{"id":"https://openalex.org/W2914662427","doi":"https://doi.org/10.1109/rsp.2018.8631986","title":"A Comprehensive Fault Injection Strategy for Embedded Systems Reliability Assessment","display_name":"A Comprehensive Fault Injection Strategy for Embedded Systems Reliability Assessment","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2914662427","doi":"https://doi.org/10.1109/rsp.2018.8631986","mag":"2914662427"},"language":"en","primary_location":{"id":"doi:10.1109/rsp.2018.8631986","is_oa":false,"landing_page_url":"https://doi.org/10.1109/rsp.2018.8631986","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 International Symposium on Rapid System Prototyping (RSP)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064062188","display_name":"Alexandre Chabot","orcid":"https://orcid.org/0000-0002-5410-4556"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I4210085861","display_name":"Laboratoire d'Int\u00e9gration des Syst\u00e8mes et des Technologies","ror":"https://ror.org/000dbcc61","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I277688954","https://openalex.org/I4210085861","https://openalex.org/I4210117989"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Alexandre Chabot","raw_affiliation_strings":["Software Reliability and Security Laboratory, CEA, LIST - LAMIH/CNRS, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Software Reliability and Security Laboratory, CEA, LIST - LAMIH/CNRS, France","institution_ids":["https://openalex.org/I2738703131","https://openalex.org/I4210085861","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002123043","display_name":"Ihsen Alouani","orcid":"https://orcid.org/0000-0001-5102-8087"},"institutions":[{"id":"https://openalex.org/I4210089617","display_name":"Laboratoire d'Automatique, de M\u00e9canique et d'Informatique Industrielles et Humaines","ror":"https://ror.org/006z7v557","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210089617","https://openalex.org/I4210159245","https://openalex.org/I4387154098","https://openalex.org/I70348806","https://openalex.org/I70348806"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Ihsen Alouani","raw_affiliation_strings":["LAMIH, Polytechnic University Hauts-De-France, Valenciennes, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LAMIH, Polytechnic University Hauts-De-France, Valenciennes, France","institution_ids":["https://openalex.org/I4210089617"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080926469","display_name":"Sma\u00efl Niar","orcid":"https://orcid.org/0000-0002-7550-484X"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210089617","display_name":"Laboratoire d'Automatique, de M\u00e9canique et d'Informatique Industrielles et Humaines","ror":"https://ror.org/006z7v557","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210089617","https://openalex.org/I4210159245","https://openalex.org/I4387154098","https://openalex.org/I70348806","https://openalex.org/I70348806"]},{"id":"https://openalex.org/I70348806","display_name":"Universit\u00e9 Polytechnique Hauts-de-France","ror":"https://ror.org/02ezch769","country_code":"FR","type":"education","lineage":["https://openalex.org/I70348806"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Smail Niar","raw_affiliation_strings":["LAMIH/CNRS, Polytechnic University Hauts-De-France, Valenciennes, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LAMIH/CNRS, Polytechnic University Hauts-De-France, Valenciennes, France","institution_ids":["https://openalex.org/I4210089617","https://openalex.org/I1294671590","https://openalex.org/I70348806"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050621942","display_name":"R\u00e9da Nouacer","orcid":"https://orcid.org/0000-0002-6219-706X"},"institutions":[{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I4210085861","display_name":"Laboratoire d'Int\u00e9gration des Syst\u00e8mes et des Technologies","ror":"https://ror.org/000dbcc61","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I277688954","https://openalex.org/I4210085861","https://openalex.org/I4210117989"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Reda Nouacer","raw_affiliation_strings":["System and Software Engineering Department, CEA, LIST, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"System and Software Engineering Department, CEA, LIST, France","institution_ids":["https://openalex.org/I4210085861","https://openalex.org/I2738703131"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1262,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.51237271,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"22","last_page":"28"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7559744119644165},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.724189817905426},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.584496796131134},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5706267356872559},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5243066549301147},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.43941420316696167},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4247030019760132},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30134159326553345},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.11616471409797668},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.10834446549415588}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7559744119644165},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.724189817905426},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.584496796131134},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5706267356872559},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5243066549301147},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.43941420316696167},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4247030019760132},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30134159326553345},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.11616471409797668},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.10834446549415588},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/rsp.2018.8631986","is_oa":false,"landing_page_url":"https://doi.org/10.1109/rsp.2018.8631986","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 International Symposium on Rapid System Prototyping (RSP)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-03382628v1","is_oa":false,"landing_page_url":"https://uphf.hal.science/hal-03382628","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2018 International Symposium on Rapid System Prototyping (RSP), Oct 2018, Torino, Italy. pp.22-28, ⟨10.1109/RSP.2018.8631986⟩","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:pure.qub.ac.uk/portal:publications/7f5f1e4f-9198-4a7c-adad-179a8c34d684","is_oa":false,"landing_page_url":"https://pure.qub.ac.uk/en/publications/7f5f1e4f-9198-4a7c-adad-179a8c34d684","pdf_url":null,"source":{"id":"https://openalex.org/S4306402319","display_name":"Research Portal (Queen's University Belfast)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I126231945","host_organization_name":"Queen's University Belfast","host_organization_lineage":["https://openalex.org/I126231945"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Alouani, I 2019, A comprehensive fault injection strategy for embedded systems reliability assessment. in 2018 International Symposium on Rapid System Prototyping (RSP): Proceedings. International Symposium on Rapid System Prototyping (RSP): Proceedings, Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/rsp.2018.8631986","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6600000262260437,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1686420892","https://openalex.org/W1911878188","https://openalex.org/W1980363975","https://openalex.org/W2015123066","https://openalex.org/W2053166527","https://openalex.org/W2062132293","https://openalex.org/W2098473740","https://openalex.org/W2111033809","https://openalex.org/W2122821232","https://openalex.org/W2128938296","https://openalex.org/W2161960035","https://openalex.org/W2167638298","https://openalex.org/W2167839483","https://openalex.org/W2290529364","https://openalex.org/W2337485678"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"The":[0],"embedded":[1,95],"systems":[2,58,96],"industry":[3],"is":[4,59,69],"moving":[5],"towards":[6],"the":[7,27,47,52,81,103,112,119,129,132],"integration":[8],"of":[9,29,55,80,94,110,131],"higher":[10],"performance,":[11],"yet":[12],"less":[13],"reliable":[14],"electronic":[15],"components":[16],"into":[17,101],"new":[18,30],"product":[19],"generations.":[20],"Technology":[21],"and":[22,62,75,106],"voltage":[23],"scaling":[24],"increased":[25],"dramatically":[26],"susceptibility":[28],"devices":[31],"not":[32],"only":[33],"to":[34,41,71],"Single":[35],"Bit":[36,43],"Upsets":[37,44],"(SBU),":[38],"but":[39],"also":[40],"Multiple":[42],"(MBU).":[45],"However,":[46],"system":[48,82],"reliability":[49,73,92,140],"assessment":[50],"at":[51,78,97],"design":[53],"phase":[54],"fault-tolerant":[56],"computer":[57],"a":[60,89],"complex":[61],"critical":[63],"task.":[64],"In":[65,84],"this":[66,85],"context,":[67],"it":[68],"mandatory":[70],"enhance":[72],"analysis":[74],"evaluation":[76,93],"techniques":[77],"early-stage":[79,98,139],"development.":[83],"paper,":[86],"we":[87],"present":[88],"technique":[90],"for":[91,138],"by":[99],"taking":[100],"account":[102],"application":[104],"behavior":[105,121],"SBU/MBU":[107],"phenomena.":[108],"Instead":[109],"using":[111],"random":[113],"fault":[114,134],"injection,":[115],"our":[116],"approach":[117],"models":[118],"architecture":[120],"under":[122],"real":[123],"working":[124],"conditions.":[125],"Our":[126],"results":[127],"demonstrate":[128],"efficiency":[130],"proposed":[133],"injection":[135],"simulation":[136],"platform":[137],"studies.":[141]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}