{"id":"https://openalex.org/W4210781528","doi":"https://doi.org/10.1109/safeprocess52771.2021.9693653","title":"Sneak circuit analysis considering component performance degradation under digital twin model","display_name":"Sneak circuit analysis considering component performance degradation under digital twin model","publication_year":2021,"publication_date":"2021-12-17","ids":{"openalex":"https://openalex.org/W4210781528","doi":"https://doi.org/10.1109/safeprocess52771.2021.9693653"},"language":"en","primary_location":{"id":"doi:10.1109/safeprocess52771.2021.9693653","is_oa":false,"landing_page_url":"https://doi.org/10.1109/safeprocess52771.2021.9693653","pdf_url":null,"source":{"id":"https://openalex.org/S4363605570","display_name":"2021 CAA Symposium on Fault Detection, Supervision, and Safety for Technical Processes (SAFEPROCESS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 CAA Symposium on Fault Detection, Supervision, and Safety for Technical Processes (SAFEPROCESS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5071995111","display_name":"Yuzhe Ma","orcid":"https://orcid.org/0000-0002-3612-4182"},"institutions":[{"id":"https://openalex.org/I2801618472","display_name":"PLA Rocket Force University of Engineering","ror":"https://ror.org/00gg5zj35","country_code":"CN","type":"education","lineage":["https://openalex.org/I2801618472"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yuzhe Ma","raw_affiliation_strings":["Rocket Force University of Engineering,College of Missile Engineering,Xi’an,China"],"affiliations":[{"raw_affiliation_string":"Rocket Force University of Engineering,College of Missile Engineering,Xi’an,China","institution_ids":["https://openalex.org/I2801618472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083714859","display_name":"Tianmei Li","orcid":"https://orcid.org/0000-0002-4181-265X"},"institutions":[{"id":"https://openalex.org/I2801618472","display_name":"PLA Rocket Force University of Engineering","ror":"https://ror.org/00gg5zj35","country_code":"CN","type":"education","lineage":["https://openalex.org/I2801618472"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianmei Li","raw_affiliation_strings":["Rocket Force University of Engineering,College of Missile Engineering,Xi’an,China"],"affiliations":[{"raw_affiliation_string":"Rocket Force University of Engineering,College of Missile Engineering,Xi’an,China","institution_ids":["https://openalex.org/I2801618472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067994505","display_name":"Xiaosheng Si","orcid":"https://orcid.org/0000-0001-5226-9923"},"institutions":[{"id":"https://openalex.org/I2801618472","display_name":"PLA Rocket Force University of Engineering","ror":"https://ror.org/00gg5zj35","country_code":"CN","type":"education","lineage":["https://openalex.org/I2801618472"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaosheng Si","raw_affiliation_strings":["Rocket Force University of Engineering,College of Missile Engineering,Xi’an,China"],"affiliations":[{"raw_affiliation_string":"Rocket Force University of Engineering,College of Missile Engineering,Xi’an,China","institution_ids":["https://openalex.org/I2801618472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101794519","display_name":"Changhua Hu","orcid":"https://orcid.org/0000-0002-9983-5061"},"institutions":[{"id":"https://openalex.org/I2801618472","display_name":"PLA Rocket Force University of Engineering","ror":"https://ror.org/00gg5zj35","country_code":"CN","type":"education","lineage":["https://openalex.org/I2801618472"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changhua Hu","raw_affiliation_strings":["Rocket Force University of Engineering,College of Missile Engineering,Xi’an,China"],"affiliations":[{"raw_affiliation_string":"Rocket Force University of Engineering,College of Missile Engineering,Xi’an,China","institution_ids":["https://openalex.org/I2801618472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070187604","display_name":"Shengfei Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I2801618472","display_name":"PLA Rocket Force University of Engineering","ror":"https://ror.org/00gg5zj35","country_code":"CN","type":"education","lineage":["https://openalex.org/I2801618472"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shengfei Zhang","raw_affiliation_strings":["Rocket Force University of Engineering,College of Missile Engineering,Xi’an,China"],"affiliations":[{"raw_affiliation_string":"Rocket Force University of Engineering,College of Missile Engineering,Xi’an,China","institution_ids":["https://openalex.org/I2801618472"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100397048","display_name":"Hao Zhang","orcid":"https://orcid.org/0000-0003-3410-7829"},"institutions":[{"id":"https://openalex.org/I2801618472","display_name":"PLA Rocket Force University of Engineering","ror":"https://ror.org/00gg5zj35","country_code":"CN","type":"education","lineage":["https://openalex.org/I2801618472"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Zhang","raw_affiliation_strings":["Rocket Force University of Engineering,College of Missile Engineering,Xi’an,China"],"affiliations":[{"raw_affiliation_string":"Rocket Force University of Engineering,College of Missile Engineering,Xi’an,China","institution_ids":["https://openalex.org/I2801618472"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5071995111"],"corresponding_institution_ids":["https://openalex.org/I2801618472"],"apc_list":null,"apc_paid":null,"fwci":0.4327,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.5352241,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"25","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9101999998092651,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9101999998092651,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.842746913433075},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7206989526748657},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6249169707298279},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5380411148071289},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5282434821128845},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4639565348625183},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3900453448295593},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20589041709899902},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13100388646125793},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.06904518604278564}],"concepts":[{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.842746913433075},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7206989526748657},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6249169707298279},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5380411148071289},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5282434821128845},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4639565348625183},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3900453448295593},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20589041709899902},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13100388646125793},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.06904518604278564},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/safeprocess52771.2021.9693653","is_oa":false,"landing_page_url":"https://doi.org/10.1109/safeprocess52771.2021.9693653","pdf_url":null,"source":{"id":"https://openalex.org/S4363605570","display_name":"2021 CAA Symposium on Fault Detection, Supervision, and Safety for Technical Processes (SAFEPROCESS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 CAA Symposium on Fault Detection, Supervision, and Safety for Technical Processes (SAFEPROCESS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1996937038","https://openalex.org/W2165796207","https://openalex.org/W2366559015"],"related_works":["https://openalex.org/W2357256365","https://openalex.org/W2348502264","https://openalex.org/W2365486383","https://openalex.org/W2796521923","https://openalex.org/W4241196849","https://openalex.org/W95651076","https://openalex.org/W2770163697","https://openalex.org/W2110521006","https://openalex.org/W23143985","https://openalex.org/W2157850428"],"abstract_inverted_index":{"The":[0],"traditional":[1],"method":[2,31,122],"of":[3,23,32,51,58,66,96,106,119,140],"sneak":[4,33,107,128],"circuits":[5,34,108,129],"analysis":[6,24,35],"is":[7,16,25,53,68,86,114,123],"based":[8],"on":[9,62],"the":[10,21,41,56,72,78,81,89,104,117,120,127,136,141],"premise":[11],"that":[12,20],"component":[13,37,59,73,82,97,111,132],"performance":[14,38,60,74,83,112,133],"degradation":[15,39,61,75,84,113,134],"not":[17],"considered,":[18],"so":[19],"results":[22],"idealized.":[26],"This":[27],"paper":[28],"presents":[29],"a":[30,46],"considering":[36],"under":[40],"digital":[42,48,63],"twin":[43,49,64],"model.":[44],"Firstly,":[45],"five-dimensional":[47],"model":[50,65,85],"circuit":[52,67,139],"established,":[54],"and":[55,88,93],"effect":[57],"analyzed.":[69],"According":[70],"to":[71],"process":[76],"obeys":[77],"Wiener":[79],"process,":[80],"established":[87],"probability":[90,94,105],"density":[91],"function":[92],"distribution":[95],"life":[98],"are":[99],"derived.":[100],"On":[101],"this":[102],"basis,":[103],"caused":[109,130],"by":[110,125,131],"obtained.":[115],"Finally,":[116],"effectiveness":[118],"proposed":[121],"verified":[124],"analyzing":[126],"in":[135],"ignition":[137],"shutdown":[138],"Red":[142],"stone":[143],"rocket.":[144]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}