{"id":"https://openalex.org/W2551602594","doi":"https://doi.org/10.1109/roedunet.2016.7753251","title":"Gracefully degrading triple modular redundancy in FPGA design with application to harsh radiation environments","display_name":"Gracefully degrading triple modular redundancy in FPGA design with application to harsh radiation environments","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2551602594","doi":"https://doi.org/10.1109/roedunet.2016.7753251","mag":"2551602594"},"language":"en","primary_location":{"id":"doi:10.1109/roedunet.2016.7753251","is_oa":false,"landing_page_url":"https://doi.org/10.1109/roedunet.2016.7753251","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 15th RoEduNet Conference: Networking in Education and Research","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026363748","display_name":"Eng. Dragos-Ronald Rugescu","orcid":null},"institutions":[{"id":"https://openalex.org/I61641377","display_name":"Universitatea Na\u021bional\u0103 de \u0218tiin\u021b\u0103 \u0219i Tehnologie Politehnica Bucure\u0219ti","ror":"https://ror.org/0558j5q12","country_code":"RO","type":"education","lineage":["https://openalex.org/I61641377"]}],"countries":["RO"],"is_corresponding":true,"raw_author_name":"Eng. Dragos-Ronald Rugescu","raw_affiliation_strings":["Department of Automatic Control and Computers, University \u201cPolitehnica\u201d of Bucharest, Bucharest, Romania","Department of Automatic Control and Computers, University \"Politehnica\" of Bucharest, Bucharest, Romania"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Control and Computers, University \u201cPolitehnica\u201d of Bucharest, Bucharest, Romania","institution_ids":["https://openalex.org/I61641377"]},{"raw_affiliation_string":"Department of Automatic Control and Computers, University \"Politehnica\" of Bucharest, Bucharest, Romania","institution_ids":["https://openalex.org/I61641377"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059724501","display_name":"Andrei Voinescu","orcid":null},"institutions":[{"id":"https://openalex.org/I61641377","display_name":"Universitatea Na\u021bional\u0103 de \u0218tiin\u021b\u0103 \u0219i Tehnologie Politehnica Bucure\u0219ti","ror":"https://ror.org/0558j5q12","country_code":"RO","type":"education","lineage":["https://openalex.org/I61641377"]}],"countries":["RO"],"is_corresponding":false,"raw_author_name":"Andrei Voinescu","raw_affiliation_strings":["Department of Automatic Control and Computers, University \u201cPolitehnica\u201d of Bucharest, Bucharest, Romania","Department of Automatic Control and Computers, University \"Politehnica\" of Bucharest, Bucharest, Romania"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Control and Computers, University \u201cPolitehnica\u201d of Bucharest, Bucharest, Romania","institution_ids":["https://openalex.org/I61641377"]},{"raw_affiliation_string":"Department of Automatic Control and Computers, University \"Politehnica\" of Bucharest, Bucharest, Romania","institution_ids":["https://openalex.org/I61641377"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5026363748"],"corresponding_institution_ids":["https://openalex.org/I61641377"],"apc_list":null,"apc_paid":null,"fwci":0.1838,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.59314495,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.813251256942749},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.7595838308334351},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.7326914072036743},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.677661120891571},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5264217257499695},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.49726179242134094},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.4907160997390747},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.486596941947937},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.42391258478164673},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3035777807235718},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25860708951950073},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09152853488922119}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.813251256942749},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.7595838308334351},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.7326914072036743},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.677661120891571},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5264217257499695},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.49726179242134094},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.4907160997390747},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.486596941947937},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.42391258478164673},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3035777807235718},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25860708951950073},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09152853488922119}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/roedunet.2016.7753251","is_oa":false,"landing_page_url":"https://doi.org/10.1109/roedunet.2016.7753251","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 15th RoEduNet Conference: Networking in Education and Research","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W289052539","https://openalex.org/W1625650886","https://openalex.org/W2047081158","https://openalex.org/W2055305867","https://openalex.org/W2088559447","https://openalex.org/W2106635847","https://openalex.org/W2165297788","https://openalex.org/W2496512073","https://openalex.org/W2587411955","https://openalex.org/W4251792943","https://openalex.org/W4285719527","https://openalex.org/W6733539987"],"related_works":["https://openalex.org/W58658798","https://openalex.org/W3114375939","https://openalex.org/W3008821054","https://openalex.org/W2759696718","https://openalex.org/W2359816675","https://openalex.org/W2770296460","https://openalex.org/W2491217195","https://openalex.org/W4210531477","https://openalex.org/W2603119174","https://openalex.org/W3206195470"],"abstract_inverted_index":{"Space":[0],"applications":[1],"form":[2],"a":[3,25,37,58,70,76],"harsh":[4],"computing":[5],"environment,":[6],"especially":[7],"for":[8,87,94],"sensitive":[9],"VLSI":[10],"electronics.":[11,96],"Circuits":[12],"experience":[13],"both":[14],"Single":[15],"Event":[16],"Upsets":[17],"(SEUs),":[18],"as":[19,21,24],"well":[20],"permanent":[22,59],"failures":[23],"result":[26],"of":[27,51,57],"incoming":[28],"electrons,":[29],"protons,":[30],"heavy":[31],"ions,":[32],"plasmas":[33],"etc.":[34],"We":[35],"propose":[36],"Triple":[38],"Modular":[39],"Redundancy":[40],"system":[41,53,66],"that":[42],"handles":[43],"transient":[44],"errors":[45],"and":[46,81],"gracefully":[47],"degrades":[48],"the":[49,52,55],"capabilities":[50],"in":[54,62,69],"case":[56],"failure,":[60],"implemented":[61],"Xilinx":[63],"FPGAs.":[64],"The":[65],"was":[67],"tested":[68],"strong":[71],"EM":[72],"field":[73],"generated":[74],"by":[75],"magnetron":[77],"which":[78],"includes":[79],"X-rays":[80],"Gamma":[82],"rays,":[83],"yielding":[84],"promising":[85],"results":[86],"developing":[88],"an":[89],"indigenous,":[90],"full-fledged":[91],"process":[92],"validation":[93],"space":[95]},"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}