{"id":"https://openalex.org/W4382536881","doi":"https://doi.org/10.1109/prime58259.2023.10161864","title":"A Compact All-MOSFETs PVT-compensated Current Reference with Untrimmed 0.88%-(\u03c3/\u03bc)","display_name":"A Compact All-MOSFETs PVT-compensated Current Reference with Untrimmed 0.88%-(\u03c3/\u03bc)","publication_year":2023,"publication_date":"2023-06-18","ids":{"openalex":"https://openalex.org/W4382536881","doi":"https://doi.org/10.1109/prime58259.2023.10161864"},"language":"en","primary_location":{"id":"doi:10.1109/prime58259.2023.10161864","is_oa":false,"landing_page_url":"https://doi.org/10.1109/prime58259.2023.10161864","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 18th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073063211","display_name":"Francesco Gagliardi","orcid":"https://orcid.org/0000-0002-0790-5078"},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Gagliardi","raw_affiliation_strings":["University of Pisa,Department of Information Engineering,Italy","Department of Information Engineering, University of Pisa, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Pisa,Department of Information Engineering,Italy","institution_ids":["https://openalex.org/I108290504"]},{"raw_affiliation_string":"Department of Information Engineering, University of Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001432278","display_name":"Alessandro Catania","orcid":"https://orcid.org/0000-0001-7242-6228"},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Catania","raw_affiliation_strings":["University of Pisa,Department of Information Engineering,Italy","Department of Information Engineering, University of Pisa, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Pisa,Department of Information Engineering,Italy","institution_ids":["https://openalex.org/I108290504"]},{"raw_affiliation_string":"Department of Information Engineering, University of Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020626961","display_name":"Andrea Ria","orcid":"https://orcid.org/0000-0002-2120-9618"},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Ria","raw_affiliation_strings":["University of Pisa,Department of Information Engineering,Italy","Department of Information Engineering, University of Pisa, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Pisa,Department of Information Engineering,Italy","institution_ids":["https://openalex.org/I108290504"]},{"raw_affiliation_string":"Department of Information Engineering, University of Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048786468","display_name":"Paolo Bruschi","orcid":"https://orcid.org/0000-0003-2073-1073"},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"P. Bruschi","raw_affiliation_strings":["University of Pisa,Department of Information Engineering,Italy","Department of Information Engineering, University of Pisa, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Pisa,Department of Information Engineering,Italy","institution_ids":["https://openalex.org/I108290504"]},{"raw_affiliation_string":"Department of Information Engineering, University of Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080172474","display_name":"Massimo Piotto","orcid":"https://orcid.org/0000-0002-0197-3686"},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Piotto","raw_affiliation_strings":["University of Pisa,Department of Information Engineering,Italy","Department of Information Engineering, University of Pisa, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Pisa,Department of Information Engineering,Italy","institution_ids":["https://openalex.org/I108290504"]},{"raw_affiliation_string":"Department of Information Engineering, University of Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8201,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.68586631,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"61","last_page":"64"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.784990668296814},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6091293692588806},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5964246392250061},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.5390543341636658},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5254108905792236},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.48118239641189575},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4741743803024292},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4528334140777588},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.4406641125679016},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4252851605415344},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.39570483565330505},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3724120259284973},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3571093678474426},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.33513346314430237},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21979442238807678},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.18534567952156067},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.12358495593070984}],"concepts":[{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.784990668296814},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6091293692588806},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5964246392250061},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.5390543341636658},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5254108905792236},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.48118239641189575},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4741743803024292},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4528334140777588},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.4406641125679016},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4252851605415344},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.39570483565330505},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3724120259284973},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3571093678474426},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.33513346314430237},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21979442238807678},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.18534567952156067},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.12358495593070984},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/prime58259.2023.10161864","is_oa":false,"landing_page_url":"https://doi.org/10.1109/prime58259.2023.10161864","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 18th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)","raw_type":"proceedings-article"},{"id":"pmh:oai:arpi.unipi.it:11568/1207569","is_oa":false,"landing_page_url":"https://hdl.handle.net/11568/1207569","pdf_url":null,"source":{"id":"https://openalex.org/S4377196265","display_name":"CINECA IRIS Institutial research information system (University of Pisa)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I108290504","host_organization_name":"University of Pisa","host_organization_lineage":["https://openalex.org/I108290504"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7099999785423279,"id":"https://metadata.un.org/sdg/1","display_name":"No poverty"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1981569522","https://openalex.org/W2005142424","https://openalex.org/W2079069453","https://openalex.org/W2094860990","https://openalex.org/W2109284876","https://openalex.org/W2121416362","https://openalex.org/W2171702041","https://openalex.org/W2743095234","https://openalex.org/W2913584304","https://openalex.org/W3041872181","https://openalex.org/W3118390052","https://openalex.org/W3186234854","https://openalex.org/W3190616935","https://openalex.org/W4285036973"],"related_works":["https://openalex.org/W1511900339","https://openalex.org/W2139774918","https://openalex.org/W2124276226","https://openalex.org/W1481245673","https://openalex.org/W1561253851","https://openalex.org/W2912037534","https://openalex.org/W1484646300","https://openalex.org/W3211653297","https://openalex.org/W2143223408","https://openalex.org/W1955666032"],"abstract_inverted_index":{"An":[0],"excessive":[1],"sensitivity":[2,65,78],"to":[3,68,89],"PVT":[4],"variations":[5],"may":[6],"represent":[7],"a":[8,12,41,55,84],"considerable":[9],"issue":[10],"of":[11,22],"Current":[13],"Reference":[14],"(CR)":[15],"circuit,":[16],"possibly":[17],"resulting":[18],"in":[19,31,47],"poor":[20],"reliability":[21],"CR-supplied":[23],"systems.":[24],"CR":[25,44],"area":[26],"occupation":[27],"is":[28,92],"also":[29],"critical":[30],"size-constrained":[32],"designs.":[33],"In":[34],"this":[35],"work,":[36],"we":[37],"present":[38],"and":[39,63,71],"analyze":[40],"compact":[42],"all-MOSFETs":[43],"topology.":[45],"Implemented":[46],"0.18":[48],"$\\mu\\mathrm{m}$":[49],"CMOS,":[50],"the":[51,80],"proposed":[52],"design":[53],"generates":[54],"946":[56],"nA":[57],"reference":[58,81],"current.":[59],"Simulated":[60],"temperature":[61],"coefficient":[62],"line":[64],"are":[66],"equal":[67,88],"318":[69],"ppm/\u00b0C":[70],"5.12%/V,":[72],"respectively.":[73],"Besides,":[74],"based":[75],"on":[76],"process":[77],"analyses,":[79],"current":[82],"exhibited":[83],"relative":[85],"standard":[86],"deviation":[87],"0.88%,":[90],"which":[91],"competitive":[93],"with":[94],"state-of-the-art":[95],"solutions.":[96]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2023-06-30T00:00:00"}