{"id":"https://openalex.org/W2044121920","doi":"https://doi.org/10.1109/ramech.2008.4681415","title":"Multi-parameters Optimization and Nonlinearity Analysis of the Grating Eddy Current Displacement Sensor","display_name":"Multi-parameters Optimization and Nonlinearity Analysis of the Grating Eddy Current Displacement Sensor","publication_year":2008,"publication_date":"2008-09-01","ids":{"openalex":"https://openalex.org/W2044121920","doi":"https://doi.org/10.1109/ramech.2008.4681415","mag":"2044121920"},"language":"en","primary_location":{"id":"doi:10.1109/ramech.2008.4681415","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ramech.2008.4681415","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE Conference on Robotics, Automation and Mechatronics","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060141466","display_name":"Hongli Qi","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hongli Qi","raw_affiliation_strings":["Department of Instrument Science & Engineering, Shanghai Jiaotong University, Shanghai, China","Dept. of Instrum. Sci.&Eng., Shanghai Jiao Tong Univ., Shanghai"],"affiliations":[{"raw_affiliation_string":"Department of Instrument Science & Engineering, Shanghai Jiaotong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"Dept. of Instrum. Sci.&Eng., Shanghai Jiao Tong Univ., Shanghai","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066103561","display_name":"Hui Zhao","orcid":"https://orcid.org/0000-0003-2942-3376"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Zhao","raw_affiliation_strings":["Department of Instrument Science & Engineering, Shanghai Jiaotong University, Shanghai, China","Dept. of Instrum. Sci.&Eng., Shanghai Jiao Tong Univ., Shanghai"],"affiliations":[{"raw_affiliation_string":"Department of Instrument Science & Engineering, Shanghai Jiaotong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"Dept. of Instrum. Sci.&Eng., Shanghai Jiao Tong Univ., Shanghai","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015039449","display_name":"Weiwen Liu","orcid":"https://orcid.org/0000-0002-7632-9078"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weiwen Liu","raw_affiliation_strings":["Department of Instrument Science & Engineering, Shanghai Jiaotong University, Shanghai, China","Dept. of Instrum. Sci.&Eng., Shanghai Jiao Tong Univ., Shanghai"],"affiliations":[{"raw_affiliation_string":"Department of Instrument Science & Engineering, Shanghai Jiaotong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"Dept. of Instrum. Sci.&Eng., Shanghai Jiao Tong Univ., Shanghai","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5060141466"],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15750496,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"28","issue":null,"first_page":"950","last_page":"955"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.7397943139076233},{"id":"https://openalex.org/keywords/displacement","display_name":"Displacement (psychology)","score":0.6859346628189087},{"id":"https://openalex.org/keywords/eddy-current-sensor","display_name":"Eddy-current sensor","score":0.685908317565918},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.591019868850708},{"id":"https://openalex.org/keywords/grating","display_name":"Grating","score":0.5829673409461975},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.4941120445728302},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.47585389018058777},{"id":"https://openalex.org/keywords/calipers","display_name":"Calipers","score":0.41217726469039917},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3638373613357544},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3489300012588501},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2631264925003052},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.20274996757507324},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.19301724433898926},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14118346571922302},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13076961040496826},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.08516490459442139}],"concepts":[{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.7397943139076233},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.6859346628189087},{"id":"https://openalex.org/C2777897478","wikidata":"https://www.wikidata.org/wiki/Q23718891","display_name":"Eddy-current sensor","level":3,"score":0.685908317565918},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.591019868850708},{"id":"https://openalex.org/C2777813233","wikidata":"https://www.wikidata.org/wiki/Q1527816","display_name":"Grating","level":2,"score":0.5829673409461975},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.4941120445728302},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.47585389018058777},{"id":"https://openalex.org/C186738849","wikidata":"https://www.wikidata.org/wiki/Q12408","display_name":"Calipers","level":2,"score":0.41217726469039917},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3638373613357544},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3489300012588501},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2631264925003052},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.20274996757507324},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.19301724433898926},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14118346571922302},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13076961040496826},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.08516490459442139},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ramech.2008.4681415","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ramech.2008.4681415","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE Conference on Robotics, Automation and Mechatronics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1484098813","https://openalex.org/W1972036710","https://openalex.org/W1987148660","https://openalex.org/W2012587486","https://openalex.org/W2023734847","https://openalex.org/W2051680159","https://openalex.org/W2058220265","https://openalex.org/W2092727999","https://openalex.org/W2101280879","https://openalex.org/W2109760479","https://openalex.org/W2138477809","https://openalex.org/W2146125120","https://openalex.org/W2352639809","https://openalex.org/W2542866508"],"related_works":["https://openalex.org/W2032533659","https://openalex.org/W2371240635","https://openalex.org/W2130539955","https://openalex.org/W2393924909","https://openalex.org/W2371953208","https://openalex.org/W2084189288","https://openalex.org/W1988040182","https://openalex.org/W2392480046","https://openalex.org/W2015118871","https://openalex.org/W3137043229"],"abstract_inverted_index":{"The":[0,20,33,61],"grating":[1],"eddy":[2],"current":[3],"displacement":[4,8],"sensor":[5,25,46,65],"(GECDS)":[6],"for":[7,28],"or":[9],"position":[10],"measurement":[11],"used":[12],"in":[13],"watertight":[14],"electronic":[15],"digital":[16],"caliper":[17],"was":[18],"described.":[19],"parameters":[21,47,54,66],"optimization":[22,78],"of":[23,35,44,52,58,63],"the":[24,41,45,50,56,59,64],"is":[26,38,79],"essential":[27],"economic":[29],"and":[30,48],"efficient":[31],"production.":[32],"purpose":[34],"this":[36],"study":[37],"to":[39],"determine":[40],"optimal":[42],"combination":[43],"analyze":[49],"effects":[51,62],"these":[53],"on":[55,67],"nonlinearity":[57,68],"sensor.":[60],"are":[69],"studied":[70],"by":[71],"finite":[72],"element":[73],"method":[74,86],"(FEM).":[75],"Multi":[76],"parameter":[77],"realized":[80],"through":[81],"orthogonal":[82],"experimental":[83],"design":[84],"(OED)":[85],"combined":[87],"with":[88],"FEM.":[89]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}