{"id":"https://openalex.org/W2598843340","doi":"https://doi.org/10.1109/rws.2017.7885963","title":"Investigation of surface roughness effects for D-band SIW transmission lines on LCP substrate","display_name":"Investigation of surface roughness effects for D-band SIW transmission lines on LCP substrate","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2598843340","doi":"https://doi.org/10.1109/rws.2017.7885963","mag":"2598843340"},"language":"en","primary_location":{"id":"doi:10.1109/rws.2017.7885963","is_oa":false,"landing_page_url":"https://doi.org/10.1109/rws.2017.7885963","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Radio and Wireless Symposium (RWS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045247794","display_name":"Sensen Li","orcid":"https://orcid.org/0000-0002-8904-6237"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sensen Li","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079521768","display_name":"Ming Yi","orcid":"https://orcid.org/0000-0001-8934-7905"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ming Yi","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006984767","display_name":"Spyridon Pavlidis","orcid":"https://orcid.org/0000-0002-1690-2581"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Spyridon Pavlidis","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001424362","display_name":"Huan Yu","orcid":"https://orcid.org/0000-0003-4772-0163"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Huan Yu","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085554167","display_name":"Madhavan Swaminathan","orcid":"https://orcid.org/0000-0003-1729-2807"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Madhavan Swaminathan","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031725175","display_name":"John Papapolymerou","orcid":"https://orcid.org/0000-0002-1429-0921"},"institutions":[{"id":"https://openalex.org/I87216513","display_name":"Michigan State University","ror":"https://ror.org/05hs6h993","country_code":"US","type":"education","lineage":["https://openalex.org/I87216513"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John Papapolymerou","raw_affiliation_strings":["Michigan State University, East Lansing, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Michigan State University, East Lansing, MI, USA","institution_ids":["https://openalex.org/I87216513"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.8958,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.83235526,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"121","last_page":"124"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.773678719997406},{"id":"https://openalex.org/keywords/polishing","display_name":"Polishing","score":0.749862551689148},{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.7368671894073486},{"id":"https://openalex.org/keywords/insertion-loss","display_name":"Insertion loss","score":0.7358049750328064},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"Surface roughness","score":0.7125469446182251},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.7065691947937012},{"id":"https://openalex.org/keywords/microstrip","display_name":"Microstrip","score":0.5952924489974976},{"id":"https://openalex.org/keywords/return-loss","display_name":"Return loss","score":0.5347470641136169},{"id":"https://openalex.org/keywords/waveguide","display_name":"Waveguide","score":0.5342131853103638},{"id":"https://openalex.org/keywords/surface-finish","display_name":"Surface finish","score":0.5138521194458008},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.45896056294441223},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3483227491378784},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.34034109115600586},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.2435510754585266},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.13146162033081055},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11609020829200745},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07531747221946716},{"id":"https://openalex.org/keywords/antenna","display_name":"Antenna (radio)","score":0.05209618806838989}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.773678719997406},{"id":"https://openalex.org/C138113353","wikidata":"https://www.wikidata.org/wiki/Q611639","display_name":"Polishing","level":2,"score":0.749862551689148},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.7368671894073486},{"id":"https://openalex.org/C90327742","wikidata":"https://www.wikidata.org/wiki/Q947396","display_name":"Insertion loss","level":2,"score":0.7358049750328064},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.7125469446182251},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.7065691947937012},{"id":"https://openalex.org/C123657345","wikidata":"https://www.wikidata.org/wiki/Q639055","display_name":"Microstrip","level":2,"score":0.5952924489974976},{"id":"https://openalex.org/C196901423","wikidata":"https://www.wikidata.org/wiki/Q3933836","display_name":"Return loss","level":3,"score":0.5347470641136169},{"id":"https://openalex.org/C200687136","wikidata":"https://www.wikidata.org/wiki/Q11233438","display_name":"Waveguide","level":2,"score":0.5342131853103638},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.5138521194458008},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.45896056294441223},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3483227491378784},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.34034109115600586},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.2435510754585266},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.13146162033081055},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11609020829200745},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07531747221946716},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.05209618806838989},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/rws.2017.7885963","is_oa":false,"landing_page_url":"https://doi.org/10.1109/rws.2017.7885963","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Radio and Wireless Symposium (RWS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W10143836","https://openalex.org/W2021042290","https://openalex.org/W2108521239","https://openalex.org/W2329846660","https://openalex.org/W2513943858","https://openalex.org/W6725482377"],"related_works":["https://openalex.org/W2124725464","https://openalex.org/W2086351729","https://openalex.org/W2008701935","https://openalex.org/W1973870453","https://openalex.org/W2106709610","https://openalex.org/W4313451576","https://openalex.org/W2772649333","https://openalex.org/W2160821924","https://openalex.org/W2090384652","https://openalex.org/W2099850681"],"abstract_inverted_index":{"This":[0,124],"paper":[1,128],"studies":[2],"the":[3,9,37,55,75,80,83,88,96,126,131,143],"influence":[4],"of":[5,11,47,54,82,121,133,140],"surface":[6,100],"roughness":[7,101],"on":[8,87],"performance":[10],"substrate":[12],"integrated":[13],"waveguide":[14],"(SIW)":[15],"structures":[16,22],"in":[17,25,58,74,142],"D-band":[18,59],"(110-170":[19],"GHz).":[20],"SIW":[21,134],"are":[23,114],"fabricated":[24],"a":[26,43],"flexible":[27],"low-cost/loss":[28],"organic":[29],"substrate,":[30,77],"liquid":[31],"crystal":[32],"polymer":[33],"(LCP),":[34],"after":[35],"polishing":[36],"material":[38],"surface.":[39],"The":[40,50],"fabrication":[41,110],"realizes":[42],"minimum":[44],"feature":[45],"size":[46],"20":[48],"\u03bcm.":[49],"average":[51,67],"insertion":[52],"loss":[53,97,132],"polished":[56],"SIWs":[57,73],"is":[60,92,104,125],"measured":[61],"to":[62,94,116,135,138],"be":[63,136],"0.33dB/mm,":[64],"showing":[65],"an":[66],"0.35":[68],"dB/mm":[69],"improvement":[70],"compared":[71],"with":[72,106],"raw":[76],"without":[78],"affecting":[79],"quality":[81],"impedance":[84],"match.":[85],"Based":[86],"modeling":[89,112],"result,":[90],"simulation":[91],"able":[93],"predict":[95],"under":[98],"different":[99],"conditions,":[102],"which":[103],"verified":[105],"measurements.":[107],"Therefore,":[108],"both":[109],"and":[111],"solutions":[113],"provided":[115],"facilitate":[117],"future":[118],"high-frequency":[119],"designs":[120],"SIW-based":[122],"devices.":[123],"first":[127],"that":[129,139],"demonstrates":[130],"comparable":[137],"microstrip":[141],"D-Band.":[144]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2026-08-11T07:18:39.950985","created_date":"2025-10-10T00:00:00"}