{"id":"https://openalex.org/W2290894673","doi":"https://doi.org/10.1109/robio.2015.7419106","title":"Research of repeatable positioning accuracy of automatic optical inspection","display_name":"Research of repeatable positioning accuracy of automatic optical inspection","publication_year":2015,"publication_date":"2015-12-01","ids":{"openalex":"https://openalex.org/W2290894673","doi":"https://doi.org/10.1109/robio.2015.7419106","mag":"2290894673"},"language":"en","primary_location":{"id":"doi:10.1109/robio.2015.7419106","is_oa":false,"landing_page_url":"https://doi.org/10.1109/robio.2015.7419106","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Robotics and Biomimetics (ROBIO)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100702421","display_name":"Hao Wu","orcid":"https://orcid.org/0009-0001-8010-6264"},"institutions":[{"id":"https://openalex.org/I92178344","display_name":"Anhui University of Technology","ror":"https://ror.org/02qdtrq21","country_code":"CN","type":"education","lineage":["https://openalex.org/I92178344"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hao Wu","raw_affiliation_strings":["Anhui University of Technology, Ma'An Shan, China"],"affiliations":[{"raw_affiliation_string":"Anhui University of Technology, Ma'An Shan, China","institution_ids":["https://openalex.org/I92178344"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102020756","display_name":"Xiangrong Xu","orcid":"https://orcid.org/0000-0001-6055-6797"},"institutions":[{"id":"https://openalex.org/I92178344","display_name":"Anhui University of Technology","ror":"https://ror.org/02qdtrq21","country_code":"CN","type":"education","lineage":["https://openalex.org/I92178344"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangrong Xu","raw_affiliation_strings":["School of Mechanical Engineering, Anhui University of Technology, Ma' anshan, Anhui, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Anhui University of Technology, Ma' anshan, Anhui, China","institution_ids":["https://openalex.org/I92178344"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100702421"],"corresponding_institution_ids":["https://openalex.org/I92178344"],"apc_list":null,"apc_paid":null,"fwci":1.1317,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.82857677,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"1","issue":null,"first_page":"2235","last_page":"2239"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.7307081818580627},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7130918502807617},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.672520101070404},{"id":"https://openalex.org/keywords/brightness","display_name":"Brightness","score":0.6499013304710388},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.5952763557434082},{"id":"https://openalex.org/keywords/position","display_name":"Position (finance)","score":0.58607017993927},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5290143489837646},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.5207614898681641},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.5138338208198547},{"id":"https://openalex.org/keywords/on-board","display_name":"On board","score":0.49828624725341797},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.4156873822212219},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1883426308631897},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1013256311416626},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.07114928960800171}],"concepts":[{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.7307081818580627},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7130918502807617},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.672520101070404},{"id":"https://openalex.org/C125245961","wikidata":"https://www.wikidata.org/wiki/Q221656","display_name":"Brightness","level":2,"score":0.6499013304710388},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.5952763557434082},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.58607017993927},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5290143489837646},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.5207614898681641},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.5138338208198547},{"id":"https://openalex.org/C3018963415","wikidata":"https://www.wikidata.org/wiki/Q16878425","display_name":"On board","level":2,"score":0.49828624725341797},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.4156873822212219},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1883426308631897},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1013256311416626},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.07114928960800171},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/robio.2015.7419106","is_oa":false,"landing_page_url":"https://doi.org/10.1109/robio.2015.7419106","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Robotics and Biomimetics (ROBIO)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1985756133","https://openalex.org/W2027933820","https://openalex.org/W2102369468","https://openalex.org/W2109888465","https://openalex.org/W2356859597"],"related_works":["https://openalex.org/W2387055199","https://openalex.org/W2599361292","https://openalex.org/W2313061941","https://openalex.org/W4252608911","https://openalex.org/W2184913151","https://openalex.org/W2389426768","https://openalex.org/W2098273855","https://openalex.org/W1003800352","https://openalex.org/W3147987719","https://openalex.org/W1953485902"],"abstract_inverted_index":{"It":[0],"is":[1,37,75],"very":[2],"important":[3],"that":[4],"the":[5,9,21,25,30,33,42,51,59,68,79],"beginning":[6],"positioning":[7,43,85],"in":[8,14,32,87],"inspection":[10],"of":[11,20,29,70,84],"PCB":[12,34,71],"board":[13],"automated":[15],"optical":[16],"inspection.":[17],"The":[18],"accuracy":[19,44,86],"original":[22],"position":[23,52],"influence":[24],"later":[26],"checking":[27,57],"result":[28],"components":[31],"board,":[35],"it":[36],"crucial":[38],"to":[39],"do":[40],"research":[41],"repeatedly.":[45],"There":[46],"are":[47],"many":[48],"factors":[49],"affect":[50],"accuracy.":[53],"Which":[54],"including":[55],"different":[56,89],"algorithm,":[58,98],"outside":[60],"environment":[61],"such":[62],"as":[63],"temperature,":[64],"humidity,":[65],"brightness":[66],"and":[67,82,95,99,102],"size":[69],"board.":[72],"This":[73],"article":[74],"mainly":[76],"focus":[77],"on":[78,104],"repeatedly":[80],"process":[81],"results":[83],"two":[88],"algorithm":[90,94],"between":[91],"color":[92],"segmentation":[93],"template":[96],"matching":[97],"then":[100],"analyzing":[101],"discussing":[103],"these":[105],"result.":[106]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}