{"id":"https://openalex.org/W2093848875","doi":"https://doi.org/10.1109/rfid-ta.2012.6404507","title":"Electrical characterization of rubber mixture sheets based on a coaxial probe method in combination with 3D electromagnetic simulation model","display_name":"Electrical characterization of rubber mixture sheets based on a coaxial probe method in combination with 3D electromagnetic simulation model","publication_year":2012,"publication_date":"2012-11-01","ids":{"openalex":"https://openalex.org/W2093848875","doi":"https://doi.org/10.1109/rfid-ta.2012.6404507","mag":"2093848875"},"language":"en","primary_location":{"id":"doi:10.1109/rfid-ta.2012.6404507","is_oa":false,"landing_page_url":"https://doi.org/10.1109/rfid-ta.2012.6404507","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Conference on RFID-Technologies and Applications (RFID-TA)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002293576","display_name":"Kelash Kanwar","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120526","display_name":"Fraunhofer Institute for Electronic Nano Systems","ror":"https://ror.org/02h12bg79","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210120526","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"K. Kanwar","raw_affiliation_strings":["Department of ASE, Fraunhofer ENAS, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ASE, Fraunhofer ENAS, Paderborn, Germany","institution_ids":["https://openalex.org/I4210120526"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036133527","display_name":"Claas Fischer","orcid":"https://orcid.org/0000-0002-6028-6085"},"institutions":[{"id":"https://openalex.org/I4210120526","display_name":"Fraunhofer Institute for Electronic Nano Systems","ror":"https://ror.org/02h12bg79","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210120526","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"C. Fischer","raw_affiliation_strings":["Department of ASE, Fraunhofer ENAS, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ASE, Fraunhofer ENAS, Paderborn, Germany","institution_ids":["https://openalex.org/I4210120526"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045985328","display_name":"V. Geneiss","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120526","display_name":"Fraunhofer Institute for Electronic Nano Systems","ror":"https://ror.org/02h12bg79","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210120526","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"V. Geneiss","raw_affiliation_strings":["Department of ASE, Fraunhofer ENAS, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ASE, Fraunhofer ENAS, Paderborn, Germany","institution_ids":["https://openalex.org/I4210120526"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111798056","display_name":"T.R. Mager","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120526","display_name":"Fraunhofer Institute for Electronic Nano Systems","ror":"https://ror.org/02h12bg79","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210120526","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"T. Mager","raw_affiliation_strings":["Department of ASE, Fraunhofer ENAS, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ASE, Fraunhofer ENAS, Paderborn, Germany","institution_ids":["https://openalex.org/I4210120526"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077892772","display_name":"U. Ballhausen","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"U. Ballhausen","raw_affiliation_strings":["Arntz Beteiligungs GmbH, H\u00f6xter, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arntz Beteiligungs GmbH, H\u00f6xter, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091650490","display_name":"Christian Hedayat","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120526","display_name":"Fraunhofer Institute for Electronic Nano Systems","ror":"https://ror.org/02h12bg79","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210120526","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"C. Hedayat","raw_affiliation_strings":["Department of ASE, Fraunhofer ENAS, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ASE, Fraunhofer ENAS, Paderborn, Germany","institution_ids":["https://openalex.org/I4210120526"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091462785","display_name":"Ulrich Hilleringmann","orcid":"https://orcid.org/0000-0002-1621-0067"},"institutions":[{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"U. Hilleringmann","raw_affiliation_strings":["Department of Sensoric, Institute of Electrical Engineering, University of Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Sensoric, Institute of Electrical Engineering, University of Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1037,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.75548727,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"182","last_page":"187"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10986","display_name":"RFID technology advancements","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10986","display_name":"RFID technology advancements","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9890999794006348,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9818999767303467,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/coaxial","display_name":"Coaxial","score":0.8025869727134705},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.7097184658050537},{"id":"https://openalex.org/keywords/natural-rubber","display_name":"Natural rubber","score":0.655927300453186},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5422490835189819},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5213916897773743},{"id":"https://openalex.org/keywords/electromagnetic-simulation","display_name":"Electromagnetic simulation","score":0.492740660905838},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4742238521575928},{"id":"https://openalex.org/keywords/computer-simulation","display_name":"Computer simulation","score":0.4520535171031952},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4292646646499634},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.410763680934906},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35061395168304443},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22984370589256287},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.2063312828540802},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15520021319389343},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.14004498720169067},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.06732812523841858}],"concepts":[{"id":"https://openalex.org/C51221625","wikidata":"https://www.wikidata.org/wiki/Q1751466","display_name":"Coaxial","level":2,"score":0.8025869727134705},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.7097184658050537},{"id":"https://openalex.org/C176933379","wikidata":"https://www.wikidata.org/wiki/Q131877","display_name":"Natural rubber","level":2,"score":0.655927300453186},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5422490835189819},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5213916897773743},{"id":"https://openalex.org/C2984061966","wikidata":"https://www.wikidata.org/wiki/Q5157313","display_name":"Electromagnetic simulation","level":2,"score":0.492740660905838},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4742238521575928},{"id":"https://openalex.org/C500300565","wikidata":"https://www.wikidata.org/wiki/Q925667","display_name":"Computer simulation","level":2,"score":0.4520535171031952},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4292646646499634},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.410763680934906},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35061395168304443},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22984370589256287},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.2063312828540802},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15520021319389343},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.14004498720169067},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.06732812523841858},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/rfid-ta.2012.6404507","is_oa":false,"landing_page_url":"https://doi.org/10.1109/rfid-ta.2012.6404507","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Conference on RFID-Technologies and Applications (RFID-TA)","raw_type":"proceedings-article"},{"id":"pmh:oai:publica.fraunhofer.de:publica/378977","is_oa":false,"landing_page_url":"https://publica.fraunhofer.de/handle/publica/378977","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"conference paper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W187259865","https://openalex.org/W1512208174","https://openalex.org/W2052625713","https://openalex.org/W2106118626","https://openalex.org/W2116786798","https://openalex.org/W2493879039","https://openalex.org/W4247381894","https://openalex.org/W4249757202"],"related_works":["https://openalex.org/W2109252598","https://openalex.org/W886882817","https://openalex.org/W3107994849","https://openalex.org/W1512878983","https://openalex.org/W2326594127","https://openalex.org/W4290989699","https://openalex.org/W4255766185","https://openalex.org/W2354793777","https://openalex.org/W1520120059","https://openalex.org/W2364678955"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,25,46],"measurement":[4,20,44],"method":[5,21,28],"for":[6,13,34],"electrical":[7,37],"characterization":[8],"of":[9,39],"different":[10],"materials":[11],"(especially":[12],"rubber":[14],"mixture":[15],"sheets)":[16],"is":[17,22],"proposed.":[18],"The":[19],"based":[23,51],"on":[24,52],"coaxial":[26],"probe":[27],"and":[29],"uses":[30],"3D":[31,54],"electromagnetic":[32,55],"simulation":[33,56],"determining":[35],"the":[36,43,53],"parameters":[38],"materials.":[40],"To":[41],"simplify":[42],"process,":[45],"numerical":[47],"algorithm":[48],"was":[49],"defined":[50],"results.":[57]},"counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}