{"id":"https://openalex.org/W4413979062","doi":"https://doi.org/10.1109/rcar65431.2025.11139516","title":"Edge-Aware and Deformable Feature Fusion for Steel Surface Defect Segmentation","display_name":"Edge-Aware and Deformable Feature Fusion for Steel Surface Defect Segmentation","publication_year":2025,"publication_date":"2025-06-01","ids":{"openalex":"https://openalex.org/W4413979062","doi":"https://doi.org/10.1109/rcar65431.2025.11139516"},"language":"en","primary_location":{"id":"doi:10.1109/rcar65431.2025.11139516","is_oa":false,"landing_page_url":"https://doi.org/10.1109/rcar65431.2025.11139516","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Conference on Real-time Computing and Robotics (RCAR)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008754768","display_name":"Jiale Wang","orcid":"https://orcid.org/0000-0003-3938-9706"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jiale Wang","raw_affiliation_strings":["Tongji University,College of Electronics & Information Engineering,Shanghai,China,201804"],"affiliations":[{"raw_affiliation_string":"Tongji University,College of Electronics & Information Engineering,Shanghai,China,201804","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007653410","display_name":"Ziwei Long","orcid":null},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziwei Long","raw_affiliation_strings":["Tongji University,College of Electronics & Information Engineering,Shanghai,China,201804"],"affiliations":[{"raw_affiliation_string":"Tongji University,College of Electronics & Information Engineering,Shanghai,China,201804","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059971279","display_name":"Maryland Lee","orcid":"https://orcid.org/0009-0003-1782-1833"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming-Ju Lee","raw_affiliation_strings":["Tongji University,College of Electronics & Information Engineering,Shanghai,China,201804"],"affiliations":[{"raw_affiliation_string":"Tongji University,College of Electronics & Information Engineering,Shanghai,China,201804","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101445813","display_name":"Yuxin Feng","orcid":"https://orcid.org/0009-0001-7793-0957"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuxin Feng","raw_affiliation_strings":["Tongji University,College of Computer Science & Technology,Shanghai,China,201804"],"affiliations":[{"raw_affiliation_string":"Tongji University,College of Computer Science & Technology,Shanghai,China,201804","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5119536342","display_name":"E Junwu","orcid":null},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junwu E","raw_affiliation_strings":["Tongji University,College of Electronics & Information Engineering,Shanghai,China,201804"],"affiliations":[{"raw_affiliation_string":"Tongji University,College of Electronics & Information Engineering,Shanghai,China,201804","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100462079","display_name":"Yang Xu","orcid":"https://orcid.org/0000-0002-0932-8112"},"institutions":[{"id":"https://openalex.org/I4210152380","display_name":"Shenzhen Technology University","ror":"https://ror.org/04qzpec27","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210152380"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Xu","raw_affiliation_strings":["Shenzhen MSU-BIT University,MSU-BIT-SMBU Joint Research Center of Applied Mathematics,Shenzhen,People’s Republic of China,518172"],"affiliations":[{"raw_affiliation_string":"Shenzhen MSU-BIT University,MSU-BIT-SMBU Joint Research Center of Applied Mathematics,Shenzhen,People’s Republic of China,518172","institution_ids":["https://openalex.org/I4210152380"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102862351","display_name":"Ye Zhang","orcid":"https://orcid.org/0009-0002-3396-1978"},"institutions":[{"id":"https://openalex.org/I4210152380","display_name":"Shenzhen Technology University","ror":"https://ror.org/04qzpec27","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210152380"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ye Zhang","raw_affiliation_strings":["Shenzhen MSU-BIT University,MSU-BIT-SMBU Joint Research Center of Applied Mathematics,Shenzhen,People’s Republic of China,518172"],"affiliations":[{"raw_affiliation_string":"Shenzhen MSU-BIT University,MSU-BIT-SMBU Joint Research Center of Applied Mathematics,Shenzhen,People’s Republic of China,518172","institution_ids":["https://openalex.org/I4210152380"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111974611","display_name":"Ian J. Alexander","orcid":null},"institutions":[{"id":"https://openalex.org/I19880235","display_name":"Lomonosov Moscow State University","ror":"https://ror.org/010pmpe69","country_code":"RU","type":"education","lineage":["https://openalex.org/I19880235"]},{"id":"https://openalex.org/I4210150146","display_name":"Moscow State University","ror":"https://ror.org/050a13t43","country_code":"TJ","type":"education","lineage":["https://openalex.org/I4210150146"]}],"countries":["RU","TJ"],"is_corresponding":false,"raw_author_name":"Ilin Alexander","raw_affiliation_strings":["Lomonosov Moscow State University,Faculty of Computational Mathematics and Cybernetics,Moscow,Russia,119991"],"affiliations":[{"raw_affiliation_string":"Lomonosov Moscow State University,Faculty of Computational Mathematics and Cybernetics,Moscow,Russia,119991","institution_ids":["https://openalex.org/I19880235","https://openalex.org/I4210150146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071443236","display_name":"Xiaoyu Tang","orcid":"https://orcid.org/0000-0002-6038-9623"},"institutions":[{"id":"https://openalex.org/I187400657","display_name":"South China Normal University","ror":"https://ror.org/01kq0pv72","country_code":"CN","type":"education","lineage":["https://openalex.org/I187400657"]},{"id":"https://openalex.org/I4210139885","display_name":"Shanxi Normal University","ror":null,"country_code":"CN","type":null,"lineage":["https://openalex.org/I4210139885"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoyu Tang","raw_affiliation_strings":["South China Normal University,College of Electronics & Information Engineering,Shanwei,China,516625"],"affiliations":[{"raw_affiliation_string":"South China Normal University,College of Electronics & Information Engineering,Shanwei,China,516625","institution_ids":["https://openalex.org/I187400657","https://openalex.org/I4210139885"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007508326","display_name":"Rui Fan","orcid":"https://orcid.org/0000-0001-8768-932X"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rui Fan","raw_affiliation_strings":["Tongji University,College of Electronics & Information Engineering,Shanghai,China,201804"],"affiliations":[{"raw_affiliation_string":"Tongji University,College of Electronics & Information Engineering,Shanghai,China,201804","institution_ids":["https://openalex.org/I116953780"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5008754768"],"corresponding_institution_ids":["https://openalex.org/I116953780"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.38770853,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1016","last_page":"1021"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9873999953269958,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9868999719619751,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.6429022550582886},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.6373370289802551},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6323705911636353},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6171316504478455},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5787167549133301},{"id":"https://openalex.org/keywords/fusion","display_name":"Fusion","score":0.5660524964332581},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.5240461826324463},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5110152959823608},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.47002553939819336},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.39276960492134094},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35980382561683655},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.09626340866088867},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07330405712127686}],"concepts":[{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.6429022550582886},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.6373370289802551},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6323705911636353},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6171316504478455},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5787167549133301},{"id":"https://openalex.org/C158525013","wikidata":"https://www.wikidata.org/wiki/Q2593739","display_name":"Fusion","level":2,"score":0.5660524964332581},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5240461826324463},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5110152959823608},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.47002553939819336},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.39276960492134094},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35980382561683655},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.09626340866088867},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07330405712127686},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/rcar65431.2025.11139516","is_oa":false,"landing_page_url":"https://doi.org/10.1109/rcar65431.2025.11139516","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Conference on Real-time Computing and Robotics (RCAR)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1901129140","https://openalex.org/W2155903085","https://openalex.org/W2964309882","https://openalex.org/W2969350702","https://openalex.org/W2979872609","https://openalex.org/W2994615081","https://openalex.org/W3080961686","https://openalex.org/W3138423360","https://openalex.org/W3196385186","https://openalex.org/W4392543763","https://openalex.org/W4394896985","https://openalex.org/W4396566754","https://openalex.org/W4400647666","https://openalex.org/W4401747775","https://openalex.org/W4406787072","https://openalex.org/W4407249525","https://openalex.org/W4408181533","https://openalex.org/W4412081492"],"related_works":["https://openalex.org/W4379231730","https://openalex.org/W4389858081","https://openalex.org/W2099421762","https://openalex.org/W2530546662","https://openalex.org/W2967030268","https://openalex.org/W2501551404","https://openalex.org/W4298131179","https://openalex.org/W2185253430","https://openalex.org/W1522196789","https://openalex.org/W2053114452"],"abstract_inverted_index":{"Steel":[0],"surface":[1],"defect":[2,36,80,128],"segmentation":[3,23],"plays":[4],"a":[5,41,84,122],"crucial":[6],"role":[7],"in":[8,107],"industrial":[9,127],"quality":[10],"inspection":[11],"and":[12,32,82,111],"intelligent":[13],"manufacturing.":[14],"In":[15],"this":[16],"paper,":[17],"we":[18,39,72],"propose":[19],"an":[20],"enhanced":[21],"semantic":[22],"framework":[24],"based":[25],"on":[26,97],"Segformer":[27],"to":[28,48,77,91],"improve":[29],"the":[30,69],"precision":[31],"edge":[33,86],"awareness":[34],"of":[35,109],"localization.":[37,94],"Specifically,":[38],"introduce":[40],"novel":[42],"adaptive":[43,54],"fusion":[44],"feature":[45],"module":[46,88],"(AF-Fuse)":[47],"effectively":[49],"fuse":[50],"multi-scale":[51],"features":[52],"with":[53],"attention.":[55],"To":[56],"enhance":[57],"spatial":[58,62],"context":[59],"representation,":[60],"atrous":[61],"pyramid":[63],"pooling":[64],"(ASPP)":[65],"is":[66],"integrated":[67],"into":[68],"encoder.":[70],"Furthermore,":[71],"adopt":[73],"deformable":[74],"convolutional":[75],"layers":[76],"handle":[78],"irregular":[79],"shapes":[81],"incorporate":[83],"mid-level":[85],"focus":[87],"(EFM)":[89],"branch":[90],"reinforce":[92],"boundary":[93,112],"Extensive":[95],"experiments":[96],"NEU-Seg":[98],"datasets":[99],"demonstrate":[100],"that":[101],"our":[102],"improved":[103],"model":[104],"outperforms":[105],"better":[106],"terms":[108],"mIoU":[110],"accuracy,":[113],"while":[114],"maintaining":[115],"computational":[116],"efficiency.":[117],"The":[118],"proposed":[119],"approach":[120],"provides":[121],"promising":[123],"solution":[124],"for":[125],"high-precision":[126],"segmentation.":[129]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}