{"id":"https://openalex.org/W3092462912","doi":"https://doi.org/10.1109/safeprocess45799.2019.9213347","title":"Fault Prediction of Brightness Sensor based on BRB in Rail Vehicle Compartment LED Lighting System","display_name":"Fault Prediction of Brightness Sensor based on BRB in Rail Vehicle Compartment LED Lighting System","publication_year":2019,"publication_date":"2019-07-01","ids":{"openalex":"https://openalex.org/W3092462912","doi":"https://doi.org/10.1109/safeprocess45799.2019.9213347","mag":"3092462912"},"language":"en","primary_location":{"id":"doi:10.1109/safeprocess45799.2019.9213347","is_oa":false,"landing_page_url":"https://doi.org/10.1109/safeprocess45799.2019.9213347","pdf_url":null,"source":{"id":"https://openalex.org/S4306498460","display_name":"2019 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070908737","display_name":"Xiaojing Yin","orcid":"https://orcid.org/0000-0002-5688-9473"},"institutions":[{"id":"https://openalex.org/I4385474403","display_name":"Changchun University of Technology","ror":"https://ror.org/052pakb34","country_code":null,"type":"education","lineage":["https://openalex.org/I4385474403"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaojing Yin","raw_affiliation_strings":["School of Mechatronic Engineering, Changchun University of Technology, Changchun, Jilin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering, Changchun University of Technology, Changchun, Jilin, China","institution_ids":["https://openalex.org/I4385474403"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067991317","display_name":"Guangxu Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I4385474403","display_name":"Changchun University of Technology","ror":"https://ror.org/052pakb34","country_code":null,"type":"education","lineage":["https://openalex.org/I4385474403"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangxu Shi","raw_affiliation_strings":["School of Mechatronic Engineering, Changchun University of Technology, Changchun, Jilin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering, Changchun University of Technology, Changchun, Jilin, China","institution_ids":["https://openalex.org/I4385474403"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011254289","display_name":"Bangcheng Zhang","orcid":"https://orcid.org/0000-0001-9490-0170"},"institutions":[{"id":"https://openalex.org/I4385474403","display_name":"Changchun University of Technology","ror":"https://ror.org/052pakb34","country_code":null,"type":"education","lineage":["https://openalex.org/I4385474403"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bangcheng Zhang","raw_affiliation_strings":["School of Mechatronic Engineering, Changchun University of Technology, Changchun, Jilin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering, Changchun University of Technology, Changchun, Jilin, China","institution_ids":["https://openalex.org/I4385474403"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003493747","display_name":"Shiyuan Lv","orcid":null},"institutions":[{"id":"https://openalex.org/I4385474403","display_name":"Changchun University of Technology","ror":"https://ror.org/052pakb34","country_code":null,"type":"education","lineage":["https://openalex.org/I4385474403"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiyuan Lv","raw_affiliation_strings":["School of Mechatronic Engineering, Changchun University of Technology, Changchun, Jilin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering, Changchun University of Technology, Changchun, Jilin, China","institution_ids":["https://openalex.org/I4385474403"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044187241","display_name":"Yubo Shao","orcid":"https://orcid.org/0000-0002-7040-9990"},"institutions":[{"id":"https://openalex.org/I4385474403","display_name":"Changchun University of Technology","ror":"https://ror.org/052pakb34","country_code":null,"type":"education","lineage":["https://openalex.org/I4385474403"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yubo Shao","raw_affiliation_strings":["School of Mechatronic Engineering, Changchun University of Technology, Changchun, Jilin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering, Changchun University of Technology, Changchun, Jilin, China","institution_ids":["https://openalex.org/I4385474403"]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4385474403"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"309","last_page":"314"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10820","display_name":"Fuzzy Logic and Control Systems","score":0.920799970626831,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10820","display_name":"Fuzzy Logic and Control Systems","score":0.920799970626831,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10538","display_name":"Data Mining Algorithms and Applications","score":0.9153000116348267,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12016","display_name":"Web Data Mining and Analysis","score":0.9006999731063843,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/brightness","display_name":"Brightness","score":0.7839053869247437},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6619442105293274},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6417835354804993},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6197113394737244},{"id":"https://openalex.org/keywords/fuse","display_name":"Fuse (electrical)","score":0.553496778011322},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4831966161727905},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4818100333213806},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4251548647880554},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4105513393878937},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29995059967041016}],"concepts":[{"id":"https://openalex.org/C125245961","wikidata":"https://www.wikidata.org/wiki/Q221656","display_name":"Brightness","level":2,"score":0.7839053869247437},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6619442105293274},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6417835354804993},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6197113394737244},{"id":"https://openalex.org/C141353440","wikidata":"https://www.wikidata.org/wiki/Q182221","display_name":"Fuse (electrical)","level":2,"score":0.553496778011322},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4831966161727905},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4818100333213806},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4251548647880554},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4105513393878937},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29995059967041016},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/safeprocess45799.2019.9213347","is_oa":false,"landing_page_url":"https://doi.org/10.1109/safeprocess45799.2019.9213347","pdf_url":null,"source":{"id":"https://openalex.org/S4306498460","display_name":"2019 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W787382797","https://openalex.org/W2007338412","https://openalex.org/W2016752484","https://openalex.org/W2020182563","https://openalex.org/W2026750231","https://openalex.org/W2052229651","https://openalex.org/W2076063813","https://openalex.org/W2078568142","https://openalex.org/W2132036416","https://openalex.org/W2257979135","https://openalex.org/W2313953460","https://openalex.org/W2344273667","https://openalex.org/W2557286940","https://openalex.org/W2748206084"],"related_works":["https://openalex.org/W3000097931","https://openalex.org/W2354322770","https://openalex.org/W4237547500","https://openalex.org/W1570848052","https://openalex.org/W2373192430","https://openalex.org/W4239268388","https://openalex.org/W1537496349","https://openalex.org/W4243305035","https://openalex.org/W2379407973","https://openalex.org/W4389945967"],"abstract_inverted_index":{"To":[0],"guarantee":[1],"the":[2,47,50,54,58,77,85,95,101,104,115,125,130,139,148,158,163],"normal":[3],"workflow":[4],"and":[5,43,127,168],"accurate":[6,40,91],"brightness":[7,16,41,55,96,144],"adjustment,":[8],"it":[9],"is":[10,37,135],"important":[11],"to":[12,39,89,112,123],"predict":[13,162],"fault":[14,34,66,92],"of":[15,49,53,76,94,103,117,129],"sensor":[17,56,145],"in":[18,57,121,147],"rail":[19,59,149],"vehicle":[20,60,150],"compartment":[21,61,151],"LED":[22,62,152],"lighting":[23,63,153],"system.":[24,64],"In":[25,98],"this":[26,99],"paper,":[27],"a":[28,133],"BRB":[29,71],"(belief":[30],"rule":[31],"base)":[32],"based":[33,45,69],"prediction":[35,67,93,141],"model":[36,68,105,142],"proposed":[38,131,140],"adjustment":[42],"reliability":[44],"on":[46,70],"analysis":[48],"failure":[51],"mechanism":[52],"The":[65],"can":[72,83,160],"make":[73],"full":[74],"use":[75],"system's":[78],"expert":[79,118],"prior":[80],"knowledge,":[81],"which":[82,155],"fuse":[84],"system":[86],"feature":[87],"quantity":[88],"achieve":[90],"sensor.":[97],"process,":[100],"parameters":[102],"are":[106],"updated":[107],"by":[108,137],"iterative":[109],"estimation":[110],"algorithm":[111],"compensate":[113],"for":[114,143],"inaccuracy":[116],"knowledge.":[119],"Finally,":[120],"order":[122],"verify":[124],"validity":[126],"accuracy":[128],"model,":[132],"case":[134],"studied":[136],"using":[138],"module":[146],"system,":[154],"shows":[156],"that":[157],"method":[159],"accurately":[161],"faults":[164],"with":[165],"qualitative":[166],"knowledge":[167],"quantitative":[169],"information.":[170]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}