{"id":"https://openalex.org/W4388280289","doi":"https://doi.org/10.1109/safeprocess58597.2023.10295613","title":"A method for fusing multiple sources for noise reduction in a strong noise environment","display_name":"A method for fusing multiple sources for noise reduction in a strong noise environment","publication_year":2023,"publication_date":"2023-09-22","ids":{"openalex":"https://openalex.org/W4388280289","doi":"https://doi.org/10.1109/safeprocess58597.2023.10295613"},"language":"en","primary_location":{"id":"doi:10.1109/safeprocess58597.2023.10295613","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/safeprocess58597.2023.10295613","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002870554","display_name":"Haifeng Li","orcid":"https://orcid.org/0000-0001-5696-8051"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Haifeng Li","raw_affiliation_strings":["Chongqing University,School of Automation,Chongqing,China","School of Automation, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Chongqing University,School of Automation,Chongqing,China","institution_ids":["https://openalex.org/I158842170"]},{"raw_affiliation_string":"School of Automation, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100365699","display_name":"Ke Zhang","orcid":"https://orcid.org/0000-0001-9747-9895"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ke Zhang","raw_affiliation_strings":["Chongqing University,School of Automation,Chongqing,China","School of Automation, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Chongqing University,School of Automation,Chongqing,China","institution_ids":["https://openalex.org/I158842170"]},{"raw_affiliation_string":"School of Automation, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100338326","display_name":"Zi Wang","orcid":"https://orcid.org/0000-0001-9081-7185"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zi Wang","raw_affiliation_strings":["Chongqing Nankai Middle School,Chongqing,China","Chongqing Nankai Middle School, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Chongqing Nankai Middle School,Chongqing,China","institution_ids":["https://openalex.org/I158842170"]},{"raw_affiliation_string":"Chongqing Nankai Middle School, Chongqing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070403625","display_name":"Huaxiang Pu","orcid":"https://orcid.org/0000-0002-0840-8612"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaxiang Pu","raw_affiliation_strings":["Chongqing University,School of Automation,Chongqing,China","School of Automation, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Chongqing University,School of Automation,Chongqing,China","institution_ids":["https://openalex.org/I158842170"]},{"raw_affiliation_string":"School of Automation, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109748223","display_name":"Xinrui Jing","orcid":null},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinrui Jing","raw_affiliation_strings":["Chongqing University,School of Automation,Chongqing,China","School of Automation, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"Chongqing University,School of Automation,Chongqing,China","institution_ids":["https://openalex.org/I158842170"]},{"raw_affiliation_string":"School of Automation, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061720743","display_name":"Yiran Hu","orcid":"https://orcid.org/0000-0002-6588-9037"},"institutions":[{"id":"https://openalex.org/I179026463","display_name":"Beijing Technology and Business University","ror":"https://ror.org/013e0zm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I179026463"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiran Hu","raw_affiliation_strings":["Beijing Technology and Business University,School of Artificial Intelligence,Beijing,China","School of Artificial Intelligence, Beijing Technology and Business University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Technology and Business University,School of Artificial Intelligence,Beijing,China","institution_ids":["https://openalex.org/I179026463"]},{"raw_affiliation_string":"School of Artificial Intelligence, Beijing Technology and Business University, Beijing, China","institution_ids":["https://openalex.org/I179026463"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5002870554"],"corresponding_institution_ids":["https://openalex.org/I158842170"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17205776,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"138","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10534","display_name":"Structural Health Monitoring Techniques","score":0.9854999780654907,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.725425660610199},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7029663324356079},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6769893169403076},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.6348880529403687},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.6090060472488403},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.504635214805603},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.47630059719085693},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4454171657562256},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.42585331201553345},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.4153371751308441},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4086526036262512},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16431915760040283},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1280345618724823},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.06741487979888916}],"concepts":[{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.725425660610199},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7029663324356079},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6769893169403076},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.6348880529403687},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.6090060472488403},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.504635214805603},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.47630059719085693},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4454171657562256},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.42585331201553345},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.4153371751308441},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4086526036262512},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16431915760040283},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1280345618724823},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.06741487979888916},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/safeprocess58597.2023.10295613","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/safeprocess58597.2023.10295613","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320330944","display_name":"Nature","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W2140336071","https://openalex.org/W2484274503","https://openalex.org/W2566022712","https://openalex.org/W2584994008","https://openalex.org/W2599646198","https://openalex.org/W2605583977","https://openalex.org/W2736225434","https://openalex.org/W2886755908","https://openalex.org/W2888337213","https://openalex.org/W2906578288","https://openalex.org/W2945648831","https://openalex.org/W2971654674","https://openalex.org/W2977117446","https://openalex.org/W2998506103","https://openalex.org/W3017047258","https://openalex.org/W3088523737","https://openalex.org/W3113008830","https://openalex.org/W3209651137","https://openalex.org/W4200221661","https://openalex.org/W4281677181","https://openalex.org/W4282568767","https://openalex.org/W4321021151"],"related_works":["https://openalex.org/W2387796150","https://openalex.org/W1990319978","https://openalex.org/W4310420093","https://openalex.org/W3108403339","https://openalex.org/W2162712524","https://openalex.org/W4287867034","https://openalex.org/W2175872006","https://openalex.org/W3005783148","https://openalex.org/W3021143552","https://openalex.org/W2004821155"],"abstract_inverted_index":{"To":[0],"address":[1],"the":[2,13,22,49,57,63,76,82],"problem":[3,14],"that":[4,75],"existing":[5],"fault":[6,16,87],"diagnosis":[7],"methods":[8],"are":[9],"unable":[10],"to":[11,39,67],"solve":[12],"of":[15,24,34,42,54,62,84],"identification":[17],"being":[18],"significantly":[19,80],"affected":[20],"by":[21],"integration":[23],"multi-source":[25,43],"sensor":[26],"information,":[27],"which":[28,47],"is":[29,45],"interspersed":[30],"with":[31],"varying":[32],"degrees":[33],"noise,":[35],"a":[36,90],"model":[37,78],"applicable":[38],"noise":[40,69,92],"reduction":[41],"information":[44],"proposed,":[46],"utilises":[48],"global":[50],"feature":[51,59],"extraction":[52,60],"capability":[53,61],"Transformer":[55],"and":[56],"local":[58],"Parameter-Free":[64],"attention":[65],"module(SimAM)":[66],"achieve":[68],"reduction.":[70],"The":[71],"experimental":[72],"results":[73],"show":[74],"designed":[77],"can":[79],"improve":[81],"accuracy":[83],"multidimensional":[85],"data":[86],"classification":[88],"in":[89],"strong":[91],"environment.":[93]},"counts_by_year":[],"updated_date":"2025-12-23T23:11:35.936235","created_date":"2025-10-10T00:00:00"}