{"id":"https://openalex.org/W1821254955","doi":"https://doi.org/10.1109/robot.1984.1087219","title":"A vision system with automatic learning capability for industrial parts inspection","display_name":"A vision system with automatic learning capability for industrial parts inspection","publication_year":2005,"publication_date":"2005-03-23","ids":{"openalex":"https://openalex.org/W1821254955","doi":"https://doi.org/10.1109/robot.1984.1087219","mag":"1821254955"},"language":"en","primary_location":{"id":"doi:10.1109/robot.1984.1087219","is_oa":false,"landing_page_url":"https://doi.org/10.1109/robot.1984.1087219","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 1984 IEEE International Conference on Robotics and Automation","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000781041","display_name":"James C. Lin","orcid":"https://orcid.org/0000-0002-7848-9841"},"institutions":[{"id":"https://openalex.org/I39422238","display_name":"University of Illinois Chicago","ror":"https://ror.org/02mpq6x41","country_code":"US","type":"education","lineage":["https://openalex.org/I39422238"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Lin","raw_affiliation_strings":["Robotics and Automation Laboratory, University of Illinois at Chicago, Chicago, IL"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Robotics and Automation Laboratory, University of Illinois at Chicago, Chicago, IL","institution_ids":["https://openalex.org/I39422238"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102160275","display_name":"Wen\u2010Hsiang Tsai","orcid":null},"institutions":[{"id":"https://openalex.org/I39422238","display_name":"University of Illinois Chicago","ror":"https://ror.org/02mpq6x41","country_code":"US","type":"education","lineage":["https://openalex.org/I39422238"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wen-Hsiang Tsai","raw_affiliation_strings":["Robotics and Automation Laboratory, University of Illinois at Chicago, Chicago, IL"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Robotics and Automation Laboratory, University of Illinois at Chicago, Chicago, IL","institution_ids":["https://openalex.org/I39422238"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111491411","display_name":"Jeunn-Shenn Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I39422238","display_name":"University of Illinois Chicago","ror":"https://ror.org/02mpq6x41","country_code":"US","type":"education","lineage":["https://openalex.org/I39422238"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeunn-Shenn Lee","raw_affiliation_strings":["Robotics and Automation Laboratory, University of Illinois at Chicago, Chicago, IL"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Robotics and Automation Laboratory, University of Illinois at Chicago, Chicago, IL","institution_ids":["https://openalex.org/I39422238"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037516208","display_name":"Chai-Hsiung Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I39422238","display_name":"University of Illinois Chicago","ror":"https://ror.org/02mpq6x41","country_code":"US","type":"education","lineage":["https://openalex.org/I39422238"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chai-Hsiung Chen","raw_affiliation_strings":["Robotics and Automation Laboratory, University of Illinois at Chicago, Chicago, IL"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Robotics and Automation Laboratory, University of Illinois at Chicago, Chicago, IL","institution_ids":["https://openalex.org/I39422238"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I39422238"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13438546,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":null,"first_page":"417","last_page":"425"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.8572982549667358},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7658791542053223},{"id":"https://openalex.org/keywords/template-matching","display_name":"Template matching","score":0.7354893684387207},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.731033205986023},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7109039425849915},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6799623966217041},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.6109477281570435},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.5945438742637634},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.5837888121604919},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5278877019882202},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5188959240913391},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"Automated optical inspection","score":0.48825743794441223},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.471332311630249},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.459104061126709},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.4438697099685669},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.2734307646751404},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2168232500553131},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.2149985432624817},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11399635672569275}],"concepts":[{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.8572982549667358},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7658791542053223},{"id":"https://openalex.org/C158096908","wikidata":"https://www.wikidata.org/wiki/Q3983303","display_name":"Template matching","level":3,"score":0.7354893684387207},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.731033205986023},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7109039425849915},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6799623966217041},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.6109477281570435},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.5945438742637634},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.5837888121604919},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5278877019882202},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5188959240913391},{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.48825743794441223},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.471332311630249},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.459104061126709},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.4438697099685669},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.2734307646751404},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2168232500553131},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.2149985432624817},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11399635672569275},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/robot.1984.1087219","is_oa":false,"landing_page_url":"https://doi.org/10.1109/robot.1984.1087219","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 1984 IEEE International Conference on Robotics and Automation","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.5},{"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities","score":0.4300000071525574}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1480487340","https://openalex.org/W1622620102","https://openalex.org/W1906361164","https://openalex.org/W1965696824","https://openalex.org/W2069225252","https://openalex.org/W2199269847","https://openalex.org/W3183664590","https://openalex.org/W6687364986","https://openalex.org/W6798531439"],"related_works":["https://openalex.org/W1560398276","https://openalex.org/W1979172994","https://openalex.org/W1979253374","https://openalex.org/W3149631139","https://openalex.org/W571879","https://openalex.org/W2090582288","https://openalex.org/W1986703546","https://openalex.org/W2132335896","https://openalex.org/W1821254955","https://openalex.org/W2794901953"],"abstract_inverted_index":{"A":[0,42,79],"vision":[1],"system":[2,10,95,115],"for":[3,39,55],"automated":[4],"parts":[5,26,40,56,107,122],"inspection":[6,31,49,57,62,69],"is":[7,11,45,52,64,89,116],"proposed.":[8],"The":[9,61,114],"equipped":[12],"with":[13],"learning":[14,81],"capabilities":[15],"such":[16],"that":[17],"it":[18],"automatically":[19],"selects":[20],"from":[21],"a":[22,27,100],"set":[23,102],"of":[24,37,103],"sample":[25],"minimum,":[28],"but":[29],"effective":[30],"region":[32,50,70],"within":[33,47],"the":[34,48,68,75,94],"camera's":[35],"field":[36],"view":[38],"discrimination.":[41],"binary":[43],"template":[44,59],"formed":[46],"which":[51,91],"then":[53],"used":[54],"by":[58,66,73,99],"matching.":[60],"speed":[63],"enhanced":[65],"keeping":[67],"small":[71],"and":[72,105],"making":[74],"matching":[76],"task":[77],"uncomplicated.":[78],"simple":[80],"algorithm":[82],"based":[83],"on":[84],"statistical":[85],"pattern":[86],"recognition":[87],"theory":[88],"employed,":[90],"only":[92],"requires":[93],"to":[96,118],"be":[97],"taught":[98],"training":[101],"good":[104],"defective":[106],"without":[108],"specific":[109],"defect":[110],"identification":[111],"or":[112],"location.":[113],"applicable":[117],"most":[119],"2-D":[120],"industrial":[121],"inspection.":[123]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}