{"id":"https://openalex.org/W2914054001","doi":"https://doi.org/10.1109/rcar.2018.8621697","title":"A Real-Time Abnormal Data Detecting Strategy for Length Sensors Measurement","display_name":"A Real-Time Abnormal Data Detecting Strategy for Length Sensors Measurement","publication_year":2018,"publication_date":"2018-08-01","ids":{"openalex":"https://openalex.org/W2914054001","doi":"https://doi.org/10.1109/rcar.2018.8621697","mag":"2914054001"},"language":"en","primary_location":{"id":"doi:10.1109/rcar.2018.8621697","is_oa":false,"landing_page_url":"https://doi.org/10.1109/rcar.2018.8621697","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Conference on Real-time Computing and Robotics (RCAR)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082257624","display_name":"Xiaobo Hu","orcid":"https://orcid.org/0000-0001-6887-8547"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaobo Hu","raw_affiliation_strings":["School of Mechanical Engineering, Shanghai Jiao Tong University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Shanghai Jiao Tong University","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102854450","display_name":"Enguang Guan","orcid":"https://orcid.org/0000-0001-5322-6722"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Enguang Guan","raw_affiliation_strings":["School of Mechanical Engineering, Shanghai Jiao Tong University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Shanghai Jiao Tong University","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100761419","display_name":"Weixin Yan","orcid":"https://orcid.org/0000-0001-7173-4085"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weixin Yan","raw_affiliation_strings":["School of Mechanical Engineering, Shanghai Jiao Tong University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Shanghai Jiao Tong University","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5114113969","display_name":"Yanzheng Zhao","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanzheng Zhao","raw_affiliation_strings":["School of Mechanical Engineering, Shanghai Jiao Tong University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Shanghai Jiao Tong University","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.24215944,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"508","last_page":"513"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/outlier","display_name":"Outlier","score":0.8975634574890137},{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"Anomaly detection","score":0.6557535529136658},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6205005645751953},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6161843538284302},{"id":"https://openalex.org/keywords/length-measurement","display_name":"Length measurement","score":0.4953393042087555},{"id":"https://openalex.org/keywords/data-acquisition","display_name":"Data acquisition","score":0.42686140537261963},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4191756248474121},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.41423317790031433},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.32397133111953735}],"concepts":[{"id":"https://openalex.org/C79337645","wikidata":"https://www.wikidata.org/wiki/Q779824","display_name":"Outlier","level":2,"score":0.8975634574890137},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.6557535529136658},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6205005645751953},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6161843538284302},{"id":"https://openalex.org/C21353171","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Length measurement","level":2,"score":0.4953393042087555},{"id":"https://openalex.org/C163985040","wikidata":"https://www.wikidata.org/wiki/Q1172399","display_name":"Data acquisition","level":2,"score":0.42686140537261963},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4191756248474121},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.41423317790031433},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.32397133111953735},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/rcar.2018.8621697","is_oa":false,"landing_page_url":"https://doi.org/10.1109/rcar.2018.8621697","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Conference on Real-time Computing and Robotics (RCAR)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W845124934","https://openalex.org/W2015314031","https://openalex.org/W2049058890","https://openalex.org/W2611660570","https://openalex.org/W2739299529","https://openalex.org/W2766011673","https://openalex.org/W2769248053","https://openalex.org/W2783503686","https://openalex.org/W2783843605"],"related_works":["https://openalex.org/W3006513224","https://openalex.org/W2046456988","https://openalex.org/W2357409937","https://openalex.org/W2510582230","https://openalex.org/W2499612753","https://openalex.org/W3111802945","https://openalex.org/W2946096271","https://openalex.org/W2295423552","https://openalex.org/W1598471830","https://openalex.org/W3107369729"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,106],"real-time":[4,88,100],"detecting":[5,92,107],"strategy":[6,108],"for":[7,70,86,90],"outliers":[8,25,56,91],"and":[9,26,93,115,129],"abnormal":[10,27,94],"fluctuation":[11,28,95],"during":[12],"the":[13,31,34,38,47,50,55,61,66,72,79,87,99,103,113,117,121,127,130,133],"data":[14,83],"acquisition":[15],"in":[16],"length":[17,67],"sensors":[18,68],"measurement":[19,35],"is":[20,57,109],"investigated.":[21],"The":[22,123],"appearance":[23],"of":[24,33,46,65,78,81,102,120,132],"could":[29],"lower":[30],"accuracy":[32],"system":[36],"using":[37],"accurate":[39],"noncontact":[40],"sensors.":[41],"A":[42],"mathematic":[43],"model":[44],"consists":[45],"real":[48],"value,":[49],"noise":[51],"as":[52,54],"well":[53],"built":[58],"to":[59,111],"represent":[60],"final":[62],"observation":[63],"result":[64],"used":[69],"measuring":[71],"machining":[73],"quantity.":[74],"Then,":[75],"different":[76],"kinds":[77],"characteristics":[80],"numerical":[82],"are":[84],"analysed":[85],"effectiveness":[89,131],"assessment.":[96],"Based":[97],"on":[98],"characteristic":[101],"acquired":[104],"data,":[105],"designed":[110],"eliminate":[112],"outlier":[114],"judge":[116],"fluctuating":[118],"extent":[119],"data.":[122],"simulation":[124],"results":[125],"illustrate":[126],"applicability":[128],"proposed":[134],"approach.":[135]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}