91,116,123,145,194,200],"leakage":[27],"misdetection.":[29],"To":[30],"address":[31],"above":[33],"problems,":[34],"this":[35],"paper":[36],"proposes":[37],"an":[38,192],"improved":[39,186],"PCB":[40],"bare":[41],"defect":[43],"detection":[44,130,160],"algorithm":[45],"based":[46],"on":[47],"YOLOv5s,":[48],"which":[49,196],"strengthens":[50],"fusion":[52,73,85,107],"deep":[54],"abstract":[55],"specialization":[56],"semantic":[57],"information":[58,64,113,151],"shallow":[60,92,125],"fine-grained":[61],"pixel":[62],"structure":[63],"by":[65],"adding":[66],"BiFPN":[67],"module":[68,171],"reconstruct":[70],"feature":[72,84,106,137,153],"network;":[74],"introduces":[75],"Biformer":[76,96],"attention":[77,97],"mechanism":[78,98],"in":[79,101,172],"backbone":[81,103],"network":[82,104,174,179],"part":[86,108],"make":[88,135],"full":[89,121],"use":[90,122],"features":[93],"while":[94,119,162],"is":[99,132],"introduced":[100],"enhance":[110,156],"global":[112],"capture":[114],"capability":[115],"model":[118,187],"making":[120],"features;":[126],"target":[129,159],"head":[131],"added":[133],"map":[138],"with":[139],"higher":[140],"resolution,":[141],"reduce":[142],"loss":[144],"localization":[146],"accuracy":[147],"edge":[149],"region":[150],"during":[152],"fusion,":[154],"capability,":[161],"dynamic":[164],"convolution":[165,170],"ODConv":[166],"replaces":[167],"conventional":[169],"further":[176],"improve":[177],"performance.":[180],"test":[182],"shows":[183],"that":[184],"mAP@0.5":[188],"can":[189],"reach":[190],"96.0%,":[191],"increase":[193],"0.76%,":[195],"meets":[197],"needs":[199],"non-destructive":[202],"testing.":[203]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":5}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}